Publication Date:
2012-10-13
Description:
Small-angle X-ray diffraction from synthetic opal films has been investigated as a function of the orientation of the sample. All the observed ( hkl ) diffraction reflections have been interpreted. The reconstruction of the reciprocal lattice of the studied opal films has been carried out. The diffraction patterns and scattering intensity profiles along chains of reciprocal lattice points have been calculated. It has been shown that, in the reconstructed reciprocal lattice of the opal films, the appearance of chains of partially overlapping nodes that are oriented along the direction Γ → L is caused by two factors: the small thickness of the film and the existence of stacking faults in it. Content Type Journal Article Category Optical Properties Pages 2073-2082 DOI 10.1134/S1063783412100307 Authors A. K. Samusev, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia I. S. Sinev, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia K. B. Samusev, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia M. V. Rybin, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia A. A. Mistonov, St. Petersburg State University, Universitetskaya nab. 7, St. Petersburg, 199034 Russia N. A. Grigoryeva, St. Petersburg State University, Universitetskaya nab. 7, St. Petersburg, 199034 Russia S. V. Grigoriev, B.P. Konstantinov Petersburg Nuclear Physics Institute, National Research Centre “Kurchatov Institute,”, Orlova Roshcha, Gatchina, Leningrad oblast, 188300 Russia A. V. Petukhov, Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 5, Utrecht, 3584 CC The Netherlands D. V. Byelov, Debye Institute for Nanomaterials Science, Utrecht University, Princetonplein 5, Utrecht, 3584 CC The Netherlands E. Yu. Trofimova, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia D. A. Kurdyukov, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia V. G. Golubev, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia M. F. Limonov, Ioffe Physical-Technical Institute, Russian Academy of Sciences, Politekhnicheskaya ul. 26, St. Petersburg, 194021 Russia Journal Physics of the Solid State Online ISSN 1090-6460 Print ISSN 1063-7834 Journal Volume Volume 54 Journal Issue Volume 54, Number 10
Print ISSN:
1063-7834
Electronic ISSN:
1090-6460
Topics:
Physics
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