ISSN:
1572-9605
Keywords:
High Tc
;
thin films
;
flux creep
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract Critical current density vs. temperature curves and I–V characteristics have been measured onc-axis-oriented BSCCO thin films. The experimental data have been described in terms of flux creep effects. Although the films are not single phase and carry a slightly lower critical current density with respect to those of BSCCO single crystals, the measurements point to the presence of flux thermally activated phenomena with a pinning potentialU 0 of about 25 meV.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00618053