Publikationsdatum:
1989-02-01
Beschreibung:
The Bloch-wave method for reflection diffraction problems, primarily electron diffraction as in reflection high-energy electron diffraction (RHEED) and reflection electron microscopy (REM), is developed. The basic Bloch-wave approach for surfaces is reviewed, introducing the current flow concept which plays a major role both in understanding reflection diffraction and determining the allowed Bloch waves. This is followed by a brief description of the numerical methods for obtaining the results including specific results for GaAs near to the [010] zone axis. A number of other Bloch-wave phenomena are also discussed, namely resonance diffraction and its relationship to internal and external reflection and variations in the boundary conditions and Bloch-wave character, splitting of diffraction spots due to stepped surfaces, which can be completely explained, and the reflection equivalent of thickness fringes.
Print ISSN:
0108-7673
Digitale ISSN:
2053-2733
Thema:
Chemie und Pharmazie
,
Geologie und Paläontologie
,
Physik
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