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  • Articles  (3)
  • flaw detection  (3)
  • Springer  (3)
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  • 2005-2009
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  • Articles  (3)
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  • Springer  (3)
  • American Institute of Physics
  • Cell Press
  • Oxford University Press
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  • 2010-2014
  • 2005-2009
  • 1985-1989  (3)
  • 1945-1949
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  • 2013
  • 2007
  • 2006
  • 2005
  • 1988  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Approximate model of eddy-current probe impedance for surface-breaking flaws (1988)
    Springer
    Journal of nondestructive evaluation 7 (1988), S. 25-34 
    Details
    ISSN: 1573-4862
    Keywords: Eddy current ; nondestructive evaluation ; theoretical model ; flaw detection
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract A theoretical model is derived for the prediction of eddy-current probe impedance changes caused by three-dimensional, surface-breaking flaws. Magnetic scalar potential theory and the surface impedance approximation are used to calculate fields on the flaw surface for arbitrary probe position and flaw geometry. Impedance changes are determined by a first-order perturbation calculation, with skin depth being the perturbation parameter. The end result is a relatively simple, three-dimensional model for simulating an eddy-current inspection. Numerical results for rectangular slots include maps of the impedance signals obtained in raster scan patterns and studies of skin-depth effects as a function of probe size, lift-off, and flaw dimensions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00565774
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    An electromagnetic model for eddy-current imaging (1988)
    Springer
    Journal of nondestructive evaluation 7 (1988), S. 71-77 
    Details
    ISSN: 1573-4862
    Keywords: eddy-current testing ; near-field imaging ; image processing ; point-spread function ; flaw detection ; reciprocity ; nondestructive evaluation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract In this paper, a model is presented for the interaction between an eddy-current probe system and a localized flaw in a test piece. The model is expressed in terms of the electromagnetic fields generated by the probe in the absence of the flaw, which are evaluated on an imaging surface near or on the surface of the test piece. Assuming that the quasistatic fields scattered by the flaw are proportional to immittance coefficients that are independent of the probe position, explicit expressions for the point-spread functions of the probe are derived. Knowledge of these functions permits one to optimize probe design and identify appropriate image-processing techniques. In contrast with optical image processing, it is shown that more than one point-spread function may be required to characterize a flaw image produced by an eddy-current probe.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00565778
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  • 3
    Electronic Resource
    Electronic Resource
    Nondestructive detection of flaws in material using transducer arrays (1987)
    Springer
    Journal of nondestructive evaluation 6 (1987), S. 47-55 
    Details
    ISSN: 1573-4862
    Keywords: Ultrasonics ; transducer array ; flaw detection ; signal processing ; NDE
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract In this paper, we describe a system which uses array filters for processing the recordings of an array of transducers for the purpose of locating possible flaws in the material being tested nondestructively. When applied, in order to focus the array outputs at a point inside the material, these filters are able to attenuate, very effectively, interfering residual energy scattered from adjacent flaws, as well as random noise. If there is a flaw at the point of focus, the summed output of the filters will have a large signal at a delay time corresponding to the total travel time for this point; otherwise the output will consist mainly of residual random noise. Thus, the location of flaws or even microflaws in material may be achieved by simple threshold detection.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00566696
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