Electronic Resource
New York, NY
:
Wiley-Blackwell
Journal of Electron Microscopy Technique
7 (1987), S. 331-336
ISSN:
0741-0581
Keywords:
Electron and ion optics
;
Aberration
;
Deflection
;
Multiple fields
;
Phase retrieval
;
Life and Medical Sciences
;
Cell & Developmental Biology
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Natural Sciences in General
Notes:
This paper summarizes theoretical research on electron optics in the field of electron microscopy that has been carried out by the author and his colleagues over a long period of time. The main topics to be discussed include the rotationally symmetrical imaging system and its aberrations; the method of matrix algebraic calculation and its applications to electron optics; new developments in scanning electron beam systems, i.e., the combined elec-tromagnetic focusing-deflection system with superimposed fields; the electromagnetic multipole system and its aberrations; the ion optical system with a curvilinear axis and its aberrations; and the phase retrieval in Fourier electron microscopy. This review may help to promote a better understanding of the present state of, and trends in, Chinese electron optics research.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/jemt.1060070413
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