Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
20 (1987), S. 330-337
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The basic equations are derived for the calculation of the angle settings of a five-circle diffractometer used for surface X-ray diffraction. This is done for a specified angle of incidence. An additional constraint that may be imposed is the horizontal alignment of the diffraction rods to match the divergence of the synchrotron X-ray source or the horizontal setting of the physical surface normal. Alignment procedures and the derivation of the orientation matrix are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889887086527
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