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  • 1
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2011-08-26
    Description: Microwave and millimeter wave imaging has shown tremendous utility in a wide variety of applications. These techniques are primarily based on measuring coherent electric field distribution on the target being imaged. Mechanically scanned systems are the simple and low cost solution in microwave imaging. However, these systems are typically bulky and slow. This dissertation presents a design for a 2D switched imaging array that utilizes modulated scattering techniques for spatial multiplexing of the signal. The system was designed to be compact, coherent, possessing high dynamic range, and capable of video frame rate imaging. Various aspects of the system design were optimized to achieve the design objectives. The 2D imaging system as designed and described in this dissertation utilized PIN diode loaded resonant elliptical slot antennas as array elements. The slot antennas allow for incorporating the switching into the antennas thus reducing the cost and size of the array. Furthermore, these slots are integrated in a simple low loss waveguide network. Moreover, the sensitivity and dynamic range of this system is improved by utilizing a custom designed heterodyne receiver and matched filter. This dissertation also presents an analysis on the properties of this system. The performance of the multiplexing scheme, the noise floor and the dynamic range of the receivers are investigated. Furthermore, sources of errors such as mutual coupling and array response dispersion are also investigated. Finally, utilizing this imaging system for various applications such as 2D electric field mapping, scatterer localization, and nondestructive imaging is demonstrated.
    Keywords: Electronics and Electrical Engineering
    Type: M09-0626
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  • 2
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    In:  Other Sources
    Publication Date: 2018-06-11
    Description: A Periodic Newsletter of the JPL/OSMS Assurance Technology Program Office (ATPO), NASA EEE Parts Assurance Group (NEPAG), and Section 514, of the Jet Propulsion Laboratory.
    Keywords: Electronics and Electrical Engineering
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  • 3
    Publication Date: 2018-06-06
    Description: Corrugated feed horns offer excellent beam symmetry, main beam efficiency, and cross-polar response over wide bandwidths, but can be challenging to fabricate. An easier-to-manufacture smooth-walled feed is explored that approximates these properties over a finite bandwidth. The design, optimization and measurement of a monotonically-profiled, smooth-walled scalar feedhorn with a diffraction-limited approx. 14deg FWHM beam is presented. The feed was demonstrated to have low cross polarization (〈-30 dB) across the frequency range 33-45 GHz (30% fractional bandwidth). A power reflection below -28 dB was measured across the band.
    Keywords: Electronics and Electrical Engineering
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  • 4
    Publication Date: 2018-06-06
    Description: Many cryogenic systems use electrical cables containing phosphor bronze wire. While phosphor bronze's electrical and thermal conductivity values have been published, there is significant variation among different phosphor bronze formulations. The James Webb Space Telescope (JWST) will use several phosphor bronze wire harnesses containing a specific formulation (CDA 510, annealed temper). The heat conducted into the JWST instrument stage is dominated by these harnesses, and approximately half of the harness conductance is due to the phosphor bronze wires. Since the JWST radiators are expected to just keep the instruments at their operating temperature with limited cooling margin, it is important to know the thermal conductivity of the actual alloy being used. We describe an experiment which measured the electrical and thermal conductivity of this material between 4 and 295 Kelvin.
    Keywords: Electronics and Electrical Engineering
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  • 5
    Publication Date: 2018-06-05
    Description: An apparatus that includes an array of multiple electrodes has been invented as a means of simultaneously testing multiple materials for their utility as oxygen-reduction catalysts in fuel cells. The apparatus ensures comparability of test results by exposing all the catalyst-material specimens to the same electrolytic test solution at the same potential. Heretofore, it has been possible to test only one specimen at a time, using a precise rotating disk electrode that provides a controlled flux of solution to the surface of the specimen.
    Keywords: Electronics and Electrical Engineering
    Type: NASA Tech Briefs, April 2009; 15
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  • 6
    Publication Date: 2018-06-06
    Description: No abstract available
    Keywords: Electronics and Electrical Engineering
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  • 7
    Publication Date: 2019-07-13
    Description: This paper will explore the ability of printed circuit boards laminated with a Carbon Core Laminate to transfer heat vs. standard printed circuit boards that use only thick layers of copper. The paper will compare the differences in heat transfer performance of printed circuit boards with and without CCL.
    Keywords: Electronics and Electrical Engineering
    Type: IEEE Aerospace Conference; Mar 07, 2009 - Mar 14, 2009; Big Sky, MT; United States
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  • 8
    Publication Date: 2019-07-13
    Description: No abstract available
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-254 , The Fifth International Conference Advance sin Corrosion Protection by Organic Coatings; Sep 14, 2009 - Sep 18, 2009; Cambridge; United Kingdom
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  • 9
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-07-13
    Description: The primary technical objective of this project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: (1) Packages (e.g., Thin Small Outline Package [TSOP], Ball Grid Array [BGA], Plastic Dual In-line Package [PDIP]) assembled and reworked with lead-free alloys, (2) Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with mixed (lead/lead-free) alloys.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-167 , 2009 SMTA AIMS Harsh Environment Electronics Symposium; Oct 05, 2009 - Oct 06, 2009; San Diego, CA; United States
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  • 10
    Publication Date: 2019-07-13
    Description: To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-060R , International Symposium on Tin Whiskers; Jun 23, 2009 - Jun 24, 2009; Lyngby; Denmark
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  • 11
    Publication Date: 2019-07-13
    Description: In this experiment, an empirical model to quantify the probability of occurrence of an electrical short circuit from tin whiskers as a function of voltage was developed. This empirical model can be used to improve existing risk simulation models. FIB and TEM images of a tin whisker confirm the rare polycrystalline structure on one of the three whiskers studied. FIB cross-section of the card guides verified that the tin finish was bright tin.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-211 , Kennedy Engineering Academy/MASA-KSC; Sep 29, 2009; Kennedy Space Center, FL; United States
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  • 12
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-07-13
    Description: In response to concerns about risks from lead-free induced faults to high reliability products, NASA has initiated a multi-year project to provide manufacturers and users with data to clarify the risks of lead-free materials in their products. The project will also be of interest to component manufacturers supplying to high reliability markets. The project was launched in November 2006. The primary technical objective of the project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: - Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with solder interconnects consisting of lead-free alloys - Packages (e.g., TSOP, BGA, PDIP) assembled and reworked with solder interconnects consisting of mixed alloys, lead component finish/lead-free solder and lead-free component finish/SnPb solder.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-207 , 2009 DMSMS and Standardization Conference; Sep 21, 2009 - Sep 24, 2009; Orlando, FL; Yemen, Republic of
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  • 13
    Publication Date: 2019-07-13
    Description: Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-137R , Electronics Packaging Manufacturing, IEEE Transactions on; 32; 1; 41-48
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  • 14
    Publication Date: 2019-07-13
    Description: This paper provides insight into the difficult analytical issue for launch vehicles and spacecraft that has applicability outside of the launch industry. Radiation from spacecraft or launch vehicle antennas located within enclosures in the launch vehicle generates an electromagnetic environment that is difficult to accurately predict. This paper discusses the test results of power levels produced by a transmitter within a representative scaled vehicle fairing model and provides preliminary modeling results at the low end of the frequency test range using a commercial tool. Initially, the walls of the fairing are aluminum and later, layered with materials to simulate acoustic blanketing structures that are typical in payload fairings. The effects of these blanketing materials on the power levels within the fairing are examined.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-004 , 2009 IEEE EMC Symposium; Aug 17, 2009 - Aug 21, 2009; Austin, TX; United States
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  • 15
    Publication Date: 2019-07-13
    Description: A self diagnostic accelerometer system has been shown to be sensitive to multiple failure modes of charge mode accelerometers. These failures include sensor structural damage, an electrical open circuit and most importantly sensor detachment. In this paper, experimental work that was performed to determine the capabilities of a self diagnostic accelerometer system while operating in the presence of various levels of mechanical noise, emulating real world conditions, is presented. The results show that the system can successfully conduct a self diagnostic routine under these conditions.
