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  • Articles  (30)
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  • 1985-1989  (30)
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  • 1989  (30)
  • Electrical Engineering, Measurement and Control Technology  (30)
  • 1
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 1-15 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: In order to develop a new kind of filter that makes a compromise between quasi-optical and more traditional bandpass filtering techniques at millimetre wavelengths, a theoretical modelling of grids in oversize and monomodal waveguides is performed using a variational method.
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  • 3
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 31-52 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A novel procedure for the numerical modelling of current transport in semiconductor devices is presented. The method is based on high-order trigonometric expansions (Fourier series) of the solution. The expansion coefficients are calculated in a Galerkin-type algorithm. The method offers infinite-order accuracy regardless of the number of spatial dimensions of the model. Well-conditioning and diagonal dominance of the discrete equations render the numerical procedure stable and effective. Significant advantages are expected, particularly for the solution of strongly non-linear multidimensional device models. Properties of the algorithm are demonstrated on standard semiconductor devices.
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 53-60 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper introduces a simple model for solving a system of first-order rate equations using the TLM numerical method. A general algorithm is developed by setting up a matrix of discrete compartments. The rate constants provide the linkage between each compartment and the neighbouring ones. The method is demonstrated by some examples in which saturation conditions are considered. The TLM solution is compared with analytical solutions and the Rung-Kutta method of solving differential equations.
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  • 5
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 75-80 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A simulation of power transformers following switching operations is presented in which each core section is represented by a non-linear inductance, the differential inductance being determined from the flux density in that section of the core. In analysing the resultant circuit model for the transformer it is shown that the circuit equations have dyadic properties which can be used to give a more efficient numerical solution.
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  • 6
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 93-102 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: An approach, based on the finite element method (FEM), is used for evaluating the electromagnetic field distribution in a class of E-plane metal insert filters, operating in the Ka-band. Artificial boundary conditions are inserted directly in a functional, enabling a solution of the scalar wave equation by finite element method.The scattering parameters of the filter, the electromagnetic field and, therefore, the current distributions on the thin metal inserts are computed. Then, the power dissipated in the metallic septa, which is one of the major limitations for the maximum CW-power that can be handled by these types of filter, is evaluated using a perturbational approach. Finally, the maximum field intensity is determined, allowing an estimate of the maximum peak power that these structures can handle.
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 103-111 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The multigrid technique, which is mainly used in the finite difference method, is applied to the TLM (transmission-line matrix or modeling) procedure. In the multigrid TLM, the field region is covered with sets of regular transmission-line matrices of different mesh sizes. The finer grid pattern, which overlaps the coarser grid, fills the region with high field gradients. Data obtained in the coarser grid are transferred to the finer grid through an interpolation process and used as boundary conditions for the latter. The finer grid data are then transferred back to the coarser one, thus improving the coarse grid values. The method is applied to several diffusion problems and significant improvements in accuracy and efficiency are shown.
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  • 8
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 115-115 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 131-142 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Numerical quadratures encountered in solving integral equations and in finite element analysis often involve singular integrands, or integrands with very rapid local variation whose numerical stability resembles that of singularities. It is shown that specialized quadrature formulae of Gauss-Christoffel type can be generated for such integrands, using a recursive procedure based on the properties of the underlying orthogonal polynomials. Quadrature formulae of moderately high degree can be computed rapidly enough to allow them to be constructed as needed. An algorithm for generating quadrature formulae is given in detail. Singular or near -singular functions encountered in finite element analysis typically require three -point or four -point quadratures; such formulae are readily obtained, to seven -figure accuracy, in computing times short enough to regard the formulae as disposable and not worth preserving in tables.
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  • 10
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 187-188 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 11
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 189-190 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 12
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 191-201 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper presents an overview of the 3D transmission-line matrix method of analysis, describing the various nodes which are available to date: expanded node, asymmetrical condensed node, symmetrical condensed node. The most general scattering matrices of these nodes are given. The various techniques used to implement irregularly graded meshes are also described. A comparison of all the processes applied to the same structure is made. Conclusions on their use are then discussed.
