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  • 1
    Electronic Resource
    Electronic Resource
    Testing of multi-output circuits by means of signature analyzer (1993)
    Springer
    Journal of electronic testing 4 (1993), S. 283-283 
    Details
    ISSN: 1573-0727
    Keywords: Data compaction ; multiple input analyzer
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Let a circuit havem outputs,m〉1. There are two ways to test this circuit by means of a signature analyzer: use a single input analyzer for each output or use anm-input analyzer to test all outputs simultaneously. The main goal of this letter is to demonstrate that for fault output sequences with small multiplicity of errors and long length the second approach is more effective.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00971976
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