    Keywords: Electronics and Electrical Engineering
    Type: E-18255 , 47th AIAA ASM 2009; Jan 05, 2009 - Jan 08, 2009; Orlando, FL; United States
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  • 16
    Publication Date: 2019-07-13
    Description: This assessment was initiated by the NASA Engineering & Safety Center (NESC) after a number of recent "high profile" connector problems, the most visible and publicized of these being the problem with the Space Shuttle's Engine Cut-Off System cryogenic feed-thru connector. The NESC commissioned a review of NASA's connector selection and application processes for space flight applications, including how lessons learned and past problem records are fed back into the processes to avoid recurring issues. Team members were primarily from the various NASA Centers and included connector and electrical parts specialists. The commissioned study was conducted on spacecraft connector selection and application processes at NASA Centers. The team also compared the NASA spacecraft connector selection and application process to the military process, identified recent high profile connector failures, and analyzed problem report data looking for trends and common occurrences. The team characterized NASA's connector problem experience into a list of top connector issues based on anecdotal evidence of a system's impact and commonality between Centers. These top issues are as follows, in no particular rank order: electrically shorted, bent and/or recessed contact pins, contact pin/socket contamination leading to electrically open or intermittencies, connector plating corrosion or corrosion of connector components, low or inadequate contact pin retention forces, contact crimp failures, unmated connectors and mis-wiring due to workmanship errors during installation or maintenance, loose connectors due to manufacturing defects such as wavy washer and worn bayonet retention, damaged connector elastomeric seals and cryogenic connector failure. A survey was also conducted of SAE Connector AE-8C1 committee members regarding their experience relative to the NASA concerns on connectors. The most common responses in order of occurrence were contact retention, plating issues, worn-out or damaged coupling mechanisms, bent pins, contact crimp barrel cracking and torn seals. In addition to these common themes, responses included issues with markings, dimensional errors on the build, contact/socket damage (handling), manufacturing defects and customer misapplication and mishandling. The NESC team concluded that considering the large quantity and wide variety of connectors successfully flown on human and robotic space applications, the number of failures is quite low. However, "high profile" failures with significant cost, schedule, safety, and/or mission success impacts continue to occur. It was also concluded that connector failures occur throughout a system's life-cycle with the majority of connector issues application related. A number of recommendations were identified for improving NASA connector selection processes and overall space connector reliability and performance.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-216 , SAE AE-8 Subcommittee Meeting; Oct 05, 2009 - Oct 09, 2009; Portland, OR; United States
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  • 17
    Publication Date: 2019-07-13
    Description: NASA's Exploration Technology Development Program (ETDP) Energy Storage Project conducted an advanced lithium-based battery chemistry feasibility study to determine the best advanced chemistry to develop for the Altair lunar lander and the Extravehicular Activities (EVA) advanced lunar surface spacesuit. These customers require safe, reliable energy storage systems with extremely high specific energy as compared to today's state-of-the-art batteries. Based on customer requirements, the specific energy goals for the development project are 220 watt-hours per kilogram (Wh/kg) delivered at the battery level at 0 degrees Celsius (degrees Celcius) at a C/10 discharge rate. Continuous discharge rates between C/5 and C/2, operation over 0 to 30 degrees C, and 200 cycles are targeted. The team, consisting of members from NASA Glenn Research Center, Johnson Space Center, and Jet Propulsion laboratory, surveyed the literature, compiled information on recent materials developments, and consulted with other battery experts in the community to identify advanced battery materials that might be capable of achieving the desired results with further development. A variety of electrode materials were considered, including layered metal oxides, spinel oxides, and olivine-type cathode materials, and lithium metal, lithium alloy, and silicon-based composite anode materials. lithium-sulfur systems were also considered. Hypothetical cell constructs that combined compatible anode and cathode materials with suitable electrolytes, separators, current collectors, headers, and cell enclosures were modeled. While some of these advanced materials are projected to obtain the desired electrical performance, there are risks that also factored into the decision making process. The risks include uncertainties due to issues such as safety of a system containing some of these materials, ease of scaling-up of large batches of raw materials, adaptability of the materials to processing using established or reasonable cost manufacturing techniques, manufacturability of the materials in dimensions required for integration into battery cells of practical capacities, low Technology Readiness levels (TRl), and the ability to achieve the desired performance by the customer need dates. The advanced cell chemistry options were evaluated with respect to multiple quantitative and qualitative attributes while considering their projected performance at the end of the available development timeframe. Following a rigorous ranking process, a chemistry that combines a lithiated nickel manganese cobalt oxide (lithium NMC) cathode with a silicon-based composite anode was selected as the technology that can offer the best combination of safety, specific energy, energy density, and likelihood of success. Tasks over the next three years will focus on development of electrode materials, compatible electrolytes, and separator materials, and integration of promising components to assess their combined performance in working cells. Cells of the chosen chemistry will be developed to TRl 6 by 2014 and will then be transferred to the customers for infusion into their mission paths.
    Keywords: Electronics and Electrical Engineering
    Type: 11th Electrochemical Power Sources Research and Development Symposium; Jul 13, 2009 - Jul 16, 2009; Baltimore, MD; United States
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  • 18
    Publication Date: 2019-07-13
    Description: The NASA Glenn Research Center has previously reported prolonged stable operation of simple prototype 6H-SiC JFET integrated circuits (logic gates and amplifier stages) for thousands of hours at +500 C. This paper experimentally investigates the ability of these 6H-SiC JFET devices and integrated circuits to also function at cold temperatures expected to arise in some envisioned applications. Prototype logic gate ICs experimentally demonstrated good functionality down to -125 C without changing circuit input voltages. Cascaded operation of gates at cold temperatures was verified by externally wiring gates together to form a 3-stage ring oscillator. While logic gate output voltages exhibited little change across the broad temperature range from -125 C to +500 C, the change in operating frequency and power consumption of these non-optimized logic gates as a function of temperature was much larger and tracked JFET channel conduction properties.
    Keywords: Electronics and Electrical Engineering
    Type: E-17646 , Materials Science Forum; 645-648; 1135-1138
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  • 19
    Publication Date: 2019-07-12
    Description: Semiconductor chips based on MEMS (Micro-Electro-Mechanical Systems) technology, such as sensors, transducers, and actuators, are becoming widely used in today s electronics due to their high performance, low power consumption, tolerance to shock and vibration, and immunity to electro-static discharge. In addition, the MEMS fabrication process allows for the miniaturization of individual chips as well as the integration of various electronic circuits into one module, such as system-on-a-chip. These measures would simplify overall system design, reduce parts count and interface, improve reliability, and reduce cost; and they would meet requirements of systems destined for use in space exploration missions. In this work, the performance of a recently-developed MEMS voltage-controlled oscillator was evaluated under a wide temperature range. Operation of this new commercial-off-the-shelf (COTS) device was also assessed under thermal cycling to address some operational conditions of the space environment
    Keywords: Electronics and Electrical Engineering
    Type: E-17346
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  • 20
    Publication Date: 2019-07-12
    Description: To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-060 , 3rdInternational Symposium on Tin Whiskers; Lyngby; Denmark
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  • 21
    Publication Date: 2019-07-12
    Description: Space Shuttle Program implemented tin whisker remediation strategy following discovery of tin whiskers in Orbiter hardware.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-097
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  • 22
    Publication Date: 2019-07-19
    Description: Initial results are presented from the Vector Electric Field Investigation (VEFI) on the Air Force Communication/Navigation Outage Forecasting System (C/NOFS) satellite, a mission designed to understand, model, and forecast the presence of equatorial ionospheric irregularities. The VEFI instrument includes a vector DC electric field detector, a fixed-bias Langmuir probe operating in the ion saturation regime, a flux gate magnetometer, an optical lightning detector, and associated electronics including a burst memory. The DC electric field detector has revealed zonal and meridional electric fields that undergo a diurnal variation, typically displaying eastward and outward-directed fields during the day and westward and downward-directed fields at night. In general, the measured DC electric field amplitudes are in the 0.5-2 mV/m range, corresponding to I3 x B drifts of the order of 30-150 m/s. What is surprising is the high degree of large-scale (10's to 100's of km) structure in the DC electric field, particularly at night, regardless of whether well-defined spread-F plasma density depletions are present. The spread-F density depletions and corresponding electric fields that have been detected thus far have displayed a preponderance to appear between midnight and dawn. Associated with the narrow plasma depletions that are detected are broad spectra of electric field and plasma density irregularities for which a full vector set of measurements is available for detailed study. On some occasions, localized regions of low frequency (〈 8 Hz) magnetic field broadband irregularities have been detected, suggestive of filamentary currents, although there is no one-to-one correspondence of these waves with the observed plasma density depletions, at least within the data examined thus far. Finally, the data set includes a wide range of ELF/VLF/HF waves corresponding to a variety of plasma waves, in particular banded ELF hiss, whistlers, and lower hybrid wave turbulence triggered by lightning-induced sferics. The VEFI data set represents a treasure trove of measurements that are germane to numerous fundamental aspects of the electrodynamics and irregularities inherent to the Earth's low latitude ionosphere.
    Keywords: Electronics and Electrical Engineering
    Type: National Radio Science Meeting/Union of Radio Science; Jan 05, 2009 - Jan 08, 2009; Boulder, CO; United States
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  • 23
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2019-07-19
    Description: A simple inhomogeneous circuit model for a grid comprised of wires with circular cross section is derived and compared to measured observations. The proposed approximations are valid in the limit the geometric parameters for the grid are small compared to the wavelength of the incident radiation. Expressions for the emission, reflection, and transmission are provided. The accuracy of this circuit model is compared against full wave numerical simulations as a function of grid filling fraction. For perpendicular illumination of the grid the expressions used in the literature for zero thickness polarizers are recovered. For parallel illumination the influence of the finite wire thickness has a non-negectable influence on the emission properties of a wire grid polarizer is found.
    Keywords: Electronics and Electrical Engineering
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  • 24
    Publication Date: 2019-07-19
    Description: During system level testing intermittent and permanent open circuit failures of mated, crimp removable, electrical contact pairs were experienced. The root cause of the failures was determined to be low (but not zero) contact forces applied by the socket contact tines against the engaging pin. The low contact force reduces the effectiveness of the wiping action of the socket tines against the pin. The observed failure mode may be produced when insufficient wiping during mate, demate and small relative movement in use allows for the accumulation of debris or insulating films that electrically separate the contact pair. The investigation identified at least three manufacturing process control problems associated with the socket contacts that enabled shipment of contacts susceptible to developing low contact forces: (1) Improper heat treatment of the socket tines resulting in plastic rather than elastic behavior; (2) Overly thinned socket tines at their base resulting in reduced pin retention forces; (3) insufficient screening tests to identify parts susceptible to the aforementioned failure mechanisms. The results from an extensive screening program of socket contacts utilizing the industry standard contact separation force test procedures are described herein. The investigation shows this method to be capable of identifying initially weak sockets. However, sockets whose contact retention forces may degrade during use may not be screened out by pin retention testing alone. Further investigations are required to correlate low contact retention forces with increased electrical contact resistance in the presence of insulating films that may accumulate in the use environment.
    Keywords: Electronics and Electrical Engineering
    Type: Capacitor and Resistor Technology Symposium (CARTS); Mar 30, 2009 - Apr 02, 2009; Jacksonville, FL; United States
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  • 25
    Publication Date: 2019-07-19
    Description: Kennedy Space Center is leading research work on lunar O2 generation via electrolytic reduction of regolith; the metal oxide present in the regolith is dissociated in oxygen anions and metal cations leading to the generation of gaseous oxygen at the anode and liquid metal at the cathode. Electrical resistance of molten regolith is high, leading to heating of the melt when electrical current is applied between the electrodes (Joule heating). The authors have developed a 3D model using a rigorous approach for two coupled physics (thermal and electrical potential) to not only study the effect of Joule heating on temperature distribution throughout the molten regolith but also to evaluate and optimize the design of the electrolytic cells. This paper presents the results of the thermal analysis performed on the model and used to validate the design of the electrolytic cell.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2008-232 , KSC-2008-159
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  • 26
    Publication Date: 2019-07-19
    Description: Satellite instruments, that will monitor salinity from space in the near future, require an accurate relationship between salinity/temperature and seawater dielectric constant. This paper will review measurements that were made of the dielectric constant of seawater during the past several years. The objective of the measurements is to determine the dependence of the dielectric constant of seawater on salinity and on temperature, more accurately than in the past. by taking advantage of modem instrumentation. The measurements of seawater permittivity have been performed as a function of salinity and temperature using a transmission resonant cavity technique. The measurements have been made in the salinity range of 10 to 38 psu and in the temperature range of IOU C to 35 C. These results will be useful in algorithm development for sensor systems such as SMOS and Aquarius. The measurement system consists of a brass microwave cavity that is resonant at 1.413 GHz. The seawater is introduced into the cavity through a capillary glass tube having an inner diameter of 0.1 mm. The diameter of the tube has been made very small so that the amount of seawater introduced in the cavity is small - thus maintaining the sensitivity of the measurements and allowing the use of perturbation theory predicting the seawater permittivity. The change in resonant frequency and the change in cavity Q can be used to determine the real and imaginary pare of the dielectric constant of seawater introduced into the slender tube. The microwave measurements are made by an HPS722D network analyzer. The cavity has been immersed in a u~ateriethylene-glycol bath which is connected to a Lauda circulator. The circulator keeps the brass cavity at a temperature constant to within 0.01 degrees. The system is automated using a Visual Basic program to control the analyzer and to collect the data. The results of the dielectric constant measurements of seawater will be presented. The measurement results will be compared with permittivity values generated from the Kline and Swift relationship. Two methods of calibration will be discussed, The errors that each technique introduces into the measurement resulls will be reviewed. Temperature stability, frequency drift and the effect of increasing cavity transmission loss on the unloaded cavity Q will also be discussed.
