Publication Date:
2018-06-29
Description:
Author(s): Lorenzo Mino, Elisa Borfecchia, Jaime Segura-Ruiz, Cinzia Giannini, Gema Martinez-Criado, and Carlo Lamberti The Moore’s law trajectory of hard x-ray spatial resolution extrapolates to a few nanometers within the next few years, thereby promising critical space-resolved structural, electronic, and compositional nanoscale characterizations for a wide variety of materials. This review addresses the capabilities and advantages of x-ray microbeam and nanobeam techniques compared to photon, electron, neutron, and ion probes through selected applications including semiconductors, superconductors, metals, and nanostructured devices. [Rev. Mod. Phys. 90, 025007] Published Thu Jun 28, 2018
Keywords:
Condensed matter
Print ISSN:
0034-6861
Electronic ISSN:
1539-0756
Topics:
Physics
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