ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hit 1 - 1 | 1 hit

Select All Export

Electronic Resource

Microvoids in amorphous Si1−xCx:H alloys studied by small-angle x-ray scattering (1989)

Williamson, D. L. ; Mahan, A. H. ; Nelson, B. P. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 55 (1989), S. 783-785

add to mindlist on the mindlist

Details

ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: The microstructure of hydrogenated amorphous silicon-carbon alloys has been analyzed by small-angle x-ray scattering, infrared absorption, and density measurements. Decreasing density with C incorporation is due to microvoids about 0.6 nm in average radius, which are either approximately spherical in shape or randomly oriented nonspheres. The microvoid number density increases from about 5×1019/cm3 for a-Si:H to about 4×1020/cm3 for a-Si0.7 C0.3 :H. The CH3 species probably causes the enhanced microvoid formation in these alloys. A large fraction of the microvoid surfaces is not hydrogenated.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.101779

	Location	Call Number	Expected	Availability

Others were also interested in ...

Paper (German National Licenses)

Fulltext

hit 1 - 1 | 1 hit