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  • X-ray lasersXFELsbiologystructuredynamics  (2)
  • grazing-incidence small-angle X-ray scatteringGISAXSbeam footprintlithographic inspectiongratings  (2)
  • International Union of Crystallography (IUCr)  (4)
  • American Chemical Society (ACS)
  • Periodicals Archive Online (PAO)
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  • International Union of Crystallography (IUCr)  (4)
  • American Chemical Society (ACS)
  • Periodicals Archive Online (PAO)
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  • 1
    facet.materialart.
    Unbekannt
    International Union of Crystallography (IUCr)
    In: IUCrJ
    Publikationsdatum: 2017-07-01
    Schlagwort(e): X-ray lasersXFELsbiologystructuredynamics
    Digitale ISSN: 2052-2525
    Thema: Geologie und Paläontologie , Physik
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 2
    Publikationsdatum: 2018-06-26
    Beschreibung: An error in the paper by Pflüger, Soltwisch, Probst, Scholze & Krumrey [IUCrJ (2017), 431–438] is corrected.
    Schlagwort(e): grazing-incidence small-angle X-ray scatteringGISAXSbeam footprintlithographic inspectiongratings
    Digitale ISSN: 2052-2525
    Thema: Geologie und Paläontologie , Physik
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 3
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    Unbekannt
    International Union of Crystallography (IUCr)
    In: IUCrJ
    Publikationsdatum: 2017-05-11
    Beschreibung: The development and application of the free-electron X-ray laser (XFEL) to structure and dynamics in biology since its inception in 2009 are reviewed. The research opportunities which result from the ability to outrun most radiation-damage effects are outlined, and some grand challenges are suggested. By avoiding the need to cool samples to minimize damage, the XFEL has permitted atomic resolution imaging of molecular processes on the 100 fs timescale under near-physiological conditions and in the correct thermal bath in which molecular machines operate. Radiation damage, comparisons of XFEL and synchrotron work, single-particle diffraction, fast solution scattering, pump–probe studies on photosensitive proteins, mix-and-inject experiments, caged molecules, pH jump and other reaction-initiation methods, and the study of molecular machines are all discussed. Sample-delivery methods and data-analysis algorithms for the various modes, from serial femtosecond crystallography to fast solution scattering, fluctuation X-ray scattering, mixing jet experiments and single-particle diffraction, are also reviewed.
    Schlagwort(e): X-ray lasersXFELsbiologystructuredynamics
    Digitale ISSN: 2052-2525
    Thema: Geologie und Paläontologie , Physik
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
  • 4
    Publikationsdatum: 2017-05-25
    Beschreibung: Grazing-incidence small-angle X-ray scattering (GISAXS) is often used as a versatile tool for the contactless and destruction-free investigation of nanostructured surfaces. However, due to the shallow incidence angles, the footprint of the X-ray beam is significantly elongated, limiting GISAXS to samples with typical target lengths of several millimetres. For many potential applications, the production of large target areas is impractical, and the targets are surrounded by structured areas. Because the beam footprint is larger than the targets, the surrounding structures contribute parasitic scattering, burying the target signal. In this paper, GISAXS measurements of isolated as well as surrounded grating targets in Si substrates with line lengths from 50 µm down to 4 µm are presented. For the isolated grating targets, the changes in the scattering patterns due to the reduced target length are explained. For the surrounded grating targets, the scattering signal of a 15 µm × 15 µm target grating structure is separated from the scattering signal of 100 µm × 100 µm nanostructured surroundings by producing the target with a different orientation with respect to the predominant direction of the surrounding structures. As virtually all lithographically produced nanostructures have a predominant direction, the described technique allows GISAXS to be applied in a range of applications, e.g. for characterization of metrology fields in the semiconductor industry, where up to now it has been considered impossible to use this method due to the large beam footprint.
    Schlagwort(e): grazing-incidence small-angle X-ray scatteringGISAXSbeam footprintlithographic inspectiongratings
    Digitale ISSN: 2052-2525
    Thema: Geologie und Paläontologie , Physik
    Standort Signatur Erwartet Verfügbarkeit
    BibTip Andere fanden auch interessant ...
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