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  • Articles  (97,417)
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  • 1
    Electronic Resource
    Electronic Resource
    Rietveld analysis of powder patterns obtained by TOF neutron diffraction using cold neutron sources (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 411-418 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A computer program has been developed for the Rietveld analysis of time-of-flight neutron diffraction data taken on a high-resolution powder diffractometer, HRP, at the pulsed spallation neutron source, KENS. A new profile shape function is implemented which is optimized for a solid-methane moderator at 20 K. The program has several convenient features such as single-pass operation, multiphase capability, automatic successive refinements and constrained minimization. The results of Rietveld refinements of Si and α-Al2O3 show that the profile shape function fits neutron diffraction patterns taken on the HRP very well, and that very precise crystal-structure parameters can be obtained with this program.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086382
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  • 2
    Electronic Resource
    Electronic Resource
    Determination of the crystal symmetry of two Al–Fe–Si phases by convergent-beam electron diffraction (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 425-427 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The crystal symmetries of two precipitate phases, q1-AlFeSi (C-centred orthorhombic) and q2-AlFeSi (monoclinic), which were discovered in a dilute Al–Fe–Si alloy, have been determined with the use of convergent-beam electron diffraction (CBED). The space group of q1-AlFeSi is Cmmm and that of q2-AlFeSi is Pm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086369
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  • 3
    Electronic Resource
    Electronic Resource
    Data averaging with normal down-weighting of outliers (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 427-428 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A simple scheme is described for calculating weighted averages of multiple equivalent measurements using weights based on estimated normal probabilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086357
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  • 4
    Electronic Resource
    Electronic Resource
    An experimental test of an elastically bent silicon crystal as a thermal-neutron monochromator (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 428-430 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The effectiveness of employing an elastically bent perfect Si (111) crystal as a monochromator for neutron-diffraction experiments is demonstrated on rocking curves presented for a flat perfect Si (220) crystal and a mosaic Fe (110) crystal, for two different collimations of the incident beam. For the sake of comparison equivalent rocking curves with a conventional mosaic Zn monochromator are also introduced. The experimental results obtained indicate that curved perfect-crystal monochromators may become a useful alternative to mosaic-crystal ones.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086345
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  • 5
    Electronic Resource
    Electronic Resource
    Recent advances in X-ray characterisation of materials edited by P. Krishna (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 450-450 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086230
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  • 6
    Electronic Resource
    Electronic Resource
    Commission on Powder Diffraction (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 537-537 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887085960
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  • 7
    Electronic Resource
    Electronic Resource
    Standard Crystallographic File Structure-87 (1987)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 20 (1987), S. 537-538 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887086047
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  • 8
    Electronic Resource
    Electronic Resource
    Scattering exponents for polydisperse surface and mass fractals (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 25-27 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Scattering exponents are discussed for systems of power-law polydisperse surface and mass fractals. It is found that the scattering exponent for power-law polydisperse mass fractals lies on the interval [0, d] and always depends on the mass fractal dimension. The scattering exponent for power-law polydisperse surface fractals lies on [0, d + 1] and is independent of the surface fractal dimension for a large range of the polydispersity exponent.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886090052
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  • 9
    Electronic Resource
    Electronic Resource
    A real-time interactive graphics program to determine crystal orientation for the analysis of oscillation diffraction photographs (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 28-33 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: This paper describes a powerful preliminary to various least-squares programs for finding the exact crystal orientation for the oscillation method. It is well suited to cases of large initial misorientation. It uses the real-time rotation and clipping capabilities of the high-performance graphics system PS300 from Evans & Sutherland. A program has been written that performs a geometrical inversion of reciprocal space through its origin and manipulates this transformed image in place of the direct one. The Ewald sphere is thus transformed into a plane that can be superimposed on the film. The crossing of any reciprocal-lattice point through the Ewald sphere is then replaced by the crossing of its transform through the film plane. Clipping allows elimination of all the points too far away from this plane, i.e. those that are not in a diffraction condition. Determination of the correct orientation is achieved by superimposing the inverted reciprocal-lattice image on the corresponding transformed image of the observed film.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886090040
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  • 10
    Electronic Resource
    Electronic Resource
    Systematic errors in precision lattice-parameter determination of single crystals caused by asymmetric line profiles (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 34-38 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The convolution of the various contributions to X-ray intensity distribution curves measured in lattice-parameter determination leads to peak shifts and, hence, to systematic errors in the case that at least one of the contributing curves is asymmetric. For perfect crystals, depending on the collimator divergence, this effect may reach the order of magnitude of the refraction correction. It is caused by the asymmetry of the spectral distribution curve, which includes intrinsic asymmetry, dispersion and angle dependence of intensity (ADI). For imperfect crystals characterized by orientation and interplanar-spacing distributions, the distribution curves should be measured in order to correct accurately the peak shift. Examples of simulation calculations are given for Si, Cu Kα1, Bond method for various reflections of perfect crystals and for crystals having orientation distributions, 444 reflection.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886090039
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