ISSN:
0025-116X
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Chemistry and Pharmacology
,
Physics
Notes:
This paper describes the use of evanescent light for the optical characterization of polymer thin films and interfaces. Firstly, a few basic concepts of evanescent wave phenomena, including total internal reflection, plasmon surface polaritons and guided optical modes, are reviewed. It is shown that the excitation of these waves allows for a sensitive determination of the optical architecture of the interface(s) involved. This “surface light” can then be used for the same broad range of optical techniques as it is known from experimental set-ups designed for the investigation of various optical properties of polymer samples using plane electromagnetic waves, i.e. “normal” photons. This is demonstrated for diffraction experiments, microscopic investigations, inelastic scattering, e.g. Brillouin- or Raman-spectroscopies, etc. The examples given include thin polymer films prepared by spin-coating or by the Langmuir-Blodgett-Kuhn technique. It is shown that properties and processes at solid-solution interfaces can be investigated equally well, and even surfaces of bulk samples can be characterized.
Additional Material:
17 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/macp.1991.021921201
