ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Selected methods for the XPS quantitation of surface coverages are summarized with an emphasis on non-planar samples with overlayers, e.g. powders of high surface area. Equations have been modified for uniform terminology and are presented based on a photoelectron spectrometer with an E-1 transmission function. Approaches which require a minimum of information from independent analytical techniques are given special consideration. Quantitative schemes discussed include calibration curves, surface sensitivity factors, exponential attenuation of bulk signals by overlayers, catalyst models, and the use of subshell twins or peak shape distortions related to photoelectron energy losses.
Additional Material:
2 Tab.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740130404
