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Electrical control of nanoscale functionalization in graphene by the scanning probe technique (2014)

Ik-Su Byun; Wondong Kim; Danil W Boukhvalov; Inrok Hwang; Jong Wan Son; Gwangtaek Oh; Jin Sik Choi; Duhee Yoon; Hyeonsik Cheong; Jaeyoon Baik; Hyun-Joon Shin; Hung Wei Shiu; Chia-Hao Chen; Young-Woo Son; Bae Ho Park

Springer Nature

In: NPG Asia Materials

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Publication Date: 2014-05-24

Description: Electrical control of nanoscale functionalization in graphene by the scanning probe technique NPG Asia Materials 6, e102 (May 2014). doi:10.1038/am.2014.24 Authors: Ik-Su Byun, Wondong Kim, Danil W Boukhvalov, Inrok Hwang, Jong Wan Son, Gwangtaek Oh, Jin Sik Choi, Duhee Yoon, Hyeonsik Cheong, Jaeyoon Baik, Hyun-Joon Shin, Hung Wei Shiu, Chia-Hao Chen, Young-Woo Son & Bae Ho Park

Keywords: atomic force microscopy lithographygraphenegraphene functionalizationgraphene hydrogenationgraphene oxidationscanning photoelectron microscopeX-ray photoemission spectroscopy

Print ISSN: 1884-4049

Electronic ISSN: 1884-4057

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics

Published by Springer Nature on behalf of The Tokyo Institute of Technology.

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