ISSN:
1573-4862
Keywords:
Eddy currents
;
nondestructive testing
;
inverse methods
;
signal processing
;
Fourier descriptors
;
defect reconstruction
;
defect characterization
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mathematics
Notes:
Abstract Eddy-current methods of nondestructive testing find widespread application in industry. The growth has been fueled, in part at least, by an increasing ability to extract information from the signal generated by the probe. This paper presents a brief overview of some of the techniques proposed for characterizing defects. Emphasis has been placed on two of the techniques developed by the authors, namely, the Fourier descriptor method and the defect reconstruction scheme using the finite-element model.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00565781
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