    Keywords: Electronics and Electrical Engineering
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  • 27
    Publication Date: 2019-07-27
    Description: Diagnostic algorithms (DAs) are key to enabling automated health management. These algorithms are designed to detect and isolate anomalies of either a component or the whole system based on observations received from sensors. In recent years a wide range of algorithms, both model-based and data-driven, have been developed to increase autonomy and improve system reliability and affordability. However, the lack of support to perform systematic benchmarking of these algorithms continues to create barriers for effective development and deployment of diagnostic technologies. In this paper, we present our efforts to benchmark a set of DAs on a common platform using a framework that was developed to evaluate and compare various performance metrics for diagnostic technologies. The diagnosed system is an electrical power system, namely the Advanced Diagnostics and Prognostics Testbed (ADAPT) developed and located at the NASA Ames Research Center. The paper presents the fundamentals of the benchmarking framework, the ADAPT system, description of faults and data sets, the metrics used for evaluation, and an in-depth analysis of benchmarking results obtained from testing ten diagnostic algorithms on the ADAPT electrical power system testbed.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN840
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  • 28
    Publication Date: 2019-08-26
    Description: A rock pulverizer device based on a superconducting linear motor. The superconducting electromagnetic rock pulverizer accelerates a projectile via a superconducting linear motor and directs the projectile at high speed toward a rock structure that is to be pulverized by collision of the speeding projectile with the rock structure. The rock pulverizer is comprised of a trapped field superconducting secondary magnet mounted on a movable car following a track, a wire wound series of primary magnets mounted on the track, and the complete magnet/track system mounted on a vehicle used for movement of the pulverizer through a mine as well as for momentum transfer during launch of the rock breaking projectile.
    Keywords: Electronics and Electrical Engineering
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  • 29
    Publication Date: 2019-08-26
    Description: The present invention relates to a reference current circuit. The reference circuit comprises a low-level current bias circuit, a voltage proportional-to-absolute temperature generator for creating a proportional-to-absolute temperature voltage (VPTAT), and a MOSFET-based constant-IC regulator circuit. The MOSFET-based constant-IC regulator circuit includes a constant-IC input and constant-IC output. The constant-IC input is electrically connected with the VPTAT generator such that the voltage proportional-to-absolute temperature is the input into the constant-IC regulator circuit. Thus the constant-IC output maintains the constant-IC ratio across any temperature range.
    Keywords: Electronics and Electrical Engineering
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  • 30
    Publication Date: 2019-08-24
    Description: A photocathode, for generating electrons in response to incident photons in a photodetector, includes a base layer having a first lattice structure and an active layer having a second lattice structure and epitaxially formed on the base layer, the first and second lattice structures being sufficiently different to create a strain in the active layer with a corresponding piezoelectrically induced polarization field in the active layer, the active layer having a band gap energy corresponding to a desired photon energy.
    Keywords: Electronics and Electrical Engineering
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  • 31
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-07-12
    Description: In response to concerns about risks from lead-free induced faults to high reliability products, NASA has initiated a multi-year project to provide manufacturers and users with data to clarify the risks of lead-free materials in their products. The project will also be of interest to component manufacturers supplying to high reliability markets. The project was launched in November 2006. The primary technical objective of the project is to undertake comprehensive testing to generate information on failure modes/criteria to better understand the reliability of: - Packages (e.g., TSOP, BOA, PDIP) assembled and reworked with solder interconnects consisting of lead-free alloys - Packages (e.g., TSOP, BOA, PDIP) assembled and reworked with solder interconnects consisting of mixed alloys, lead component finish/lead-free solder and lead-free component finish/SnPb solder.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-116
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  • 32
    Publication Date: 2019-07-12
    Description: No abstract available
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-008
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  • 33
    Publication Date: 2019-07-12
    Description: An electron generating device extracts electrons, through an electron sheath, from plasma produced using RF fields. The electron sheath is located near a grounded ring at one end of a negatively biased conducting surface, which is normally a cylinder. Extracted electrons pass through the grounded ring in the presence of a steady state axial magnetic field. Sufficiently large magnetic fields and/or RF power into the plasma allow for helicon plasma generation. The ion loss area is sufficiently large compared to the electron loss area to allow for total non-ambipolar extraction of all electrons leaving the plasma. Voids in the negatively-biased conducting surface allow the time-varying magnetic fields provided by the antenna to inductively couple to the plasma within the conducting surface. The conducting surface acts as a Faraday shield, which reduces any time-varying electric fields from entering the conductive surface, i.e. blocks capacitive coupling between the antenna and the plasma.
    Keywords: Electronics and Electrical Engineering
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  • 34
    Publication Date: 2019-07-12
    Description: A device for conducting parallel analysis or manipulation of multiple cells or biomolecules is disclosed. In one embodiment, the device comprises a silicon chip with a microwell, and at least one membrane suspended at the bottom opening of the microwell. The suspended portion of the membrane defines a nanohole that provides access to the material on the other side of the membrane.
    Keywords: Electronics and Electrical Engineering
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  • 35
    Publication Date: 2019-07-12
    Description: The present invention generally provides methods of improving thermoelectric properties of alloys by subjecting them to one or more high temperature annealing steps, performed at temperatures at which the alloys exhibit a mixed solid/liquid phase, followed by cooling steps. For example, in one aspect, such a method of the invention can include subjecting an alloy sample to a temperature that is sufficiently elevated to cause partial melting of at least some of the grains. The sample can then be cooled so as to solidify the melted grain portions such that each solidified grain portion exhibits an average chemical composition, characterized by a relative concentration of elements forming the alloy, that is different than that of the remainder of the grain.
    Keywords: Electronics and Electrical Engineering
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  • 36
    Publication Date: 2019-07-12
    Description: A method of examining a sample comprises exposing the sample to a pump pulse of electromagnetic radiation for a first period of time, exposing the sample to a stimulant pulse of electromagnetic radiation for a second period of time which overlaps in time with at least a portion of the first exposing, to produce a signal pulse of electromagnetic radiation for a third period of time, and interfering the signal pulse with a reference pulse of electromagnetic radiation, to determine which portions of the signal pulse were produced during the exposing of the sample to the stimulant pulse. The first and third periods of time are each greater than the second period of time.
    Keywords: Electronics and Electrical Engineering
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  • 37
    Publication Date: 2019-07-12
    Description: The system includes a current injection device in electrical communication with the switch mode power supply. The current injection device is positioned to alter the initial, non-zero load current when activated. A prognostic control is in communication with the current injection device, controlling activation of the current injection device. A frequency detector is positioned to receive an output signal from the switch mode power supply and is able to count cycles in a sinusoidal wave within the output signal. An output device is in communication with the frequency detector. The output device outputs a result of the counted cycles, which are indicative of damage to an a remaining useful life of the switch mode power supply.
    Keywords: Electronics and Electrical Engineering
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  • 38
    Publication Date: 2019-07-12
    Description: Methods and systems for improving the sensitivity of a variety of conductivity sensing devices, in particular capacitively-coupled contactless conductivity detectors. A parallel inductor is added to the conductivity sensor. The sensor with the parallel inductor is operated at a resonant frequency of the equivalent circuit model. At the resonant frequency, parasitic capacitances that are either in series or in parallel with the conductance (and possibly a series resistance) is substantially removed from the equivalent circuit, leaving a purely resistive impedance. An appreciably higher sensor sensitivity results. Experimental verification shows that sensitivity improvements of the order of 10,000-fold are possible. Examples of detecting particulates with high precision by application of the apparatus and methods of operation are described.
    Keywords: Electronics and Electrical Engineering
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  • 39
    Publication Date: 2019-07-12
    Description: Electronic systems are required to operate under extreme temperatures in NASA planetary exploration and deep space missions. Electronics on-board spacecraft must also tolerate thermal cycling between extreme temperatures. Thermal management means are usually included in today s spacecraft systems to provide adequate temperature for proper operation of the electronics. These measures, which may include heating elements, heat pipes, radiators, etc., however add to the complexity in the design of the system, increases its cost and weight, and affects its performance and reliability. Electronic parts and circuits capable of withstanding and operating under extreme temperatures would reflect in improvement in system s efficiency, reducing cost, and improving overall reliability. Semiconductor chips based on silicon-on-insulator (SOI) technology are designed mainly for high temperature applications and find extensive use in terrestrial well-logging fields. Their inherent design offers advantages over silicon devices in terms of reduced leakage currents, less power consumption, faster switching speeds, and good radiation tolerance. Little is known, however, about their performance at cryogenic temperatures and under wide thermal swings. Experimental investigation on the operation of SOI, N-channel field effect transistors under wide temperature range was reported earlier [1]. This work examines the performance of P-channel devices of these SOI transistors. The electronic part investigated in this work comprised of a Cissoid s CHT-PMOS30, high temperature P-channel MOSFET (metal-oxide semiconductor field-effect transistor) device [2]. This high voltage, medium-power transistor is designed for geothermal well logging applications, aerospace and avionics, and automotive industry, and is specified for operation in the temperature range of -55 C to +225 C. Table I shows some specifications of this transistor [2]. The CHT-PMOS30 device was characterized at various temperatures over the range of -190 C to +225 C in terms of its voltage/current characteristic curves. The test temperatures included +22, -50, -100, -150, -175, -190, +50, +100, +150, +175, +200, and +225 C. Limited thermal cycling testing was also performed on the device. These tests consisted of subjecting the transistor to a total of twelve thermal cycles between -190 C and +225 C. A temperature rate of change of 10 C/min and a soak time at the test temperature of 10 minutes were used throughout this work. Post-cycling measurements were also performed at selected temperatures. In addition, re-start capability at extreme temperatures, i.e. power switched on while the device was soaking for a period of 20 minutes at the test temperatures of -190 C and +225 C, was investigated.
