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  • Springer  (599,967)
  • International Union of Crystallography (IUCr)
  • 2010-2014  (453,169)
  • 1965-1969  (149,566)
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  • 1
    Electronic Resource
    Electronic Resource
    A test object and criteria for high resolution electron microscopy (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 1-19 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The desirability and requirements for a specimen capable of testing the resolving power and other image characteristics of an electron microscope are discussed in detail. In this discussion, the underlying diffraction phenomena are particularly utilized. A partially graphitized carbon black is shown to satisfy the requirements extremely well and constitutes an easily prepared specimen for conducting tests of image quality in the molecular size range. The structure of the test object is known in detail with the result that readily interpretable phase contrast images are obtained. Micrographs illustrating the use of the 3.4 Å (002) spacing for magnification calibration, astigmatism and asymmetry check as well as resolving power are exhibited. The second order c-spacing of 1.7 Å is occasionally found in an image. The micrographs shown herein were taken with two different electron microscopes by different operators obtaining the same structural detail in the images. It is concluded that the carbon black test object offers the best possibilities for evaluating image performance of any specimen yet suggested.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868004930
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  • 2
    Electronic Resource
    Electronic Resource
    A point-focusing camera for single-crystal diffraction (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 84-90 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Bent-glass mirrors can be used to produce a narrow, highly collimated X-ray beam, particularly suitable for photographing diffraction patterns from crystals with very large unit cells (i.e., several hundred Å to a side). A camera is described that employs double-mirror focusing optics with a precession apparatus. A comparison of optical reflection and simple collimation shows that for high resolving power, focusing devices are very much superior to pinhole collimators. The reduction of background is especially noteworthy. Use of this camera has permitted the collection of accurate three-dimensional data from crystals of tomato bushy stunt virus.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005054
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  • 3
    Electronic Resource
    Electronic Resource
    Determination of polarization factor of crystal monochromators (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 121-122 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new method for determination of the polarization factor of a crystal monochromator is presented. This method is based on the use of polarized X-rays produced by anomalous transmission or the Borrmann effect. The polarization factors of two quartz (10\overline 11) monochromators of Johansson type have been measured with Cu Kα radiation, and the resulting values are in close agreement with the expression derived from the kinematic diffraction theory.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005121
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  • 4
    Electronic Resource
    Electronic Resource
    Single-crystal alignment with a polaroid adapter for the Weissenberg goniometer (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 126-128 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An adapter which supports a Polaroid flat-plate film holder has been designed for a standard Weissenberg goniometer. A number of applications, including a method for rapidly aligning single crystals, are described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005157
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  • 5
    Electronic Resource
    Electronic Resource
    The analysis of epitaxic growth layers of silicon carbide by X-ray diffraction topography (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 145-153 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The use of X-ray diffraction topography to identify domains of different polytype in crystals of silicon carbide has been described in a previous paper. Further methods have been developed and applied to the analysis of thin films deposited epitaxically from the vapour phase onto basal surfaces of crystals of hexagonal α-SiC. The epitaxic films consist either of α-SiC, or of the cubic form β-SiC, with multiple twinning about the axis normal to the surface. The fine scale texture of interlocking twin domains is readily demonstrated in X-ray diffraction topographs.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005200
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  • 6
    Electronic Resource
    Electronic Resource
    X-ray diffraction contrast of inversion twin boundaries in BeO crystals (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 165-171 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Inversion twin boundaries in BeO crystals (wurtzite structure) can be studied by X-ray topography. They can be regarded as a special kind of stacking fault. The section topograph images of a twin boundary, lying parallel to the c axis, agree well with the theory for a single stacking fault. From the contrast variation of the images for various reflections, it is concluded that the oxygen sublattice on one side of the twin boundary is displaced from that on the other side by \mid(1/16)[001]\mid so that the oxygen layer parallel to the basal plane on one side is located at the center of the oxygen and beryllium layers on the other side. The image contrast in section topographs is very sensitive to the phase shift due to a fault. The phase shift of a few degrees can be detected easily. This sensitivity leads to an accurate structure determination of the inversion twin boundary.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005224
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  • 7
    Electronic Resource
    Electronic Resource
    Mise en évidence de la dispersion anormale par mesure de l'indice d'un prisme à l'aide de la double diffraction des rayons X (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 181-184 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The refractive index, n, for X-rays is measured by interposing a prism in the path of X-rays falling on a perfect silicon crystal at the Bragg incidence angle. Owing to the deviation angle of the prism, the separation of the two wave fields excited in the silicon crystal is modified, from which the value of n − 1 can be deduced with a 1% accuracy. The method has been applied to the measurement of the anomalous dispersion correction for the refractive index of zirconium for Mo Kα.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005261
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  • 8
    Electronic Resource
    Electronic Resource
    The variation of the lattice parameter of the solid solutions of lithium oxide in nickel oxide (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 187-189 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method based on the variation of the lattice parameter with Li content, for the quantitative determination of lithium in the system Lix+Ni1−2x2+Nix3+O2−, is proposed. A precision between 1 and 5% relative, depending upon the concentration range, has been obtained. The results are compared with those obtained by flame emission spectroscopy. For values of x 〉 0.12 the original rhombohedral lattice transforms into a face centred cubic lattice.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005285
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  • 9
    Electronic Resource
    Electronic Resource
    Stereology. Proceedings of the Second International Congress for Stereology, Chicago, April 8-13, 1967 edited by H. Elias (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 198-198 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005339
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  • 10
    Electronic Resource
    Electronic Resource
    Strain inhomogeneities in lightly compressed tungsten crystals (1968)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 1 (1968), S. 139-145 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A study of strain inhomogeneities in a zone-refined tungsten crystal oriented for (123) slip was carried out before and after a slight compression. The study was based on changes of interplanar spacings measured along different crystallographic directions and samples from different areas of the crystal by means of the X-ray back-reflection divergent beam method. Upon compression a redistribution of the locked-in elastic strains took place and the induced strains assumed a more homogeneous distribution for one of the sets of (123) planes considered. This homogeneity in the strain distribution along definite crystallographic directions is believed to result from the interaction of the primary slip dislocations with the pre-existing dislocation configuration and appears to be characteristic of the initial stage of work-hardening. The dislocation interaction induced by a small strain found practical application in the elimination of a troublesome substructure in highly zone-refined tungsten crystals and appears to form the scientific basis of certain stress-relief treatments long practised in metallurgical technology.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889868005194
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