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  • Articles  (6,133)
  • Springer Nature  (5,398)
  • International Union of Crystallography (IUCr)  (735)
  • 1965-1969  (6,133)
  • 1950-1954
  • 1945-1949
  • 1935-1939
  • 1969  (6,133)
Collection
  • Articles  (6,133)
Source
Publisher
Years
  • 1965-1969  (6,133)
  • 1950-1954
  • 1945-1949
  • 1935-1939
Year
Journal
Topic
  • 1
    Electronic Resource
    Electronic Resource
    An X-ray method for the determination of domain size from the tails of diffraction profiles (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 72-76 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The paper describes a method for obtaining consistent estimates of domain size from an evaluation of coefficients derived from curves fitted to the tails of diffraction profiles. An estimate of the mean domain size is computed directly from the intensity data and this is equivalent to the value derived from the slope of the variance-range function. For many applications this provides a convenient alternative to the method described by Langford & Wilson (Crystallography and Crystal Perfection. London: Academic Press, 1963) but does not replace it. An advantage of the present method is its simplicity and consequent reduction in computing time. It is easier to apply if a computer is not available and is applicable in cases where one or other of the profile tails overlaps that of a neighbouring line. The results obtained by this method are comparable in accuracy to those given by existing techniques.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188986900656X
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  • 2
    Electronic Resource
    Electronic Resource
    Specimen surface preparation errors in quantitative electron-probe microanalysis (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 18-24 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The usual method of specimen preparation for electron-probe microanalysis can introduce errors of up to about ±3% in the estimates of the amount of an element present. It is believed that these errors are caused by the formation of `flowed' layers on the surfaces of polished samples. Two methods of reducing the errors are described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188986900642X
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  • 3
    Electronic Resource
    Electronic Resource
    The crystal structure of arsenic at 4.2, 78 and 299°K (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 30-36 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The lattice constants and the atomic position parameter, z, of a high purity, low strain, single-crystal of arsenic have been determined. Low extinction reflections of filtered Mo Kα and Ag Kα radiation were used for the determination of z. The Bond precision technique with Mo Kα radiation was used for the determination of the unit-cell dimensions a and c. Average values for a and c in Å, and for z are: 4.2°K z = 0.22764 a = 3.7597 c = 10.4412; 78°K z = 0.22754 a = 3.7595 c = 10.4573; 299±3°K z = 0.22707 a = 3.7598 c = 10.5475. The estimated standard deviation of z is ±0.00004 at 4.2°K, ±0.00002 at 78°K and ±0.00005 at 299°K. The precision of a is estimated to be ±0–0001 Å and that for c to be ±0.0002 Å. The results for As are compared with those reported earlier for Sb and Bi.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006443
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  • 4
    Electronic Resource
    Electronic Resource
    Growth of crystals, Volumes 5A, 5B, 6A and 6B edited by N. N. Sheftal' (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 146-147 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006790
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  • 5
    Electronic Resource
    Electronic Resource
    Strain induced phase transformations in lead monoxide (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 156-164 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The strain induced phase transformations produced in lead monoxide powders by ball milling at temperatures ranging from −196 to 200°C have been studied by X-ray diffraction methods. It has been found that either of the two polymorphs, litharge and massicot, was partially converted to the other at all the temperatures investigated, and that, whichever polymorph was the starting material, the end product, after a sufficiently long time, was a mixture of the two polymorphs, both highly strained. The percentage of each phase present was found to be dependent on the temperature of deformation. The results have been interpreted by consideration of the production of the microstrain energy required to overcome the energy barrier to the transformation, and of the shear generated in the mill on the pressure-temperature phase diagram. It is considered that shear stresses can affect the nature of the pressure-temperature phase diagram, in a manner theoretically postulated by Kumazawa. The commercial importance of the results has been briefly outlined.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006856
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  • 6
    Electronic Resource
    Electronic Resource
    The significance of texture parameters in phase analysis by X-ray diffraction (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 176-180 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The theory of the direct comparison X-ray method of phase analysis is extended to correct for preferred orientation effects. Texture parameters are defined to assess the type and intensity of preferred orientation using data from diffractometer patterns. The analysis is illustrated with results obtained on three austenitic stainless steels.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006881
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  • 7
    Electronic Resource
    Electronic Resource
    Structure Reports for 1958. Vol. 22 edited by W. B. Pearson (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 192-192 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006959
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  • 8
    Electronic Resource
    Electronic Resource
    Synergy of line profile analysis and selected area topography by the X-ray divergent beam method (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 200-209 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A method is presented which combines the analysis of X-ray absorption profiles and selected area X-ray topographs. The method is based on X-ray divergent beam patterns obtained in transmission. The absorption profiles are obtained by unfolding the spectral distribution from the profiles of the deficiency conics, whereas the selected area topographs derive from the corresponding diffraction conics. The synergy of the two techniques makes the method particularly useful for the elucidation of anisotropic effects and inhomogeneities of defect structures. An example is given for the room temperature deformation of beryllium.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869006984
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  • 9
    Electronic Resource
    Electronic Resource
    Développements d'une technique de topographie en réflexion des rayons X (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 223-230 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: An X-ray reflexion topography camera has been designed to study structural defects near the surface of monocrystalline semiconductors. Large surfaces can be covered by means of successive fixed exposures. A surface of 30 mm x 10 mm for example can be studied in less than ten minutes on nuclear emulsions. The conditions for the observations of dislocations in gallium arsenide have been examined: the choice of reflecting planes is limited by the depth of penetration of X-rays, so that the effective crystal thickness must be of the order of the width of a dislocation image (2-5 microns). Studies to which these observations can be applied are numerous: structural defects induced by diffusion, lattice strains, orientation of dislocations near the surface, structural evolution of silicon during integrated circuits elaboration, structure of cleavage surfaces, lapping and polishing defects, structural defects of epitaxic layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869007011
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  • 10
    Electronic Resource
    Electronic Resource
    La Fatigue des Métaux by R. Cazaud (1969)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 2 (1969), S. 234-234 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889869007060
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