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  • 13
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 215-225 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A new TLM-based concept analogous to the Green's function approach in classical electromagnetic theory is presented. It employs the procedure known as time domain diakoptics. The response of a TLM mesh to a unit impulse excitation at selected input points is interpreted as a discrete Green's function in the time domain, and the term ‘Johns matrix’ is proposed for this characteristic response. As in classical theory, the response of the mesh to an arbitrary excitation is found by convolving the excitation with its Johns matrix. This concept extends the generalized scattering parameter concept into the time dimension, opens unprecedented possibilities for partioning time domain problems at the field level, and permits large-scale preprocessing of substructures for computer-aided design. It also represents and elegant way of modelling broadband absorbing boundary conditions, imperfectly conducting walls and general frequency dispersive boundaries in the time domain.
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  • 14
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 279-279 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 15
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 249-265 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The application of the transmission-line modelling technique to the design of semiconductor lasers and optical systems is reviewed. Generalized scattering matrices are developed to allow the technique to be applied to novel devices and systems.
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  • 16
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 280-280 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 17
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 143-152 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The paper outlines the operating principles of a 3 -phase to single -phase cycloinverter, as used in heating and melting applications, and presents a digital computer model on which performance predictions may be based. Ideal power switches, an input filter and a compensated heating load are assumed in formulating an initial set of state -variable equations which are valid when all the switching devices are conducting. Connection matrix techniques are then used to generate the mesh equations relevant to the continually changing pattern of the switching devices, leading to a very versatile simulation program. Experimental results from a laboratory -scale unit are presented for different output power levels, and these are compared with corresponding computed results to illustrate the close similarity that exists.
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  • 18
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 19
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 153-186 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Rigorous full -wave analysis techniques are presently receiving much attention in the design of MICs and, in particular, of MMICs due to increasing circuit packing densities and structural complexity. In this paper, the problems associated with such techniques and previous related work are briefly outlined in the introduction. To obtain self -consistency, the electrodynamic Green's functions and related terms are then formulated for the shielded (M)MIC problem. The final operator equation for the numerical solutions derived and the associated functions space are presented and discussed. The central portion of the paper describes a new numerical solution using a discretized Green's function database technique. The resulting linear system of equations is solved by direct inversion for geometrical complexities involving up to about 1000 unknowns; for a higher number of unknowns, an iterative solution is generated. As an alternative to the database technique developed, a variety of spectral domain iterative solutions has been written and tested as well. This includes application of the conjugate gradient method to the normal operator equation (CGN algorithm), an implicit iterative Galerkin approximation called the modified planar conjugate gradient technique (MPCG) and monotonically convergent iteration procedure being a version of the conjugate residual algorithm (CR). Supplementary to this, the extraction of (M)MIC design data from the numerical 3D solutions obtained and error considerations are presented. The paper concludes with a variety of analysis examples of medium to high geometrical complexity and with verification of some results by comparison with measurements and with numerical data from other sources.CPU times required on typical workstations (Micro VAX, HP 9000, etc.) are moderate, thus rendering the techniques presented as useful in the solution of MIC and MMIC design problems.
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  • 20
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 227-240 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The coupling between incident electromagnetic fields and lossless, multimode, multiconductor, transmission systems is studied using transmission-line modelling (TLM). Model predictions compared well with experimental multimode results. The model presented is suitable for studying electromagnetic compatibility problems in the time-domain.
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  • 21
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 203-214 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: This paper presents the dispersion characteristics of the FD-TD algorithm by showing the numerical phase and group velocities of the TEM, TE or TM modal solutions. For the TEM wave propagation, there exist three fundamental directions to which phase and group velocities can be expressed by only a single variable (wave number k or frequency ω). Those special directions were chosen to show the dispersive nature of the FD-TD algorithm of which the group and phase velocities depend explicitly on frequencies.In view of similarities between the TLM and FD-TD algorithms, a comparison of phase velocity characteristics of both methods was made. Under the special condition where the stability factor s is larger than 1/2, the FD-TD algorithm is found less dispersive than that of the original TLM. However, newly developed symmetrical TLM method appears less dispersive than the FD-TD algorithm.In the numerical simulation of waveguide modal solutions, it was found that there exists an optimum frequency which provide least numerical error in the FD-TD application. A procedure, which determines the stability factor s and the maximum allowed frequency Fmax for the best numerical results, is proposed in this paper.
