Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
70 (1997), S. 667-669
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
This letter is on the observation of anisotropic electrical transport and magnetoresistance (MR) in rf sputtered thin films of La0.62Bi0.05Ca0.33MnO3 on Si. Films sputtered on (111)Si are polycrystalline, whereas textured films with (110) orientation are obtained from (100) Si. Both films show a reduction in the lattice constant and relatively high Curie temperatures (262–266 K vs 230 K for bulk polycrystals). Although the films have identical magnetic parameters, resistivity ρ and MR data for the (110) textured films show the following features indicative of possible dependence of magneto transport on crystallographic orientation: (i) a two order of magnitude enhancement in the low temperature ρ value compared to polycrystalline films, (ii) a semiconductorlike electrical conduction and the absence of any metallic to semiconductor transition, and (iii) a relatively large MR, as high as 80% at 40 kOe. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.118328
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