ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The ionization cross-section of Kramers and the Thomson-Whiddington law have been used in the development of a background correction for quantitative electron microprobe analysis of thin sections employing an energy-dispersive X-ray detector. An expression has been derived which describes the X-ray continuum emitted from a thin specimen while being irradiated with an energetic beam of electrons. The functional form of the expression describing the emitted continuum reduces to the equation derived by Kramers when specimen absorption is neglected. Theory demonstrates that for specimens of 2140 Å in thickness, a maximum difference of 16% exists between the continuum intensities predicted assuming absorption and neglecting absorption when working at an operating potential of 15 kV. Generally good agreement between the predicted emitted continuum and that measured from aluminum thin films is found.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300060310
