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On matrix effects in HF-plasma-SNMS analysis of sintered ceramic Ti-Al-(Si)-O (1998)

Börner, H. ; Jenett, H. ; Hodoroaba, V.-D.

Springer

Fresenius' journal of analytical chemistry 361 (1998), S. 590-591

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ISSN: 1432-1130

Source: Springer Online Journal Archives 1860-2000

Topics: Chemistry and Pharmacology

Notes: Abstract For a series of electrically non-conductive, sin- tered ceramic samples with the nominal composition Si0.05(AlxTi1–x)0.95Oy (x being varied from 0 to 1 in steps of Δx = 0.1), the influences of elemental concentration and of the sputtering frequency in the plasma-SNMS high frequency mode on relative sensitivity factors were investigated. For Al and Ti they show strong matrix effects which may arise from the emission of positive secondary ions.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/s002160050958

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