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  • Books
  • Articles  (3)
  • Other Sources
  • Eddy currents  (3)
  • Springer  (3)
  • Frontiers
  • MDPI Publishing
  • 1985-1989  (3)
  • Electrical Engineering, Measurement and Control Technology  (3)
Collection
  • Books
  • Articles  (3)
  • Other Sources
Publisher
  • Springer  (3)
  • Frontiers
  • MDPI Publishing
Years
  • 1985-1989  (3)
Year
Topic
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of nondestructive evaluation 7 (1988), S. 111-120 
    ISSN: 1573-4862
    Keywords: Eddy currents ; nondestructive testing ; inverse methods ; signal processing ; Fourier descriptors ; defect reconstruction ; defect characterization
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract Eddy-current methods of nondestructive testing find widespread application in industry. The growth has been fueled, in part at least, by an increasing ability to extract information from the signal generated by the probe. This paper presents a brief overview of some of the techniques proposed for characterizing defects. Emphasis has been placed on two of the techniques developed by the authors, namely, the Fourier descriptor method and the defect reconstruction scheme using the finite-element model.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of nondestructive evaluation 5 (1986), S. 109-117 
    ISSN: 1573-4862
    Keywords: Eddy currents ; nondestructive testing ; signal processing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract As a nondestructive testing, eddy currents are largely used by industry. Nevertheless, complete automatization of the devices are still unusual, especially those that are able to make a classification of the different kinds of defects likely to appear in the tested material. We propose a method based on a few simple hypotheses on the shape of the defect and the reaction of the probe which permits the extraction of information sufficient enough for classification. The analysis of the “image” of the defect which is obtained by the scanning of the tested piece involves two steps: (1) an analysis of the orientation and the shape of the defect and (2) the analysis of the relief of this image, which determines the position of significant features. The method has been tested on a given sample of population with a 80% rate of success.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of nondestructive evaluation 5 (1985), S. 9-14 
    ISSN: 1573-4862
    Keywords: Eddy currents ; modeling ; nondestructive testing ; volume integral
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract The volume integral method is proposed as an alternative method for computing the impedance changes associated with eddy current measurements. In this method, the use of an appropriate Green's function for the host medium requires that integration be performed only over the volumes of defects. Although only rather simple host medium geometries are amenable to this type of modeling, the method can be linked to finite element models of more complicated geometries. In this way, the amount of finite element modeling may be minimized.
    Type of Medium: Electronic Resource
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