ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Scattering of the light beam propagating through a dielectric-slab optical waveguide occurs due to refractive index inhomogeneities of the thin film region and due to boundary irregularities of the filmsubstrate and the film-air interfaces. The quantity and direction of the scattered light are evaluated by means of a perturbation method together with the use of a stationary phase method, for a variety of correlation lengths and variances and the thin film thicknesses. The results show that for a slab waveguide of t/λ=10.0,t and λ being the thickness of thin film and the wavelength of light, the effect of refractive index inhomogeneities is pronounced in comparison with that of waveguide wall irregularities. In this case, therefore, the scattering pattern is determined mainly by the correlation length of refractive index inhomogeneities.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00620106