    Keywords: Electronics and Electrical Engineering
    Type: E-17165-INF
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  • 40
    Publication Date: 2019-07-12
    Description: An electric propulsion device is disclosed having an anode and a cathode. The propulsion device includes a discharge annulus having the anode adjacent an end region thereof. At least one inlet aperture is adjacent the anode, the aperture(s) having propellant gas flow therethrough into the discharge annulus. The propellant gas has an ionization potential. Opposed, dielectric walls define the annulus, with at least one of the opposed dielectric walls having pores therein, the pores having cooling gas flow therethrough into the discharge annulus and substantially adjacent the opposed dielectric wall(s). The cooling gas has an ionization potential higher than the ionization energy of the propellant gas. The cooling gas is adapted to substantially prevent at least one of secondary electron emission and sputtering of the dielectric walls.
    Keywords: Electronics and Electrical Engineering
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  • 41
    Publication Date: 2019-07-12
    Description: A combined content addressable memory device and memory interface is provided. The combined device and interface includes one or more one molecular wire crossbar memories having spaced-apart key nanowires, spaced-apart value nanowires adjacent to the key nanowires, and configurable switches between the key nanowires and the value nanowires. The combination further includes a key microwire-nanowire grid (key MNG) electrically connected to the spaced-apart key nanowires, and a value microwire-nanowire grid (value MNG) electrically connected to the spaced-apart value nanowires. A key or value MNGs selects multiple nanowires for a given key or value.
    Keywords: Electronics and Electrical Engineering
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  • 42
    Publication Date: 2019-07-12
    Description: Embodiments in accordance with the present invention relate to techniques for the growth and attachment of single wall carbon nanotubes (SWNT), facilitating their use as robust and well-characterized tools for AFM imaging and other applications. In accordance with one embodiment, SWNTs attached to an AFM tip can function as a structural scaffold for nanoscale device fabrication on a scanning probe. Such a probe can trigger, with nanometer precision, specific biochemical reactions or conformational changes in biological systems. The consequences of such triggering can be observed in real time by single-molecule fluorescence, electrical, and/or AFM sensing. Specific embodiments in accordance with the present invention utilize sensing and manipulation of individual molecules with carbon nanotubes, coupled with single-molecule fluorescence imaging, to allow observation of spectroscopic signals in response to mechanically induced molecular changes. Biological macromolecules such as proteins or DNA can be attached to nanotubes to create highly specific single-molecule probes for investigations of intermolecular dynamics, for assembling hybrid biological and nanoscale materials, or for developing molecular electronics. In one example, electrical wiring of single redox enzymes to carbon nanotube scanning probes allows observation and electrochemical control over single enzymatic reactions by monitoring fluorescence from a redox-active cofactor or the formation of fluorescent products. Enzymes ''nanowired'' to the tips of carbon nanotubes in accordance with embodiments of the present invention, may enable extremely sensitive probing of biological stimulus-response with high spatial resolution, including product-induced signal transduction.
    Keywords: Electronics and Electrical Engineering
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  • 43
    Publication Date: 2019-07-12
    Description: A sensor chip, comprising a flexible, polymer-based substrate, and at least one microfabricated sensor disposed on the substrate and including a conductive element. The at least one sensor comprises at least one of a tactile sensor and a flow sensor. Other embodiments of the present invention include sensors and/or multi-modal sensor nodes.
    Keywords: Electronics and Electrical Engineering
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  • 44
    Publication Date: 2019-07-12
    Description: An electro-active sensor includes a nonconductive platform with a first electrode set attached with a first side of a nonconductive platform. The first electrode set serves as an electrochemical cell that may be utilized to detect electro-active species in solution. A plurality of electrode sets and a variety of additional electrochemical cells and sensors may be attached with the nonconductive platform. The present invention also includes a method for constructing the aforementioned electro-active sensor. Additionally, an apparatus for detection and observation is disclosed, where the apparatus includes a sealable chamber for insertion of a portion of an electro-active sensor. The apparatus allows for monitoring and detection activities. Allowing for control of attached cells and sensors, a dual-mode circuitry is also disclosed. The dual-mode circuitry includes a switch, allowing the circuitry to be switched from a potentiostat to a galvanostat mode.
    Keywords: Electronics and Electrical Engineering
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  • 45
    Publication Date: 2019-07-12
    Description: A branched nanostructure is synthesized. A porous material, with pores having a diameter of approximately 1 .mu.m or less, is placed in a vacuum. It is irradiated with an electron beam. This causes a trunk to grow from the porous material and further causes branches to grow from the trunk.
    Keywords: Electronics and Electrical Engineering
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  • 46
    Publication Date: 2019-07-12
    Description: Electronic sensors and circuits are often exposed to extreme temperatures in many of NASA deep space and planetary surface exploration missions. Electronics capable of operation in harsh environments would be beneficial as they simplify overall system design, relax thermal management constraints, and meet operational requirements. For example, cryogenic operation of electronic parts will improve reliability, increase energy density, and extend the operational lifetimes of space-based electronic systems. Similarly, electronic parts that are able to withstand and operate efficiently in high temperature environments will negate the need for thermal control elements and their associated structures, thereby reducing system size and weight, enhancing its reliability, improving its efficiency, and reducing cost. Passive devices play a critical role in the design of almost all electronic circuitry. To address the needs of systems for extreme temperature operation, some of the advanced and most recently introduced commercial-off-the-shelf (COTS) passive devices, which included resistors and capacitors, were examined for operation under a wide temperature regime. The types of resistors investigated included high temperature precision film, general purpose metal oxide, and wirewound.
    Keywords: Electronics and Electrical Engineering
    Type: E-17163
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  • 47
    Publication Date: 2019-07-12
    Description: A system has a reduced sensitivity to Single Event Upset and/or Single Event Transient(s) compared to traditional logic devices. In a particular embodiment, the system includes an input, a logic block, a bias stage, a state machine, and an output. The logic block is coupled to the input. The logic block is for implementing a logic function, receiving a data set via the input, and generating a result f by applying the data set to the logic function. The bias stage is coupled to the logic block. The bias stage is for receiving the result from the logic block and presenting it to the state machine. The state machine is coupled to the bias stage. The state machine is for receiving, via the bias stage, the result generated by the logic block. The state machine is configured to retain a state value for the system. The state value is typically based on the result generated by the logic block. The output is coupled to the state machine. The output is for providing the value stored by the state machine. Some embodiments of the invention produce dual rail outputs Q and Q'. The logic block typically contains combinational logic and is similar, in size and transistor configuration, to a conventional CMOS combinational logic design. However, only a very small portion of the circuits of these embodiments, is sensitive to Single Event Upset and/or Single Event Transients.
    Keywords: Electronics and Electrical Engineering
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  • 48
    Publication Date: 2019-07-12
    Description: Electronic parts based on silicon-on-insulator (SOI) technology are finding widespread applications due to their ability to operate in harsh environments and the benefits they offer as compared to their silicon counterparts. Due to their construction, they are tailored for high temperature operation and show good tolerance to radiation events. In addition, their inherent design lessens the formation of parasitic junctions, thereby reducing leakage currents, decreasing power consumption, and enhancing speed. These devices are typically rated in temperature capability from -55 C to about +225 C, and their characteristics over this temperature range are documented in data sheets. Since electronics in some of NASA space exploration missions are required to operate under extreme temperature conditions, both cold and hot, their characteristic behavior within the full temperature spectrum must be determined to establish suitability for use in space applications. The effects of extreme temperature exposure on the performance of a new commercial-off-the-shelf (COTS) SOI AND gate device were evaluated in this work. The high temperature, quad 2-inputs AND gate device, which was recently introduced by CISSOID, is fabricated using a CMOS SOI process. Some of the specifications of the CHT-7408 chip are listed in a table. By supplying a constant DC voltage to one gate input and a 10 kHz square wave into the other associated gate input, the chip was evaluated in terms of output response, output rise (t(sub r)) and fall times (tf), and propagation delays (using a 50% level between input and output during low to high (tPLH) and high to low (tPHL) transitions). The supply current of the gate circuit was also obtained. These parameters were recorded at various test temperatures between -195 C and +250 C using a Sun Systems environmental chamber programmed at a temperature rate of change of 10 C/min. In addition, the effects of thermal cycling on this chip were determined by exposing it to a total of 12 cycles between -195 C and +250 C. Following the cycling activity, measurements were performed again at the test temperatures of -195 C, +21 C, and +250 C.
    Keywords: Electronics and Electrical Engineering
    Type: E-17162
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  • 49
    Publication Date: 2019-07-12
    Description: Electronic control systems, data-acquisition instrumentation, and microprocessors require accurate timing signals for proper operation. Traditionally, ceramic resonators and crystal oscillators provided this clock function for the majority of these systems. Over the last few years, MEMS (Micro-Electro-Mechanical Systems) resonator-based oscillators began to surface as commercial-off-the-shelf (COTS) parts by a few companies. These quartz-free, miniature silicon devices could easily replace the traditional crystal oscillators in providing the timing/clock function for many digital and analog circuits. They are reported to provide stable output frequency, offer great tolerance to shock and vibration, and are immune to electro-static discharge [ 1-2]. In addition, they are encapsulated in compact lead-free packages and cover a wide frequency range (1 MHz to 125 MHz). The small size of the MEMS oscillators along with their thermal stability make them ideal candidates for use in space exploration missions. Limited data, however, exist on the performance and reliability of these devices under operation in applications where extreme temperatures or thermal cycling swings, which are typical of space missions, are encountered. This report presents the results of the work obtained on the evaluation of an Ecliptek Corporation MEMS silicon oscillator chip under extreme temperatures.
