Publikationsdatum:
2015-08-07
Beschreibung:
Manipulating magnetisation by the application of an electric field in magnetoelectric multiferroics represents a timely issue due to the potential applications in low power electronics and the novel physics involved. Thanks to its element sensitivity and high spatial resolution, X-ray photoemission electron microscopy is a uniquely suited technique for the investigation of magnetoelectric coupling in multiferroic materials. In this work, we present a setup that allows for the application of in situ electric and magnetic fields while the sample is analysed in the microscope. As an example of the performances of the setup, we present measurements on Ni/Pb(Mg 0.66 Nb 0.33 )O 3 -PbTiO 3 and La 0.7 Sr 0.3 MnO 3 /PMN-PT artificial multiferroic nanostructures.
Print ISSN:
0034-6748
Digitale ISSN:
1089-7623
Thema:
Elektrotechnik, Elektronik, Nachrichtentechnik
,
Physik
