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  • 1
    Electronic Resource
    Electronic Resource
    Stamford, Conn. [u.a.] : Wiley-Blackwell
    Polymer Engineering and Science 34 (1994), S. 691-694 
    ISSN: 0032-3888
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: The molecular weight between crosslinking junctions (Mc) of styrene-butadiene-styrene (SBS) and that of styrene-isoprene-styrene (SIS) irradiated by electron beams (5 Mrad to 100 Mrad) was measured by dynamic modulus, glass transition temperature, static modulus, and swelling. The change in dynamic modulus at low temperature was smaller than that at high temperature in both SBS and SIS. The shift of Tg to higher temperature was observed in both SBS, and SIS systems except for 100 Mrad of SIS. Both dynamic and static moduli increased with irradiation doses, however, the change of static modulus was smaller than that of dynamic one. Those mechanical measurements were compared with the swelling measurements and discussed.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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