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  • Chemical Engineering  (4,125)
  • Engineering  (2,531)
  • 1985-1989  (6,073)
  • 1955-1959  (583)
Collection
Keywords
Publisher
Years
Year
  • 11
    Electronic Resource
    Electronic Resource
    Masthead (1989)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660020101
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  • 12
    Electronic Resource
    Electronic Resource
    Characterization of wire-grids for filters in circular waveguides at millimetre wavelengths (1989)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 1-15 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: In order to develop a new kind of filter that makes a compromise between quasi-optical and more traditional bandpass filtering techniques at millimetre wavelengths, a theoretical modelling of grids in oversize and monomodal waveguides is performed using a variational method.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660020102
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  • 13
    Electronic Resource
    Electronic Resource
    Fourier approach to semiconductor device modelling (1989)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 31-52 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A novel procedure for the numerical modelling of current transport in semiconductor devices is presented. The method is based on high-order trigonometric expansions (Fourier series) of the solution. The expansion coefficients are calculated in a Galerkin-type algorithm. The method offers infinite-order accuracy regardless of the number of spatial dimensions of the model. Well-conditioning and diagonal dominance of the discrete equations render the numerical procedure stable and effective. Significant advantages are expected, particularly for the solution of strongly non-linear multidimensional device models. Properties of the algorithm are demonstrated on standard semiconductor devices.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660020104
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  • 14
    Electronic Resource
    Electronic Resource
    Coupling between electromagnetic fields and multimode transmission systems using TLMInvited Paper. (1989)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 227-240 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The coupling between incident electromagnetic fields and lossless, multimode, multiconductor, transmission systems is studied using transmission-line modelling (TLM). Model predictions compared well with experimental multimode results. The model presented is suitable for studying electromagnetic compatibility problems in the time-domain.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660020406
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  • 15
    Electronic Resource
    Electronic Resource
    Announcement (1989)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 280-280 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660020411
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  • 16
    Electronic Resource
    Electronic Resource
    Two-dimensional numerical simulation of short-gate-length gaAs MESFETs and application to the travelling gunn domain phenomenon (1988)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 19-30 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The Boltzmann transport equation is used to derive a set of conservation equations which is capable of describing the electron transport phenomena in a single-valley semiconductor. These conservation equations are averaged over the different valleys of the conduction band to develop another set of equations that can be used to describe accurately the electron transport phenomena in a multi-valley semiconductor, such as GaAs, using the equivalent single-electron gas model whose characteristics are the average weighted characteristics of the constituent gases. The nonstationary effects are included by using energy dependent mobility and electron temperature functions. This program is used to simulate a GaAs MESFET with a 0·5 μm gate length and a 0.2 μm thick active layer. The active layer is doped at 1017 cm-3. A travelling Gunn domain is observed between the gate and the drain. The domain oscillation frequency is much higher than the normal operating frequency of the MESFET. The domain formation's dependence on the gate bias and the active layer thickness are also presented.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660010105
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  • 17
    Electronic Resource
    Electronic Resource
    Masthead (1988)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988) 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660010201
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  • 18
    Electronic Resource
    Electronic Resource
    Application of the symmetrized transmission-line matrix method to the cold modelling of magnetrons (1988)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 61-70 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Two- and three-dimensional electromagnetic resonance calculations have been performed on rising-sun magnetron structures. These calculations have been made using the transmission-line matrix method. Cylindrical coordinates have been used in order to facilitate modelling of the essentially cylindrical device. Recent improvements to the TLM technique, such as the development of the symmetric condensed node for electromagnetics, have been fully exploited. The numerical procedure is described, the modelling process is discussed, and the results obtained are evaluated in comparisons with corresponding empirical data.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660010108
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  • 19
    Electronic Resource
    Electronic Resource
    Characterization of coupled finlines by generalized transverse resonance method (1988)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 45-59 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The conventional transverse resonance method, which has been widely used for the approximate characterization of a number of guiding structures and leaky wave antennas, is formulated in a generalized form. The transverse resonance viewpoint combined with the generalized matrix representation of discontinuities yields a rigorous transverse equivalent circuit of the guiding structure.This technique is used to compute the characteristics of both symmetrical and asymmetrical double slot unilateral finlines in terms of phase constant and characteristic impedance of the dominant as well as higher-order modes. Numerical aspects of this method are discussed.In a double-slot finline structure, a coupled-mode regime is established with the onset of the first higher-order mode in addition to the dominant quasi-TEM mode. Symmetrical structures are simply modelled in terms of even and odd mode characteristics, but a more general coupled-line model, in terms of the C-mode and the II-mode must be applied to asymmetrical coupled finlines.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660010107
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  • 20
    Electronic Resource
    Electronic Resource
    Peter Bruce Johns 1938-1988 (1988)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 1 (1988), S. 71-72 
    Details
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jnm.1660010202
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