ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Articles  (5)
  • Ultrasonics  (5)
  • 2010-2014
  • 1980-1984  (5)
  • 1975-1979
  • 1950-1954
  • Electrical Engineering, Measurement and Control Technology  (5)
  • Architecture, Civil Engineering, Surveying
Collection
  • Articles  (5)
Source
Keywords
Publisher
Years
Year
Topic
  • 1
    Electronic Resource
    Electronic Resource
    Stress-wave attenuation in thin structures by ultrasonic through-transmission (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 277-286 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; through-transmission ; composite materials ; attenuation ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The steady-state amplitude of the output of an ultrasonic through-transmission measurement is analyzed and the result is given in closed form. Provided that the product of the input and output transduction ratios, the specimen-transducer reflection coefficient, the specimen-transducer phase-shift parameter, and the material phase velocity are known, this analysis gives a means for determining the through-thickness attenuation of an individual thin sample. Multiple stress-wave reflections are taken into account, and so signal echoes do not represent a difficulty. An example is presented for a graphite fiber epoxy composite (Hercules AS/3501-6). Thus, the technique provides a direct method for continuous or intermittent monitoring of through-thickness attenuation of plate structures which may be subject to service structural degradation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571808
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Defect identification and sizing by the ultrasonic satellite-pulse technique (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 263-276 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; scattering ; diffraction ; defect characterization ; cracks ; voids ; pattern recognition ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Shape and size are the most important defect characteristics that need to be determined for the reliable prediction of the remaining service lifetime of a defective structure or part. The analytical and supporting experimental results presented in this paper concern a general, pattern recognition-based, ultrasonic defect identification and sizing method. The satellite-pulse technique (SPT) is based on the interpretation, in terms of defect types (shapes) and dimensions, of the separation in time of arrival between the readily detected specularly reflected pulse and its generally ignored tip-diffracted or tangentially scattered “satellite” contained in the received waveform. Calibration procedures were also developed that enable the ultrasonic examiner to read the time scale of the oscilloscope for equivalent crack depth or void diameter as appropriate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571807
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Defect characterization in the short-wavelength regime (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 235-247 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; acoustic waves ; scattering ; diffraction ; defect characterization ; silicon nitride ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The scattering of acoustic waves by different types of spherical defects in a silicon nitride matrix is calculated by using Ying and Truell's scattering theory. The theoretical scattering results are interpreted using a ray tracing approach. Experiments were carried out at a high frequency (150–450 MHz) to characterize defects in silicon nitride. Time and space averaging, Wiener filtering, diffraction, and propagation loss corrections were used to remove the effect of the transducer response and propagation loss in the material from the scattered signal. Our experimental results indicate the presence of a new type of defect in silicon nitride. They give the type and size of voids, cracks, and Si inclusions in good agreement with measurements obtained after sectioning.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571805
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Quantitative characterization of flaws near a surface using inverse born approximation (1982)
    Springer
    Journal of nondestructive evaluation 3 (1982), S. 183-188 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; Born inversion ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Quantitative reconstruction of volumetric flaws near a surface of an elastic solid has been carried out experimentally by analyzing the scattered ultrasonic waves. The inverse Born approximation (developed for flaws in bulk materials) was tested for the first time in the determination of the size, shape, and orientation of near-surface flaws. We have studied spherical solid inclusions at various depths below the surface. In addition we examined an approximately 2:1 prolate spheroidal inclusion which was located one major axis below the surface. The determination of the flaw's size, shape, and orientation in terms of an equivalent ellipsoid is realized by performing nonlinear least-squares iteration of the one-dimensional Born inversion results obtained at various scattering directions within a finite aperture. The reconstruction is in good agreement with the actual parameters of the flaw.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00565863
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Ultrasonic evaluation of geometrical and surface parameters of rough defects in solids (1980)
    Springer
    Journal of nondestructive evaluation 1 (1980), S. 249-261 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; cracks ; surface roughness ; diffraction ; scattering ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Ultrasonic measurements from rough cracks were carried out using both broad-band and narrow-band methods. An analysis is suggested to determine parameters of the crack quantitatively such as size, shape, rms surface roughness, and distribution function of the surface roughness. Ultrasonic measurements of the parameters compare very well with the actual parameters of the defect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00571806
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...