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  • Articles  (5)
  • scattering  (5)
  • 2010-2014
  • 1980-1984  (5)
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  • Electrical Engineering, Measurement and Control Technology  (5)
  • Architecture, Civil Engineering, Surveying
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  • Articles  (5)
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  • Electrical Engineering, Measurement and Control Technology  (5)
  • Architecture, Civil Engineering, Surveying
  • Mathematics  (6)
  • Physics  (1)
  • Biology  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Numerical modelling of the scattering of elastic waves in plates (1984)
    Springer
    Journal of nondestructive evaluation 4 (1984), S. 89-106 
    Details
    ISSN: 1573-4862
    Keywords: scattering ; elastic waves ; Lamb waves ; shear waves ; finite difference methods ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract This paper describes the application of finite difference methods to the calculation of the scattering of elastic waves. The emphasis is on cracklike defects in plates, and it is shown that a common numerical technique can span a range of wavelengths from Lamb waves to ultrasonic waves with many reflections from the surfaces of the plate. Quantitative results are given for the scattering of Lamb waves and ultrasonic shear waves from surface-breaking cracks.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00566400
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Defect identification and sizing by the ultrasonic satellite-pulse technique (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 263-276 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; scattering ; diffraction ; defect characterization ; cracks ; voids ; pattern recognition ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Shape and size are the most important defect characteristics that need to be determined for the reliable prediction of the remaining service lifetime of a defective structure or part. The analytical and supporting experimental results presented in this paper concern a general, pattern recognition-based, ultrasonic defect identification and sizing method. The satellite-pulse technique (SPT) is based on the interpretation, in terms of defect types (shapes) and dimensions, of the separation in time of arrival between the readily detected specularly reflected pulse and its generally ignored tip-diffracted or tangentially scattered “satellite” contained in the received waveform. Calibration procedures were also developed that enable the ultrasonic examiner to read the time scale of the oscilloscope for equivalent crack depth or void diameter as appropriate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571807
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  • 3
    Electronic Resource
    Electronic Resource
    Effects of sinusoidal crack-face perturbations on scattering of elastic waves (1981)
    Springer
    Journal of nondestructive evaluation 2 (1981), S. 153-159 
    Details
    ISSN: 1573-4862
    Keywords: ultrasonics ; scattering ; cracks ; periodic surface perturbation ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The scattering of a plane longitudinal wave from a two-dimensional crack, with a sinusoidal surface perturbation whose amplitude and wavelength are much smaller than the length of the crack, is investigated. The amplitude of the cylindrical body waves in the far field are calculated from a Kirchhoff approximation that utilizes the solution to the reflection from the sinusoidal surface profile of a semiinfinite solid. The results are compared to those for a flat crack, and conditions for significant differences of the amplitude as a function of the angle of observation are discussed. Characteristic changes in the scattered field produced by profiles with different amplitudes and periods are explained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00570727
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  • 4
    Electronic Resource
    Electronic Resource
    Defect characterization in the short-wavelength regime (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 235-247 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; acoustic waves ; scattering ; diffraction ; defect characterization ; silicon nitride ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The scattering of acoustic waves by different types of spherical defects in a silicon nitride matrix is calculated by using Ying and Truell's scattering theory. The theoretical scattering results are interpreted using a ray tracing approach. Experiments were carried out at a high frequency (150–450 MHz) to characterize defects in silicon nitride. Time and space averaging, Wiener filtering, diffraction, and propagation loss corrections were used to remove the effect of the transducer response and propagation loss in the material from the scattered signal. Our experimental results indicate the presence of a new type of defect in silicon nitride. They give the type and size of voids, cracks, and Si inclusions in good agreement with measurements obtained after sectioning.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571805
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  • 5
    Electronic Resource
    Electronic Resource
    Ultrasonic evaluation of geometrical and surface parameters of rough defects in solids (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 249-261 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; cracks ; surface roughness ; diffraction ; scattering ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Ultrasonic measurements from rough cracks were carried out using both broad-band and narrow-band methods. An analysis is suggested to determine parameters of the crack quantitatively such as size, shape, rms surface roughness, and distribution function of the surface roughness. Ultrasonic measurements of the parameters compare very well with the actual parameters of the defect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571806
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