ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Total reflection x-ray fluorescence spectrometry (TXRF) was initially developed in order to enhance the detection performance in energy-dispersive XRF using appropriate surfaces as sample carriers in the total reflection mode. The extension of this method to the analysis of surfaces required additional considerations together with refined instrumental design. As a secondary effect, the detection limits for trace analysis have been reduced by a further order of magnitude. In addition, new software has been developed. Special quantification procedures for surface analysis became necessary because of the complex behaviour of the primary intensity in near-surface layers. The intensities are calculated on the basis of the Fresnel equations. Examples are given for the determination of thickness, elemental composition and density of surface layers in the nanometre range.
Additional Material:
10 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300200606
