Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
71 (1992), S. 2491-2498
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The design of high-Tc superconducting bolometers for applications such as infrared imaging arrays is discussed. The dependence of bolometer sensitivity on excess voltage noise in the thermometer is a function of the detector area and thus of the wavelength to be detected. Measurements of the voltage noise in thin films of YBa2Cu3O7−δ on Si, Si3N4, and sapphire substrates are used to predict the performance of different bolometer architectures. Useful opportunities exist for bolometers made on both Si and Si3N4 membranes. A readout scheme for two-dimensional arrays of bolometers is also described in which real-time signal integration is performed on the chip.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.351063
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