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  • 1
    Electronic Resource
    Electronic Resource
    Chromatic focusing of X-ray diffraction lines and achromatic camera (1964)
    Springer
    Czechoslovak journal of physics 14 (1964), S. 629-645 
    Details
    ISSN: 1572-9486
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The conditions for simultaneous suppression of the wave-length component (broadening) and instrumental component (broadening) of the X-ray diffraction lines are analyzed. The fulfilment of the chromatic focusing conditions theoretically restrains the wave-length component as if we used an infinitely narrow wave-length interval in the incident beam. This is advantageous particularly in measuring the line profiles, as the precision of profile analysis can thus be appreciably increased. This paper presents general considerations and computations for a given experimental set-up. A camera suitable for this kind of measurement is described and the profile of a line withϑ=74·3° in an achromatic arrangement and in an ordinary back-reflection camera is compared.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01688608
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