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    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 45 (1989), S. 291-296 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Electron diffraction and high-resolution imaging are used to study the remarkable incommensurable misfit layer compound (SnS)1.17NbS2, 'SnNbS3'. Electron diffraction patterns along the zone axis perpendicular to the layer planes are analysed in detail based on the mixed-layer assumption proposed in paper I [Meetsma, Wiegers, Haange & de Boer (1989). Acta Cryst. A45, 285-291]. The relative intensities of the hk0 reflections due to the two types of constituent layers are strongly influenced by the foil thickness. Stacking variants along the c axis are frequently observed and strongly complicate the diffraction patterns. Under particular conditions of thickness and defocus, high-resolution images are shown to reflect the varying degree of coincidence of the atom columns in the misfit layers and thus they directly reveal the incommensurate misfit.
    Type of Medium: Electronic Resource
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