ISSN:
1432-0630
Keywords:
61.70T
;
71.55F
;
72.40
;
78.50
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract Photoionization of the DX center in Si-doped A10.33Ga0.67As has been studied by means of photoconductivity. The optical cross-sectionσ nd 0 shows a threshold atħω=200 meV and relative maxima (shoulders) around 400, 600, 950, and 1700 meV. The results throw doubt on the validity of the large lattice relaxation model, generally accepted for this class of centers. They can be well accounted for by the small relaxation model, recently proposed by the authors.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00616697
Permalink