Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
51 (1987), S. 2073-2075
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The vertical energy flux density for the electromagnetic fields near the surface of a silver strip on a glass substrate is computed for an incident plane wave to aid in the measurement of the width of the strip. The dimensions of the strip cross section, e.g., 300 nm by 100 nm, are a fraction of the wavelength of the incident light , 632.8 nm. The flux 1 nm above the surface shows sharp spikes at the edges of the strip. The features of the fields near the surface could be used for accurate determination of the width of the strip by measurements up to about 30 nm above the strip. The effects of other variables are also shown in the figures.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.98295
|
Location |
Call Number |
Expected |
Availability |
