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  • 1
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 736-745 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new routine has been developed for fitting multiple isomorphous replacement (MIR) maps. The map is first thinned and reduced to a series of `traces'. Each trace consists of a main trace of defined length and a series of branching side traces. Using this trace representation, the entire map can be viewed at one time and the major secondary structural features can be recognized. A number of features have been built into the routine for editing these traces, allowing neighboring traces to be connected and incorrect connections to be broken. After the traces have been edited, a polyserine fit is generated. The traces are used to guide the initial positioning of a short polyserine segment. This segment is then refined using a real-space molecular-dynamics procedure, which uses the gradient of the electron density as a pseudoforce on the polyserine atoms. After the structure of this initial polyserine has been refined, another serine is added at one end, a short period (about 10 s on a personal Silicon Graphics IRIS workstation) of molecular dynamics is applied and the procedure is repeated. The final refined structure depends only on the electron density and is independent of the thinned traces. The routine is illustrated with two examples. One example uses the 3.0 Å map generated directly from a model protein. This allows direct comparison between the polyserine fit and the model that was used to generate the map. The second example uses the experimental MIR map for lipovitellin. This is a very large protein (about 1300 amino acids), which has a poor-quality map that has not yet been refined. The program makes extensive use of Silicon Graphics graphical (GL) routines.
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  • 2
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 752-752 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
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  • 3
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 752-752 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The practical usefulness of the expressions for the half-width proposed in paper I [Rossmanith (1993). J. Appl. Cryst. 26, 753–755] are demonstrated for three examples: a spherical YIG (yttrium iron garnet) crystal, a spherical silicon crystal and a plane-parallel perfect silicon plate. The new concept for the calculation of the width results in theoretical widths that are in excellent agreement with experimental widths observed in parallel and antiparallel arrangements of the sample with respect to the second monochromator crystal.
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  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 795-800 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An algorithm has been developed for the automatic interpretation of a given set of observed reciprocal-lattice points. It extracts a reduced cell and assigns indices to each reflection by a graph-theoretical implementation of the local indexing method. All possible symmetries of the observed lattice compatible with the metric of the reduced cell are recognized and reported, together with the unit-cell constants and the linear index transformation relating the conventional to the reduced cell. This algorithm has been incorporated into the program XDS [Kabsch (1988). J. Appl. Cryst. 21, 916–924], which is now able to process single-crystal area-detector data without prior knowledge of the symmetry and the unit-cell constants.
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 787-794 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A direct (i.e. noniterative) method for desmearing the beam-height effect in small-angle X-ray scattering is discussed. The method is applicable to rectangular collimation systems with arbitrary beam-height intensity profiles. The process involves the construction of an upper-triangular matrix of terms containing the resolution information. A straightforward back-substitution process can then be used to determine the ideal pinhole-collimated curve for any experimental curve obtained with the given resolution. The principal advantage of the method lies in its simplicity, which facilitates an examination of the propagation of random errors through the desmearing process. A comparison between the direct method and the iterative approach of Glatter [J. Appl. Cryst. (1974), 7, 147–153] is made to illustrate the efficiency of the technique.
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  • 7
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 812-819 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Perturbations from crystal perfection will result in diffuse X-ray scattering, which can be imaged by topography to yield defect information without the swamping contribution of perfect-crystal scattering. This paper illustrates the importance of the probe shape for obtaining topographic images in this diffuse region not only to aid interpretation but to isolate the contributors to this scattering. The diffuse scattering in the vicinity of the Bragg peaks of GaAs, Si and Ge substrate crystals has been mapped to very high resolution and the diffuse scattering has been imaged by topography. It was found that the majority of the scattering emanates from surface damage and dislocations and not point defects or thermal diffuse scattering (TDS). These latter two components are found to be second-order effects in general and are only just discernable as a very weak background intensity in highly perfect crystals. This topography method is very sensitive to surface damage. This is because the associated diffuse scattering close to a Bragg peak can be used to form an image. Therefore, this relatively intense scattering provides a topograph within a few hours for assessing substrate-surface quality. The sensitivity of the method is illustrated with images of surface defects and dislocations in very perfect semiconductors. A procedure for measuring the diffuse scattering emanating from microdefects is also presented.
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 846-846 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
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  • 9
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 839-842 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Spectroscopic measurements on crystals during X-ray data collection provide additional information on the composition of the crystal and can be used in the interpretation of structural data. This paper describes a portable microspectrophotometer to obtain UV–visible–near-IR spectra from single crystals during X-ray measurements. The instrument consists of a deuterium lamp, optical fibres, a pair of mirror lenses and a monochromator equipped with a photodiode array detector. Spectra can be recorded in short periods of time (a few milliseconds) from a measurement area of 0.10 mm diameter or smaller. The device can be used to monitor spectral changes in crystals during time-resolved X-ray experiments so that the X-ray camera can be triggered at the right moment as determined by the spectrum, thereby eliminating much of the present guesswork from such studies.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 847-848 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
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