ISSN:
1573-4862
Keywords:
Kirchhoff approximation
;
crack scattering
;
ultrasonics
;
NDE
;
inverse scattering
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mathematics
Notes:
Abstract The Kirchhoff approximation is used to show that the time domain impulse response of an isolated flat crack can be given a simple geometrical interpretation in terms of the derivative of a projected length function. For an elliptical crack, this derivative can be obtained explicitly to yield the two edge-diffracted waves which originate from the “flashpoints” of the crack. An explicit coordinate invariant expression is obtained from this elliptical crack solution which relates the time difference, Δt, between the arrival of these edge-diffracted waves and the crack size and orientation. Previously, we have proposed that this expression, together with Δt measurements in different scattering directions, could be used in a regression analysis as the basis for performing a constrained inversion of crack scattering data (i.e., where we attempt to obtain the “best” equivalent flat elliptical crack that fits the scattering measurements). Here we will demonstrate some results of applying the proposed algorithm using “noisy” synthetic data. The sensitivity of the results to both, number of measurements and transducer orientation, will be discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00568762
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