    Keywords: Electronics and Electrical Engineering
    Type: E-17161
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  • 50
    Publication Date: 2019-07-12
    Description: Silicon-on-insulator (SOI) technology is becoming widely used in integrated circuit chips for its advantages over the conventional silicon counterpart. The decrease in leakage current combined with lower power consumption allows electronics to operate in a broader temperature range. This paper describes the performance of an SOIbased temperature sensor under extreme temperatures and thermal cycling. The sensor comprised of a temperature-to-frequency relaxation oscillator circuit utilizing an SOI precision timer chip. The circuit was evaluated under extreme temperature exposure and thermal cycling between -190 C and +210 C. The results indicate that the sensor performed well over the entire test temperature range and it was able to re-start at extreme temperatures.
    Keywords: Electronics and Electrical Engineering
    Type: E-17167-P
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  • 51
    Publication Date: 2019-07-12
    Description: Electronic systems designed for use in deep space and planetary exploration missions are expected to encounter extreme temperatures and wide thermal swings. Silicon-based devices are limited in their wide-temperature capability and usually require extra measures, such as cooling or heating mechanisms, to provide adequate ambient temperature for proper operation. Silicon-On-Insulator (SOI) technology, on the other hand, lately has been gaining wide spread use in applications where high temperatures are encountered. Due to their inherent design, SOI-based integrated circuit chips are able to operate at temperatures higher than those of the silicon devices by virtue of reducing leakage currents, eliminating parasitic junctions, and limiting internal heating. In addition, SOI devices provide faster switching, consume less power, and offer improved radiation-tolerance. Very little data, however, exist on the performance of such devices and circuits under cryogenic temperatures. In this work, the performance of an SOI bootstrapped, full-bridge driver integrated circuit was evaluated under extreme temperatures and thermal cycling. The investigations were carried out to establish a baseline on the functionality and to determine suitability of this device for use in space exploration missions under extreme temperature conditions.
    Keywords: Electronics and Electrical Engineering
    Type: E-17166-Inf
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  • 52
    Publication Date: 2019-07-12
    Description: We have found experimentally that the critical current of a square superconducting transition-edge sensor (TES) depends exponentially upon the side length L and the square root of the temperature T. As a consequence, the effective transition temperature T(sub c) of the TES is current-dependent and at fixed current scales as 1/L(sup 2). We also have found that the critical current can show clear Fraunhofer-like oscillations in an applied magnetic field, similar to those found in Josephson junctions. The observed behavior has a natural theoretical explanation in terms of longitudinal proximity effects if the TES is regarded as a weak link between superconducting leads. We have observed the proximity effect in these devices over extraordinarily long lengths exceeding 100 microns.
    Keywords: Electronics and Electrical Engineering
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  • 53
    Publication Date: 2019-07-12
    Description: The concept of a transparent conveyor of small loose dielectric parti cles or small amounts of dielectric liquids has emerged as an outgro wth of an effort to develop efficient, reliable means of automated re moval of dust from solar cells and from windows of optical instrumen ts. This concept is based on the previously reported concept of an e lectrodynamic screen, according to which a grid-like electric field is established on and near a surface and is moved along the surface p erpendicularly to the grid lines. The resulting electrodynamic force s on loose dielectric particles or dielectric liquid drops in the vic inity would move the particles or drops along the surface. In the or iginal dust-removal application, dust particles would thus be swept out of the affected window area. Other potential applications may occ ur in nanotechnology -- for example, involving mixing of two or more fluids and/or nanoscale particles under optical illumination and/or optical observation.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-12616 , NASA Tech Briefs, October 2009; 23
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  • 54
    Publication Date: 2019-07-12
    Description: Sensor faults continue to be a major hurdle for systems health management to reach its full potential. At the same time, few recorded instances of sensor faults exist. It is equally difficult to seed particular sensor faults. Therefore, research is underway to better understand the different fault modes seen in sensors and to model the faults. The fault models can then be used in simulated sensor fault scenarios to ensure that algorithms can distinguish between sensor faults and system faults. The paper illustrates the work with data collected from an electro-mechanical actuator in an aerospace setting, equipped with temperature, vibration, current, and position sensors. The most common sensor faults, such as bias, drift, scaling, and dropout were simulated and injected into the experimental data, with the goal of making these simulations as realistic as feasible. A neural network based classifier was then created and tested on both experimental data and the more challenging randomized data sequences. Additional studies were also conducted to determine sensitivity of detection and disambiguation efficacy to severity of fault conditions.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN-341
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  • 55
    Publication Date: 2019-07-12
    Description: A quasi-static (low frequency) model is developed for THUNDER actuators configured as displacement sensors based on a simple Raleigh-Ritz technique. This model is used to calculate charge as a function of displacement. Using this and the calculated capacitance, voltage vs. displacement and voltage vs. electrical load curves are generated and compared with measurements. It is shown this model gives acceptable results and is useful for determining rough estimates of sensor output for various loads, laminate configurations and thicknesses.
    Keywords: Electronics and Electrical Engineering
    Type: LF99-7603
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  • 56
    Publication Date: 2019-07-12
    Description: The Thermal and Electrical Conductivity Probe (TECP) is a component of the Microscopy, Electrochemistry, and Conductivity Analyzer (MECA) payload on the Phoenix Lander. TECP will measure the temperature, thermal conductivity and volumetric heat capacity of the regolith. It will also detect and quantify the population of mobile H2O molecules in the regolith, if any, throughout the polar summer, by measuring the electrical conductivity of the regolith, as well as the dielectric permittivity. In the vapor phase, TECP is capable of measuring the atmospheric H2O vapor abundance, as well as augment the wind velocity measurements from the meteorology instrumentation. TECP is mounted near the end of the 2.3 m Robotic Arm, and can be placed either in the regolith material or held aloft in the atmosphere. This paper describes the development and calibration of the TECP. In addition, substantial characterization of the instrument has been conducted to identify behavioral characteristics that might affect landed surface operations. The greatest potential issue identified in characterization tests is the extraordinary sensitivity of the TECP to placement. Small gaps alter the contact between the TECP and regolith, complicating data interpretation. Testing with the Phoenix Robotic Arm identified mitigation techniques that will be implemented during flight. A flight model of the instrument was also field tested in the Antarctic Dry Valleys during the 2007-2008 International Polar year. 2
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN264
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  • 57
    Publication Date: 2019-07-12
    Description: A two-step plasma process has been developed as a means of removing surface oxide layers from indium bumps used in flip-chip hybridization (bump bonding) of integrated circuits. The two-step plasma process makes it possible to remove surface indium oxide, without incurring the adverse effects of the acid etching process.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-45911 , NASA Tech Briefs, June 2009; 21-22
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  • 58
    Publication Date: 2019-07-12
    Description: A hand tool has been developed for crimping leads in flexible tails that are parts of some electronic circuits -- especially some sensor circuits. The tool is used to cut the tails to desired lengths and attach solder tabs to the leads. For tailoring small numbers of circuits for special applications, this hand tool is a less expensive alternative to a commercially available automated crimping tool. The crimping tool consists of an off-the-shelf hand crimping tool plus a specialized crimping insert designed specifically for the intended application.
    Keywords: Electronics and Electrical Engineering
    Type: MSC-23461-1 , NASA Tech Briefs, June 2009; 22
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  • 59
    Publication Date: 2019-07-12
    Description: A document discusses room-temperature ionic liquids (RTILs) used as electrolytes in carbon-nanotube-based, electrochemical, double-layer capacitors. Unlike the previous electrolyte (EtNB4 in acetonitrile), the RTIL used here does not produce cyanide upon thermal decomposition and does not have a moisture sensitivity.
    Keywords: Electronics and Electrical Engineering
    Type: MSC-24190-1 , NASA Tech Briefs, June 2009; 31
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  • 60
    Publication Date: 2019-07-12
    Description: This report describes the Universal Reconfigurable Translation Module, or URTM. The URTM was developed by Sigma Space Corporation for NASA in order to translate specific serial protocols, both logically and physically. At present, the prototype configuration has targeted MIL-STD-1553B (RT and BC), IEEE 1394b (Firewire), and ECSS-E-50-12A (SpaceWire). The objectives of this program were to study the feasibility of a configurable URTM to translate serial link data as might be used in a space-flight mission and to design, develop, document, and deliver an engineering prototype model of the URTM with a path to spaceflight. By simply connecting two of the three Physical Interface Modules (PIM) on either end of the RPTM (Reconfigurable Protocol Translator Module), the URTM then self configures via a library of interface translation functions, thereby allowing the two data links to communicate seamlessly.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/CR-2009-215744 , LF99-8452
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  • 61
    Publication Date: 2019-07-12
    Description: A mathematical model, and software to implement the model, have been devised to enable numerical simulation of the transport of electric charge in, and the resulting electrical performance characteristics of, a nanotransistor [in particular, a metal oxide/semiconductor field-effect transistor (MOSFET) having a channel length of the order of tens of nanometers] in which the overall device geometry, including the doping profiles and the injection of charge from the source, gate, and drain contacts, are approximated as being two-dimensional. The model and software constitute a computational framework for quantitatively exploring such device-physics issues as those of source-drain and gate leakage currents, drain-induced barrier lowering, and threshold voltage shift due to quantization. The model and software can also be used as means of studying the accuracy of quantum corrections to other semiclassical models.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-15471-1 , NASA Tech Briefs, May 2009; 32-33
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  • 62
    Publication Date: 2019-07-12
    Description: A proposed wideangle lens is shown that would be especially well suited for an electronic camera in which the focal plane is occupied by an image sensor that has small pixels. The design of the lens is intended to satisfy requirements for compactness, high image quality, and reasonably low cost, while addressing issues peculiar to the operation of small-pixel image sensors. Hence, this design is expected to enable the development of a new generation of compact, high-performance electronic cameras. The lens example shown has a 60 degree field of view and a relative aperture (f-number) of 3.2. The main issues affecting the design are also shown.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44404 , NASA Tech Briefs, May 2009; 30
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  • 63
    Publication Date: 2019-07-12
    Description: As NASA embarks on a renewed human presence in space, safe, human-rated, electrical energy storage and power generation technologies, which will be capable of demonstrating reliable performance in a variety of unique mission environments, will be required. To address the future performance and safety requirements for the energy storage technologies that will enhance and enable future NASA Constellation Program elements and other future aerospace missions, advanced rechargeable, lithium-ion battery technology development is being pursued with an emphasis on addressing performance technology gaps between state-of-the-art capabilities and critical future mission requirements. The material attributes and related performance of a lithium-ion cell's internal separator component are critical for achieving overall optimal performance, safety and reliability. This review provides an overview of the general types, material properties and the performance and safety characteristics of current separator materials employed in lithium-ion batteries, such as those materials that are being assessed and developed for future aerospace missions.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM-2009-215590 , E-16879
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  • 64
    Publication Date: 2019-07-12
    Description: Nanotechnology has provided a new interest in thermoelectric technology. A thermodynamically driven process is one approach in achieving nanostructures in bulk materials. TiO2/SnO2 system exhibits a large spinodal region with exceptional stable phase separated microstructures up to 1400 C. Fabricated TiO2/SnO2 nanocomposites exhibit n-type behavior with Seebeck coefficients greater than -300 .V/K. Composites exhibit good thermal conductance in the range of 7 to 1 W/mK. Dopant additions have not achieved high electrical conductivity (〈1000 S/m). Formation of oxygen deficient composites, TixSn1-xO2-y, can change the electrical conductivity by four orders of magnitude. Achieving higher thermoelectric ZT by oxygen deficiency is being explored. Seebeck coeffcient, thermal conductivity, electrical conductance and microstructure will be discussed in relation to composition and doping.
