Publikationsdatum:
2016-08-06
Beschreibung:
Author(s): N. F. Quackenbush, H. Paik, M. J. Wahila, S. Sallis, M. E. Holtz, X. Huang, A. Ganose, B. J. Morgan, D. O. Scanlon, Y. Gu, F. Xue, L.-Q. Chen, G. E. Sterbinsky, C. Schlueter, T.-L. Lee, J. C. Woicik, J.-H. Guo, J. D. Brock, D. A. Muller, D. A. Arena, D. G. Schlom, and L. F. J. Piper Tensile strain along the c R axis in epitaxial VO 2 films raises the temperature of the metal insulator transition and is expected to stabilize the intermediate monoclinic M2 phase. We employ surface-sensitive x-ray spectroscopy to distinguish from the TiO 2 substrate and identify the phases of VO 2 as … [Phys. Rev. B 94, 085105] Published Fri Aug 05, 2016
Schlagwort(e):
Electronic structure and strongly correlated systems
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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