ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A new class of corrugated multilayers has been grown on silicon substrates which have (111) faceted grooves etched on their surface. These structures can be probed by conventional means with current at an angle to the plane of layers (CAP) as well as CIP. This angle is fixed by: the depth to width ratio of the grooves (which determines the angle θ), and the angle φ of the current probes with respect to the grooves. We have prepared multilayers of [Co(12 A(ring)) Cu(t)NiFe(12 A(ring)) Cu(t)]y with t=58 and 116 A(ring), and y=167 and 91 repeats, respectively; and have varied φ from 0 and 90° while θ is held fixed at 54.7°. We find the data is very well fit to the theoretical expression for CAP resistivity in terms of the more conventional CIP and CPP resistivities. From measurements of the CIP and CAP–MR's on these corrugated multilayers we are able to predict the CPP–MR for these structures. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.362005