    Keywords: Electronics and Electrical Engineering
    Type: E-16996
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  • 65
    Publication Date: 2019-07-12
    Description: Extreme temperatures, both hot and cold, are anticipated in many of NASA space exploration missions as well as in terrestrial applications. One can seldom find electronics that are capable of operation under both regimes. Even for operation under one (hot or cold) temperature extreme, some thermal controls need to be introduced to provide appropriate ambient temperatures so that spacecraft on-board or field on-site electronic systems work properly. The inclusion of these controls, which comprise of heating elements and radiators along with their associated structures, adds to the complexity in the design of the system, increases cost and weight, and affects overall reliability. Thus, it would be highly desirable and very beneficial to eliminate these thermal measures in order to simplify system's design, improve efficiency, reduce development and launch costs, and improve reliability. These requirements can only be met through the development of electronic parts that are designed for proper and efficient operation under extreme temperature conditions. Silicon-on-insulator (SOI) based devices are finding more use in harsh environments due to the benefits that their inherent design offers in terms of reduced leakage currents, less power consumption, faster switching speeds, good radiation tolerance, and extreme temperature operability. Little is known, however, about their performance at cryogenic temperatures and under wide thermal swings. The objective of this work was to evaluate the performance of a new commercial-off-the-shelf (COTS) SOI parts over an extended temperature range and to determine the effects of thermal cycling on their performance. The results will establish a baseline on the suitability of such devices for use in space exploration missions under extreme temperatures, and will aid mission planners and circuit designers in the proper selection of electronic parts and circuits. The electronic part investigated in this work comprised of a CHT-NMOS80 high temperature N-channel MOSFET (metal-oxide semiconductor field-effect transistor) device that was manufactured by CISSOID. This high voltage, medium-power transistor is fabricated using SOI processes and is designed for extreme wide temperature applications such as geothermal well logging, aerospace and avionics, and automotive industry. It has a high DC current capability and is specified for operation in the temperature range of -55 C to +225 C
    Keywords: Electronics and Electrical Engineering
    Type: E-16977
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  • 66
    Publication Date: 2019-08-13
    Description: A photodetector, detector array, and method of operation thereof in which nanojunctions are formed by crossing layers of nanowires. The crossing nanowires are separated by a few nm thick electrical barrier layer which allows tunneling. Each nanojunction is coupled to a slot antenna for efficient and frequency-selective coupling to photo signals. The nanojunctions formed at the intersection of the crossing wires defines a vertical tunneling diode that rectifies the AC signal from a coupled antenna and generates a DC signal suitable for reforming a video image. The nanojunction sensor allows multi/hyper spectral imaging of radiation within a spectral band ranging from terahertz to visible light, and including infrared (IR) radiation. This new detection approach also offers unprecedented speed, sensitivity and fidelity at room temperature.
    Keywords: Electronics and Electrical Engineering
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  • 67
    Publication Date: 2019-08-13
    Description: Methods of bulk manufacturing high temperature sensor subassembly packages are disclosed and claimed. Sensors are sandwiched between a top cover and a bottom cover so as to enable the peripheries of the top covers, sensors and bottom covers to be sealed and bound securely together are disclosed and claimed. Sensors are placed on the bottom covers leaving the periphery of the bottom cover exposed. Likewise, top covers are placed on the sensors leaving the periphery of the sensor exposed. Individual sensor sub-assemblies are inserted into final packaging elements which are also disclosed and claimed. Methods of directly attaching wires or pins to contact pads on the sensors are disclosed and claimed. Sensors, such as pressure sensors and accelerometers, and headers made out of silicon carbide and aluminum nitride are disclosed and claimed. Reference cavities are formed in some embodiments disclosed and claimed herein where top covers are not employed.
    Keywords: Electronics and Electrical Engineering
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  • 68
    Publication Date: 2019-08-24
    Description: The present invention relates to sub-millimeter wave frequency heterodyne imaging systems. More specifically, the present invention relates to a sub-millimeter wave frequency heterodyne detector system for imaging the magnitude and phase of transmitted power through or reflected power off of mechanically scanned samples at sub-millimeter wave frequencies.
    Keywords: Electronics and Electrical Engineering
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  • 69
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-08-13
    Description: A tiny sensor, small enough to be worn on clothing, now monitors voltage changes near sensitive instruments after being created to alert Agency workers to dangerous static buildup near fuel operations and avionics. San Diego s Quasar Federal Systems received a Small Business Innovation Research (SBIR) contract from Kennedy Space Center to develop its remote voltage sensor (RVS), a dime-sized electrometer designed to measure triboelectric changes in the environment. One of the unique qualities of the RVS is that it can detect static at greater distances than previous devices, measuring voltage changes from a few centimeters to a few meters away, due to its much-improved sensitivity.
    Keywords: Electronics and Electrical Engineering
    Type: Spinoff 2009; 140-141; NASA/NP-2009-09-607-HQ
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  • 70
    Publication Date: 2019-08-27
    Description: Lightning transients were pin-injected into metal-oxide-semiconductor field-effect transistors (MOSFETs) to induce fault modes. This report documents the test process and results, and provides a basis for subsequent lightning tests. MOSFETs may be present in DC-DC power supplies and electromechanical actuator circuits that may be used on board aircraft. Results show that unprotected MOSFET Gates are susceptible to failure, even when installed in systems in well-shielded and partial-shielded locations. MOSFET Drains and Sources are significantly less susceptible. Device impedance decreased (current increased) after every failure. Such a failure mode may lead to cascading failures, as the damaged MOSFET may allow excessive current to flow through other circuitry. Preliminary assessments on a MOSFET subjected to 20-stroke pin-injection testing demonstrate that Breakdown Voltage, Leakage Current and Threshold Voltage characteristics show damage, while the device continues to meet manufacturer performance specifications. The purpose of this research is to develop validated tools, technologies, and techniques for automated detection, diagnosis and prognosis that enable mitigation of adverse events during flight, such as from lightning transients; and to understand the interplay between lightning-induced surges and aging (i.e. humidity, vibration thermal stress, etc.) on component degradation.
    Keywords: Electronics and Electrical Engineering
    Type: NASA/TM-2009-215794 , L-19713 , LF99-9139
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  • 71
    Publication Date: 2019-08-27
    Description: An optical assembly is formed by one or more piezoelectric fiber composite actuators having one or more optical fibers coupled thereto. The optical fiber(s) experiences strain when actuation voltage is applied to the actuator(s). Light passing through the optical fiber(s) is wavelength tuned by adjusting the actuation voltage.
    Keywords: Electronics and Electrical Engineering
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  • 72
    Publication Date: 2019-08-28
    Description: A method for concentrating or partly separating particles of a selected species from a liquid or fluid containing these particles and flowing in a channel, and for determining if the selected species particle is present in the liquid or fluid. A time varying electrical field E, having a root-mean-square intensity E.sup.2.sub.rms with a non-zero gradient in a direction transverse to the liquid or fluid flow direction, is produced by a nanostructure electrode array, with a very high magnitude gradient near exposed electrode tips. A dielectrophoresis force causes the selected particles to accumulate near the electrode tips, if the medium and selected particles have substantially different dielectric constants. An insulating material surrounds most of each of the nanostructure electrodes, and a region of the insulating material surface is functionalized to promote attachment of the selected species particles to the surface. An electrical property value Z(meas) is measured at the functionalized surface and is compared with a reference value Z(ref) to determine if the selected species particles are attached to the functionalized surface.
    Keywords: Electronics and Electrical Engineering
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  • 73
    Publication Date: 2019-08-28
    Description: Method and system for determining chemical composition of a single-component or multiple-component gas, using a discharge holdoff mechanism. A voltage difference V between two spaced apart electrodes is brought to a selected value and held, the holdoff time interval .DELTA.t(V;ho) required before gas discharge occurs is measured, and the associated electrical current or cumulative electrical charge is measured. As the voltage difference V increases, the time interval length .DELTA.t(V;ho) decreases monotonically. Particular voltage values, V.sub..infin. and V.sub.0, correspond to initial appearance of discharge (.DELTA.t.apprxeq..infin.) and prompt discharge (.DELTA.t.apprxeq.0). The values V.sub..infin. and V.sub.0 and the rate of decrease of .DELTA.t(V;ho) and/or the rate of increase of current or cumulative charge with increasing V are characteristic of one or more gas components present.