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  • 22
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 241-248 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The TLM technique has been enhanced to allow the accurate modelling of EM diffusion through advanced composite material shells. This is a significant development owing to the rapidly increasing use of conducting composite materials in aerospace vehicle design. The accurate EM modelling of this class of materials is important for correct design of vehicles with regard to electromagnetic compatibility (EMC).Existing 3-D time-domain TLM models a non-perfectly conducting shell using a resistive sheet (or sheets) to simulate the surface. The results from this model are shown to be slightly inaccurate and require lengthy computer solution times. A separate 1-D, frequency-domain transmission-line model has been developed elsewhere to better analyse the diffusion properties of composite materials. The incorporation of the results from this frequency domain code into the 3-D time-domain TLM algorithm is outlined.
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  • 23
    Electronic Resource
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 267-278 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The calculation of the radar cross-section (RCS) of complex bodies using the symmetrical condensed TLM method is presented. The technique is based on a near-to-far field transformation of the TLM calculated near fields. Several two-dimensional examples are presented which validate the method. The main advantage of utilizing techniques such as TLM for RCS computation lies in the ability to model arbitrary bodies with complex material compositions.
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  • 24
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 17-29 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The nature and significance of time-domain approximations needed for a diakoptic solution using transmission-line modelling (TLM) are examined. Truncation, filtering and repeated convolution of time responses result in severe restrictions in the accuracy of time-domain diakoptics. The frequency-domain diakoptic method has several advantages, including speed and simplicity, and warrants further study.
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  • 25
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 26
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 81-92 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A de model for short-channel MOSFETs is presented in this paper. Several second-order effects associated with small-geometry MOSFETs such as mobility degradation, carrier velocity saturation and channel length modulation are included in the model. The analysis emphasizes the modeling of the output conductance and the transconductance which are important in analogue circuit simulation. The theoretical predictions of the model are in good agreement with the experimental data available in the literature.
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  • 27
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 61-73 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: A new P-N junction device model is presented. It consists of two numerical unidimensional macroscopic models. The first is a drift-diffusion model. The second is an energy model accounting for the carrier energy relaxation effects. Because device optimization requires systematic investigations, the computing time is of paramount importance and, so an accurate comparison between these two models was undertaken under both static steady-state and dynamic 94 GHz conditions in order to point out the relative interest of the energy model. This study is mainly devoted to silicon millimetre-wave IMPATTs. This comparison has highlighted the superiority of the energy model for the description of low field transport phenomena. But as IMPATT RF properties are mainly governed by high field transport, the RF power levels predicted by the two models have been found to be similar. Moreover it has shown that the energy model tends to underestimate both the efficiency and the diode terminal negative resistance level. This parasitic effect is inherent to the description of the carrier generation process by impact ionization which in this model is assumed to be governed by the carrier energy.
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  • 28
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 113-113 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 29
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989) 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
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  • 30
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    Chichester [u.a.] : Wiley-Blackwell
    International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2 (1989), S. 117-129 
    ISSN: 0894-3370
    Keywords: Engineering ; Electrical and Electronics Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: The response of capacitive array sensors in the presence of flawed solid materials is simulated using finite elements and infinite elements with exponential decay. Conventional finite elements are used to model the critical regions near the probe and the surface of the solid. Infinite elements are used to represent the farfield conditions of the space surrounding the probe and the solid. The method is first applied to problems with analytic solutions to determine the accuracy of the results obtained using the infinite elements. The response of a capacitive array sensor is then simulated using a line integral which measures the relative change in admittance between flawed and unflawed solids. Examples of capacitive probe responses are given for several parametric variations of the flaw size and dielectric constant of the solid.
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