Publication Date:
2013-02-16
Description:
Author(s): C. Rayan Serrao, Jian Liu, J. T. Heron, G. Singh-Bhalla, A. Yadav, S. J. Suresha, R. J. Paull, D. Yi, J.-H. Chu, M. Trassin, A. Vishwanath, E. Arenholz, C. Frontera, J. Železný, T. Jungwirth, X. Marti, and R. Ramesh High-quality epitaxial thin films of J eff = 1/2 Mott insulator Sr 2 IrO 4 with increasing in-plane tensile strain have been grown on top of SrTiO 3 (001) substrates. Increasing the in-plane tensile strain up to ∼0.3% was observed to drop the c / a tetragonality by 1.2%. X-ray absorption spectroscopy detect... [Phys. Rev. B 87, 085121] Published Fri Feb 15, 2013
Keywords:
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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