ISSN:
1573-0727
Keywords:
CMOS IC
;
I DDQ
;
Current testing
;
IC quality
;
defects
;
fault models
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract Quiescent power supply current (I DDQ ) testing of CMOS integrated circuits is a technique for production quality and reliability improvement, design validation, and failure analysis. It has been used for many years by a few companies and is now receiving wider acceptance as an industry tool. This article begins with a brief history of CMOS ICs to provide perspective on the origin of I DDQ testing. Next, the use of I DDQ testing for IC quality improvement through increased defect and fault detection is described. Then implementation issues are considered, including test pattern generation software, hardware instrumentation, limit setting, IC design guidelines, and defect diagnosis. An extended reference list is provided to help the reader obtain more information on specific aspects.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00135333
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