    Keywords: Electronics and Electrical Engineering
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  • 74
    Publication Date: 2019-08-28
    Description: Processing circuitry is provided for a high voltage operated radiation detector. An event detector utilizes a comparator configured to produce an event signal based on a leading edge threshold value. A preferred event detector does not produce another event signal until a trailing edge threshold value is satisfied. The event signal can be utilized for counting the number of particle hits and also for controlling data collection operation for a peak detect circuit and timer. The leading edge threshold value is programmable such that it can be reprogrammed by a remote computer. A digital high voltage control is preferably operable to monitor and adjust high voltage for the detector.
    Keywords: Electronics and Electrical Engineering
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  • 75
    Publication Date: 2019-08-28
    Description: A magnetic field response sensor comprises an inductor placed at a fixed separation distance from a conductive surface to address the low RF transmissivity of conductive surfaces. The minimum distance for separation is determined by the sensor response. The inductor should be separated from the conductive surface so that the response amplitude exceeds noise level by a recommended 10 dB. An embodiment for closed cavity measurements comprises a capacitor internal to said cavity and an inductor mounted external to the cavity and at a fixed distance from the cavity's wall. An additional embodiment includes a closed cavity configuration wherein multiple sensors and corresponding antenna are positioned inside the cavity, with the antenna and inductors maintained at a fixed distance from the cavity's wall.
    Keywords: Electronics and Electrical Engineering
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  • 76
    Publication Date: 2019-08-28
    Description: An embodiment generally relates to a method of self-detecting an error in a field programmable gate array (FPGA). The method includes writing a signature value into a signature memory in the FPGA and determining a conclusion of a configuration refresh operation in the FPGA. The method also includes reading an outcome value from the signature memory.
    Keywords: Electronics and Electrical Engineering
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  • 77
    Publication Date: 2019-08-28
    Description: A system comprising an interchangeable electronic controller is provided with programming that allows the controller to adapt a behavior that is dependent upon the particular type of function performed by a system or subsystem component. The system reconfigures the controller when the controller is moved from one group of subsystem components to another. A plurality of application programs are provided by a server from which the application program for a particular electronic controller is selected. The selection is based on criteria such as a subsystem component group identifier that identifies the particular type of function associated with the system or subsystem group of components.
    Keywords: Electronics and Electrical Engineering
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  • 78
    facet.materialart.
    Unknown
    In:  CASI
    Publication Date: 2019-08-28
    Description: The contents include: 1) Water Soluble Flux; 2) Non-Hermetic Packages; 3) Counterfeit Parts; and 4) Lead-Free Solder.
    Keywords: Electronics and Electrical Engineering
    Type: STI 09-170 , JAXA/ESA/NASA Trilateral Safety and Mission Assurance Meeting; Oct 30, 2009; United States
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  • 79
    Publication Date: 2019-08-13
    Description: A method of applying a physical barrier to suppress thermal decomposition near a surface of a thermoelectric material including applying a continuous metal foil to a predetermined portion of the surface of the thermoelectric material, physically binding the continuous metal foil to the surface of the thermoelectric material using a binding member, and heating in a predetermined atmosphere the applied and physically bound continuous metal foil and the thermoelectric material to a sufficient temperature in order to promote bonding between the continuous metal foil and the surface of the thermoelectric material. The continuous metal foil forms a physical barrier to enclose a predetermined portion of the surface. Thermal decomposition is suppressed at the surface of the thermoelectric material enclosed by the physical barrier when the thermoelectric element is in operation.
    Keywords: Electronics and Electrical Engineering
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  • 80
    facet.materialart.
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    In:  CASI
    Publication Date: 2019-07-13
    Description: No abstract available
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-042 , DoD Soldering Technologies Working Group (STWG); Apr 14, 2009 - Apr 15, 2009; Cocoa Beach, FL; United States
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  • 81
    Publication Date: 2019-07-13
    Description: This paper provides insight into the difficult analytical issue for launch vehicles and spacecraft that has applicability outside of the launch industry. Radiation from spacecraft or launch vehicle antennas located within enclosures in the launch vehicle generates an electromagnetic environment that is difficult to accurately predict. This paper discusses the test results of power levels produced by a transmitter within a representative scaled vehicle fairing model and provides preliminary modeling results at the low end of the frequency test range using a commercial tool. Initially, the walls of the fairing are aluminum and later, layered with materials to simulate acoustic blanketing structures that are typical in payload fairings. The effects of these blanketing materials on the power levels within the fairing are examined.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-2009-004 , 2009 IEEE EMC Symposium; Aug 17, 2009 - Aug 21, 2009; Austin, TX; United States
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  • 82
    Publication Date: 2019-07-13
    Description: This is an introductory paper for the focused session "Advanced Materials and Cell Components for NASA's Exploration Missions". This session will concentrate on electrochemical advances in materials and components that have been achieved through efforts sponsored under NASA's Exploration Systems Mission Directorate (ESMD). This paper will discuss the performance goals for components and for High Energy and Ultra High Energy cells, advanced lithium-ion cells that will offer a combination of higher specific energy and improved safety over state-of-the-art. Papers in this session will span a broad range of materials and components that are under development to enable these cell development efforts.
    Keywords: Electronics and Electrical Engineering
    Type: 2009 NASA Aerospace Battery Workshop; Nov 17, 2009 - Nov 19, 2009; Huntsville, AL; United States
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  • 83
    Publication Date: 2019-07-13
    Description: Piezoelectric stacks are being sought to be used as actuators for precision positioning and deployment of mechanisms in future planetary missions. Beside the requirement for very high operation reliability, these actuators are required for operation at space environments that are considered harsh compared to normal terrestrial conditions.These environmental conditions include low and high temperatures and vacuum or high pressure. Additionally, the stacks are subjected to high stress and in some applications need to operate with a very long lifetime durability.Many of these requirements are beyond the current industry design margins for nominal terrestrial applications. In order to investigate some of the properties that will indicate the durability of such actuators and their limitations we have developed a new type of test fixture that can be easily integrated in various test chambers for simulating environmental conditions, can provide access for multiple measurements while being exposed to adjustable stress levels. We designed and built two test fixtures and these fixtures were made to be adjustable for testing stacks with different dimensions and can be easily used in small or large numbers. The properties that were measured using these fixtures include impedance, capacitance, dielectric loss factor, leakage current, displacement, breakdown voltage, and lifetime performance. The fixtures characteristics and the test capabilities are presented in this paper.
    Keywords: Electronics and Electrical Engineering
    Type: Smart Structures and Materials and Nondestructive Evaluation and Health Monitoring; Jan 01, 2008; San Diego, CA; United States
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  • 84
    Publication Date: 2019-07-13
    Description: At GOMAC 2007 and 2008, we discussed a variety of challenges for radiation testing of modern semiconductor devices and technologies [1, 2]. In this presentation, we provide more specific details in this on-going investigation focusing on out-of-the-box lessons observed for providing radiation effects assurances as well as preliminary test results.
    Keywords: Electronics and Electrical Engineering
    Type: Government Microcircuits Application Conference; Mar 16, 2009 - Mar 19, 2009; Florida; United States
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  • 85
    Publication Date: 2019-07-13
    Description: NASA Johnson Space Center (JSC) Materials and Processes Branch requested that NASA JSC White Sands Test Facility (WSTF) perform testing for the Constellation Program to evaluate the hazard of electrical arc ignition of materials that could be in close proximity to batteries. Specifically, WSTF was requested to perform wire-break electrical arc tests to determine the current threshold for ignition of generic cotton woven fabric samples with a fixed voltage of 3.7 V, a common voltage for hand-held electrical devices. The wire-break test was developed during a previous test program to evaluate the hazard of electrical arc ignition inside the Extravehicular Mobility Unit [1].
    Keywords: Electronics and Electrical Engineering
    Type: 12th International Symposium on Flammability and of Materials in Oxygen-Enriched Atmospheres; Oct 07, 2009 - Oct 09, 2009; Berlin; Germany
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  • 86
    Publication Date: 2019-07-13
    Description: Juno is a mission in the NASA New Frontiers Program with the goal of significantly improving our understanding of the formation and structure of Jupiter. This paper discusses the modeling and measurement of the two patch array antennas. An overview of the antenna architecture, design and development at JPL is provided, along with estimates of performance and the results of measurements.
    Keywords: Electronics and Electrical Engineering
    Type: IEEE International Symposium on Antennas & Propagation Society International Symposium and USNC/URSI National Radio Science Meeting; Jun 01, 2009 - Jun 05, 2009; North Charleston, SC; United States
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  • 87
    Publication Date: 2019-07-12
    Description: The development of thin-film solid oxide fuel cells (TFSOFCs) and a method of fabricating them have progressed to the prototype stage. This can result in the reduction of mass, volume, and the cost of materials for a given power level.
    Keywords: Electronics and Electrical Engineering
    Type: MFS-32513-1 , NASA Tech Briefs, July 2009; 18
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  • 88
    Publication Date: 2019-07-12
    Description: This slide presentation reviews the considerations for the design of wiring for the Lunar Module. Included are a review of the choice of conductors and insulations, the wire splicing (i.e., crimping, and soldering), the wire connectors, and the fabrication of the wire harnesses. The problems in fabrication include the wires being the wrong length, the damage due to the sharp edges, the requried use of temproary protective covers and inadequate training. The problems in the wire harness installation include damge from sharp eges, work on adjacent harnesses, connector damage, and breaking wires. Engineering suggestions from the Apollo-era in reference to the conductors that are reviewed include: the use of plated conductors, and the use of alloys for stronger wiring. In refernce to insulation, the suggestions from Apollo era include the use of polymer tape-wrap wire insulation due to the light weight, however, other types of modern insulation might be more cost-effective. In reference to wire splices and terminal boards the suggestions from the Apollo Era include the use of crimp splices as superior to solder splices, joining multiple wire to a common point using modular plug-ins might be more reliable, but are heavier than crimp splicing. For connectors, the lessons from the Apollo era indicate that a rear environmental seal that does not require additional potting is preferred, and pins should be crimped or welded to the incoming wires and be removable from the rear of the connector.
