ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Articles  (5)
  • diffraction  (5)
  • 2010-2014
  • 1980-1984  (5)
  • 1975-1979
  • 1950-1954
  • Electrical Engineering, Measurement and Control Technology  (5)
  • Architecture, Civil Engineering, Surveying
Collection
  • Articles  (5)
Source
Keywords
Publisher
Years
Year
Topic
  • 1
    Electronic Resource
    Electronic Resource
    Defect identification and sizing by the ultrasonic satellite-pulse technique (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 263-276 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; scattering ; diffraction ; defect characterization ; cracks ; voids ; pattern recognition ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Shape and size are the most important defect characteristics that need to be determined for the reliable prediction of the remaining service lifetime of a defective structure or part. The analytical and supporting experimental results presented in this paper concern a general, pattern recognition-based, ultrasonic defect identification and sizing method. The satellite-pulse technique (SPT) is based on the interpretation, in terms of defect types (shapes) and dimensions, of the separation in time of arrival between the readily detected specularly reflected pulse and its generally ignored tip-diffracted or tangentially scattered “satellite” contained in the received waveform. Calibration procedures were also developed that enable the ultrasonic examiner to read the time scale of the oscilloscope for equivalent crack depth or void diameter as appropriate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571807
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Elastic wave diffraction by elliptical cracks: Theory and experiment (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 87-99 
    Details
    ISSN: 1573-4862
    Keywords: ultrasonics ; diffraction ; cracks ; titanium ; spectrum analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Analytical solutions to the diffraction of elastic waves by elliptical cracks in titanium are compared with experimental results. The analysis is based on physical elastodynamic theory and is valid forka≫1 and in the far field. A digitized ultrasonic spectrum analysis system is used to measure the frequency components of broadband waves diffracted from elliptical cracks with aspect ratios (ratio of major to minor axes) ranging from 1 to 8. The amplitude spectra show good agreement between experiment and theory.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00566117
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Defect characterization in the short-wavelength regime (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 235-247 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; acoustic waves ; scattering ; diffraction ; defect characterization ; silicon nitride ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The scattering of acoustic waves by different types of spherical defects in a silicon nitride matrix is calculated by using Ying and Truell's scattering theory. The theoretical scattering results are interpreted using a ray tracing approach. Experiments were carried out at a high frequency (150–450 MHz) to characterize defects in silicon nitride. Time and space averaging, Wiener filtering, diffraction, and propagation loss corrections were used to remove the effect of the transducer response and propagation loss in the material from the scattered signal. Our experimental results indicate the presence of a new type of defect in silicon nitride. They give the type and size of voids, cracks, and Si inclusions in good agreement with measurements obtained after sectioning.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571805
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    SOL-X: An on-line nondestructive method for measuring grain size with x-rays (1981)
    Springer
    Journal of nondestructive evaluation 2 (1981), S. 133-138 
    Details
    ISSN: 1573-4862
    Keywords: X-rays ; diffraction ; grain size determination ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract It is shown that the grain size of commercial materials can be estimated by x-rays with little or no sample preparation. The method is readily automated and can be employed on-line, for example, in a rolling mill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00566311
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Ultrasonic evaluation of geometrical and surface parameters of rough defects in solids (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 249-261 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; cracks ; surface roughness ; diffraction ; scattering ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Ultrasonic measurements from rough cracks were carried out using both broad-band and narrow-band methods. An analysis is suggested to determine parameters of the crack quantitatively such as size, shape, rms surface roughness, and distribution function of the surface roughness. Ultrasonic measurements of the parameters compare very well with the actual parameters of the defect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571806
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...