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  • Articles  (3)
  • REM  (3)
  • Wiley-Blackwell  (3)
  • Annual Reviews
  • Elsevier
  • Springer
  • Wiley
  • 2005-2009
  • 2000-2004
  • 1990-1994  (3)
  • 1980-1984
  • 2008
  • 1992  (3)
  • 1982
  • Natural Sciences in General  (3)
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  • Articles  (3)
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Publisher
  • Wiley-Blackwell  (3)
  • Annual Reviews
  • Elsevier
  • Springer
  • Wiley
Years
  • 2005-2009
  • 2000-2004
  • 1990-1994  (3)
  • 1980-1984
Year
  • 2008
  • 1992  (3)
  • 1982
Topic
  • Natural Sciences in General  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Observation of atomic steps on single crystal surfaces by a commercial scanning electron microscope (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 406-412 
    Details
    ISSN: 1059-910X
    Keywords: REM ; Contrast mechanism ; Imaging technique ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Atomic steps on (111) and (100) crystal surfaces of Pt were observed using a commercial scanning electron microscope (SEM) in secondary electron mode. By comparing the SEM images and those by reflection electron microscopy (REM), the observed contrast was confirmed to be that from atomic steps on crystal surfaces. The contrast mechanism is briefly discussed. One application of this imaging technique is also shown.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200410
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  • 2
    Electronic Resource
    Electronic Resource
    Observation of double line contrast in surface imaging (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 413-425 
    Details
    ISSN: 1059-910X
    Keywords: REM ; RHEED ; Surface resonance condition ; Contrast splitting ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: The double line contrast of a single-atom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200411
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  • 3
    Electronic Resource
    Electronic Resource
    Technique of reflection electron microscopy (1992)
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 20 (1992), S. 318-332 
    Details
    ISSN: 1059-910X
    Keywords: RHEED ; Surface steps ; REM ; Surface defects ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Details of the technique of reflection electron microscopy (REM) are described. Step by step instruction is given on how to do it on an ordinary electron microscope. Also given are some specimen preparation techniques and strategy of REM investigation.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1070200403
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