ISSN:
0894-3370
Keywords:
Engineering
;
Electrical and Electronics Engineering
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
We have extended the one-dimensional transmission-line modelling (TLM) of diffusion, drift and recombination of charge carriers in semiconductors to multiple dimensions. Detailed TLM formulation of the continuity transport equation in a more general form is presented.
Additional Material:
2 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/jnm.1660060307