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Three dimensional strain measurements with x-ray energy dispersive spectroscopy (1985)

Black, D. R. ; Bechtoldt, C. J. ; Placious, R. C. ; [et al.]

Springer

Journal of nondestructive evaluation 5 (1985), S. 21-25

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ISSN: 1573-4862

Keywords: Profile fitting ; residual stress ; strain mapping ; x-ray diffraction ; NDE

Source: Springer Online Journal Archives 1860-2000

Topics: Electrical Engineering, Measurement and Control Technology , Mathematics

Notes: Abstract A feasibility study was performed to show the ability of energy dispersive x-ray diffraction (EDXRD) to measure three dimensional strain distributions in thick industrial materials. Photon energies up to 130 keV were used to guarantee penetration through the sample and curve fitting techniques applied to peak position determination. This system was used to measure the strain gradient through the thickness of a 9.5 mm thick cantilevered steel bar.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00568760

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