ISSN:
1573-4862
Keywords:
X-ray diffraction
;
tensors
;
nondestructive evaluation
;
residual stress
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mathematics
Notes:
Abstract The three-dimensional residual stress condition of copper sputtered on Kapton™ films was studied by two nondestructive x-ray diffraction techniques. Four samples were evaluated—one “control sample,” and three heat-treated samples. Because of concerns about steep stress gradients normal to the specimen surface, an experimental technique described by Dölle(1) was used to obtain the residual strain tensors in the near surface region. The resulting stress tensors were compared to data obtained through a modification of the technique described by Dölle, referred to as the differential method.(2)
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00567439