    Keywords: Electronics and Electrical Engineering
    Type: JSC-17237-15
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  • 89
    Publication Date: 2019-07-12
    Description: Electronic circuitry has been devised to enable operation of an ion accelerator in either a continuous mode or a highpeak power, low-average-power pulsed mode. In the original intended application, the ion accelerator would be used as a spacecraft thruster and the pulse mode would serve to generate small increments of impulse for precise control of trajectories and attitude. The present electronic drive circuitry generates the extraction voltage in pulses. Pulse-width modulation can affect rapid, fine control of time-averaged impulse or ion flux down to a minimum level much lower than that achievable in continuous operation.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-44961 , NASA Tech Briefs, February 2009; 24
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  • 90
    Publication Date: 2019-07-12
    Description: This report discusses the performance of silicon germanium, wideband gain amplifiers under extreme temperatures. The investigated devices include Texas Instruments THS4304-SP and THS4302 amplifiers. Both chips are manufactured using the BiCom3 process based on silicon germanium technology along with silicon-on-insulator (SOI) buried oxide layers. The THS4304-SP device was chosen because it is a Class V radiation-tolerant (150 kRad, TID silicon), voltage-feedback operational amplifier designed for use in high-speed analog signal applications and is very desirable for NASA missions. It operates with a single 5 V power supply [1]. It comes in a 10-pin ceramic flatpack package, and it provides balanced inputs, low offset voltage and offset current, and high common mode rejection ratio. The fixed-gain THS4302 chip, which comes in a 16-pin leadless package, offers high bandwidth, high slew rate, low noise, and low distortion [2]. Such features have made the amplifier useful in a number of applications such as wideband signal processing, wireless transceivers, intermediate frequency (IF) amplifier, analog-to-digital converter (ADC) preamplifier, digital-to-analog converter (DAC) output buffer, measurement instrumentation, and medical and industrial imaging.
    Keywords: Electronics and Electrical Engineering
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  • 91
    Publication Date: 2019-07-12
    Description: Field effect transistor devices comprising III-V semiconductors and organic gate dielectric materials, such dielectric materials as can afford flexibility in device design and fabrication.
    Keywords: Electronics and Electrical Engineering
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  • 92
    Publication Date: 2019-07-12
    Description: In many complex engineered systems, the ability to give an alarm prior to impending critical events is of great importance. These critical events may have varying degrees of severity, and in fact they may occur during normal system operation. In this article, we investigate approximations to theoretically optimal methods of designing alarm systems for the prediction of level-crossings by a zero-mean stationary linear dynamic system driven by Gaussian noise. An optimal alarm system is designed to elicit the fewest false alarms for a fixed detection probability. This work introduces the use of Kalman filtering in tandem with the optimal level-crossing problem. It is shown that there is a negligible loss in overall accuracy when using approximations to the theoretically optimal predictor, at the advantage of greatly reduced computational complexity. I
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN899
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  • 93
    Publication Date: 2019-07-12
    Description: SiGe HBT heavy ion-induced current transients are measured using Sandia National Laboratories microbeam and high- and low-energy broadbeam sources at the Grand Accelerateur National d'Ions Lourds and the University of Jyvaskyla. The data were captured using a custom broadband IC package and real-time digital phosphor oscilloscopes with at least 16 GHz of analog bandwidth. These data provide detailed insight into the effects of ion strike location, range, and LET.
    Keywords: Electronics and Electrical Engineering
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  • 94
    Publication Date: 2019-07-12
    Description: An analog electronic camera that is part of a metrology system measures the varying direction to a light-emitting diode that serves as a bright point target. In the original application for which the camera was developed, the metrological system is used to determine the varying relative positions of radiating elements of an airborne synthetic aperture-radar (SAR) antenna as the airplane flexes during flight; precise knowledge of the relative positions as a function of time is needed for processing SAR readings. It has been common metrology system practice to measure the varying direction to a bright target by use of an electronic camera of the charge-coupled-device or active-pixel-sensor type. A major disadvantage of this practice arises from the necessity of reading out and digitizing the outputs from a large number of pixels and processing the resulting digital values in a computer to determine the centroid of a target: Because of the time taken by the readout, digitization, and computation, the update rate is limited to tens of hertz. In contrast, the analog nature of the present camera makes it possible to achieve an update rate of hundreds of hertz, and no computer is needed to determine the centroid. The camera is based on a position-sensitive detector (PSD), which is a rectangular photodiode with output contacts at opposite ends. PSDs are usually used in triangulation for measuring small distances. PSDs are manufactured in both one- and two-dimensional versions. Because it is very difficult to calibrate two-dimensional PSDs accurately, the focal-plane sensors used in this camera are two orthogonally mounted one-dimensional PSDs.
    Keywords: Electronics and Electrical Engineering
    Type: NPO-41466 , NASA Tech Briefs, May 2009; 28-29
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  • 95
    Publication Date: 2019-07-13
    Description: We have demonstrated electrostatic switching in vertically oriented nanotubes or nanofibers, where a nanoprobe was used as the actuating electrode inside an SEM. When the nanoprobe was manipulated to be in close proximity to a single tube, switching voltages between 10 V - 40 V were observed, depending on the geometrical parameters. The turn-on transitions appeared to be much sharper than the turn-off transitions which were limited by the tube-to-probe contact resistances. In many cases, stiction forces at these dimensions were dominant, since the tube appeared stuck to the probe even after the voltage returned to 0 V, suggesting that such structures are promising for nonvolatile memory applications. The stiction effects, to some extent, can be adjusted by engineering the switch geometry appropriately. Nanoscale mechanical measurements were also conducted on the tubes using a custom-built anoindentor inside an SEM, from which preliminary material parameters, such as the elastic modulus, were extracted. The mechanical measurements also revealed that the tubes appear to be well adhered to the substrate. The material parameters gathered from the mechanical measurements were then used in developing an electrostatic model of the switch using a commercially available finite-element simulator. The calculated pull-in voltages appeared to be in agreement to the experimentally obtained switching voltages to first order.
    Keywords: Electronics and Electrical Engineering
    Type: 2009 MRS Spring Meeting & Exhibit; Apr 13, 2009 - Apr 17, 2009; San Francisco, CA; United States
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  • 96
    Publication Date: 2019-07-13
    Description: The areas discussed are still under development: I. Nano structured materials for TE applications a) SiGe and Be.Te; b) Nano particles and nanoshells. II. Quantum technology for optical devices: a) Quantum apertures; b) Smart optical materials; c) Micro spectrometer. III. Bio-template oriented materials: a) Bionanobattery; b) Bio-fuel cells; c) Energetic materials.
    Keywords: Electronics and Electrical Engineering
    Type: LF99-8479 , 16th SPIE International Symposium on Smart Structures and Materials; Mar 09, 2009 - Mar 12, 2009; San Diego, CA; United States
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  • 97
    Publication Date: 2019-07-13
    Description: Automated diagnosis and reconfiguration are important computational techniques that aim to minimize human intervention in autonomous systems. In this paper, we develop novel techniques and models in the context of diagnosis and reconfiguration reasoning using causal Bayesian networks (BNs). We take as starting point a successful diagnostic approach, using a static BN developed for a real-world electrical power system. We discuss in this paper the extension of this diagnostic approach along two dimensions, namely: (i) from a static BN to a dynamic BN; and (ii) from a diagnostic task to a reconfiguration task. More specifically, we discuss the auto-generation of a dynamic Bayesian network from a static Bayesian network. In addition, we discuss subtle, but important, differences between Bayesian networks when used for diagnosis versus reconfiguration. We discuss a novel reconfiguration agent, which models a system causally, including effects of actions through time, using a dynamic Bayesian network. Though the techniques we discuss are general, we demonstrate them in the context of electrical power systems (EPSs) for aircraft and spacecraft. EPSs are vital subsystems on-board aircraft and spacecraft, and many incidents and accidents of these vehicles have been attributed to EPS failures. We discuss a case study that provides initial but promising results for our approach in the setting of electrical power systems.
    Keywords: Electronics and Electrical Engineering
    Type: ARC-E-DAA-TN678 , Twenty-first International Joint Conference on Artificial Intelligence; Jul 13, 2009 - Jul 17, 2009; Pasadena, CA; United States
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  • 98
    Publication Date: 2019-07-13
    Description: This slide presentation reviews packaging challenges and options for electronic parts. The presentation includes information about non-hermetic packages, space challenges for packaging and complex package variations.
    Keywords: Electronics and Electrical Engineering
    Type: Presentation on Military and Aerospace Programmable Logic Devices (MAPLD); Aug 31, 2009; Greenbelt, MD; United States
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  • 99
    Publication Date: 2019-07-13
    Description: Radiation requirements and trends. TID: 1) 〉90% of NASA applications are 〈 100 krads-Si in piecepart requirements. a) Many commercial devices (NVM and SDRAMs) meet or come close to this. b) Charge pump TID tolerance has improved an order magnitude over the last 10 years. 2) There are always a few programs with higher level needs and, of course, defense needs SEL: 1) Prefer none or rates that are considered low risk. a) Latent damage is a bear to deal with. 2) As we re packing cells tighter and even with lower Vdd, we re seeing SEL on commercial devices regularly (〈90nm). a) Often in power conversion, I/O, or control areas. SEU: 1) It s not the bit errors, it s the SEFIs errors that are the biggest issues. a) Scrubbing concerns for risk, power, speed.
    Keywords: Electronics and Electrical Engineering
    Type: Radiation Hardened Electronics Technology (RHET) Meeting; Oct 21, 2009 - Oct 22, 2009; Seattle, WA; United States
    Format: application/pdf
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  • 100
    Publication Date: 2019-07-13
    Description: Emerging and next-generation test instrumentation increasingly relies on network communication to manage complex and dynamic test scenarios, particularly for uninhabited autonomous systems. Adapting wireless communication infrastructure to accommodate challenging testing needs can benefit from reconfigurable radio technology. Frequency agility is one characteristic of reconfigurable radios that to date has seen only limited progress toward programmability. This paper overviews an ongoing project to validate a promising chipset that performs conversion of RF signals directly into digital data for the wireless receiver and, for the transmitter, converts digital data into RF signals. The Software Configurable Multichannel Transceiver (SCMT) enables four transmitters and four receivers in a single unit, programmable for any frequency band between 1 MHz and 6 GHz.
    Keywords: Electronics and Electrical Engineering
    Type: DFRC-964 , DFRC-1075 , International Telemetering Conference (ITC) 2009; Oct 26, 2009 - Oct 29, 2009; Las Vegas, NV; United States
    Format: application/pdf
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