ISSN:
1573-0727
Keywords:
Bridging faults
;
diagnosis algorithm
;
I DDQ testing
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract In the absence of information about the layout one is left with no alternative but to consider all bridging faults. An algorithm for diagnosis of a subset of such faults, viz. single two line bridging faults in static CMOS combinational circuits is presented. This algorithm uses results from I DDQ measurement based testing. Unlike known diagnosis algorithms, this algorithm does not use fault dictionaries, it uses only logic simulation and uses no fault simulation. It also uses SOPS, a novel representation of subsets of two-line bridging faults resulting in an efficient algorithm. In spite of the large number of faults that we consider, our experimental results point to the computational feasibility of I DDQ Measurement based diagnosis of single two line bridging faults. It also shows the effectiveness of reducing the set of possible faults using I DDQ measurements.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00135341
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