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2000-2004 (444)
Journal of Electron Microscopy. 2000; 49(1): 1-4. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023774. (1)
Journal of Electron Microscopy. 2000; 49(1): 101-121. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023775. (1)
Journal of Electron Microscopy. 2000; 49(1): 123-134. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023776. (1)
Journal of Electron Microscopy. 2000; 49(1): 135-141. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023777. (1)
Journal of Electron Microscopy. 2000; 49(1): 143-148. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023778. (1)
Journal of Electron Microscopy. 2000; 49(1): 149-155. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023779. (1)
Journal of Electron Microscopy. 2000; 49(1): 157-162. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023780. (1)
Journal of Electron Microscopy. 2000; 49(1): 163-172. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023781. (1)
Journal of Electron Microscopy. 2000; 49(1): 17-24. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023782. (1)
Journal of Electron Microscopy. 2000; 49(1): 173-177. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023783. (1)
Journal of Electron Microscopy. 2000; 49(1): 179-183. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023784. (1)
Journal of Electron Microscopy. 2000; 49(1): 185-193. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023785. (1)
Journal of Electron Microscopy. 2000; 49(1): 195-202. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023786. (1)
Journal of Electron Microscopy. 2000; 49(1): 203-208. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023787. (1)
Journal of Electron Microscopy. 2000; 49(1): 25-29. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023788. (1)
Journal of Electron Microscopy. 2000; 49(1): 31-39. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023789. (1)
Journal of Electron Microscopy. 2000; 49(1): 41-52. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023790. (1)
Journal of Electron Microscopy. 2000; 49(1): 5-16. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023791. (1)
Journal of Electron Microscopy. 2000; 49(1): 53-59. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023792. (1)
Journal of Electron Microscopy. 2000; 49(1): 61-65. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023793. (1)
10250
Physics (444)
Nature of Science, Research, Systems of Higher Education, Museum Science

Journal

Journal of Electron Microscopy. 2000; 49(1): 1-4. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023774. (1)
Journal of Electron Microscopy. 2000; 49(1): 101-121. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023775. (1)
Journal of Electron Microscopy. 2000; 49(1): 123-134. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023776. (1)
Journal of Electron Microscopy. 2000; 49(1): 135-141. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023777. (1)
Journal of Electron Microscopy. 2000; 49(1): 143-148. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023778. (1)

Journal of Electron Microscopy. 2000; 49(1): 149-155. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023779. (1)

Journal of Electron Microscopy. 2000; 49(1): 157-162. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023780. (1)

Journal of Electron Microscopy. 2000; 49(1): 163-172. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023781. (1)

Journal of Electron Microscopy. 2000; 49(1): 17-24. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023782. (1)

Journal of Electron Microscopy. 2000; 49(1): 173-177. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023783. (1)

Journal of Electron Microscopy. 2000; 49(1): 179-183. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023784. (1)

Journal of Electron Microscopy. 2000; 49(1): 185-193. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023785. (1)

Journal of Electron Microscopy. 2000; 49(1): 195-202. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023786. (1)

Journal of Electron Microscopy. 2000; 49(1): 203-208. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023787. (1)

Journal of Electron Microscopy. 2000; 49(1): 25-29. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023788. (1)

Journal of Electron Microscopy. 2000; 49(1): 31-39. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023789. (1)

Journal of Electron Microscopy. 2000; 49(1): 41-52. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023790. (1)

Journal of Electron Microscopy. 2000; 49(1): 5-16. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023791. (1)

Journal of Electron Microscopy. 2000; 49(1): 53-59. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023792. (1)

Journal of Electron Microscopy. 2000; 49(1): 61-65. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023793. (1)

10250

Unknown

A review of focused ion beam technology and its applications in transmission electron microscopy (2004)

Sugiyama, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 527-536. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh071.

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Identification of crack path of inter- and transgranular fractures in sintered silicon nitride by in situ TEM (2004)

Ii, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 121-127. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.121.

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Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction (2004)

Ishitani, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 443-449. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh078.

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Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms (2004)

Miyashita, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 577-582. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh074.

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Publication Date: 2004-12-01

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HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method (2004)

Tanaka, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 505-509. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh052.

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The position and morphology of honeycombs in normal skeletal muscle fibres of the healthy frog (2004)

Voigt, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 671-675. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh094.

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Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets (2004)

Park, Y.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 267-270. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.267.

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Development of coincidence transmission electron microscope. III. Incorporation with -type imaging energy filter (2004)

Nishinaka, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 217-222. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.217.

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Ontogenesis of peripheral electromagnetic receptors in hornets (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 281-291. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.281.

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Post-thinning technique for a lifted-out membrane (2004)

Sadayama, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 493-496. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh085.

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Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 563-566. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh063.

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Cytochemical detection of endogenous peroxidase in the intralobular ducts of hamster major salivary glands (2004)

Utsumi, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 435-439. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh066.

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Immunohistochemical detection of haem oxygenase in AA amyloidogenesis (2004)

Kuroiwa, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 417-422. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh055.

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Influence of plasma and inflammatory proteins on the ultrastructure of exogenous surfactant (2004)

Schmiedl, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 407-416. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh056.

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Appearance of electron-dense segments: indication of possible conformational changes of pre-mineralizing collagen fibrils in the osteoid of rat bones (2004)

Asawa, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 423-433. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh057.

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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy (2004)

Ishitani, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 245-255. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.245.

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Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images (2004)

Nomaguchi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 403-406. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh068.

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Observation of iron silicide formation by plan-view transmission electron microscopy (2004)

Igarashi, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 223-228. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.223.

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Elasticity of flagellar hooks (2004)

Sen, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 305-309. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.305.

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Electron microscopy observation of interface in diffusion-bonded copper joint (2004)

Wang, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 157-161. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.157.

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Preface (2004)

Fujita, D.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 99-99. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.99.

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Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM (2004)

Yamasaki, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 129-135. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.129.

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Reducing focused ion beam damage to transmission electron microscopy samples (2004)

Kato, N. I.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 451-458. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh080.

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Aluminium phosphide as a eutectic grain nucleus in hypoeutectic Al-Si alloys (2004)

Nogita, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 361-369. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh048.

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HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis (2004)

Peng, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 257-266. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.257.

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Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes (2004)

Hutchison, J. L.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 101-106. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.101.

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Suzuki segregation in a binary Cu-Si alloy (2004)

Mendis, B. G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 311-323. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh045.

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling (2004)

Sasaki, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 497-500. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh067.

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Crystallographic orientation contrast associated with Ga+ ion channelling for Fe and Cu in focused ion beam method (2004)

Yahiro, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 571-576. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh075.

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Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms (2004)

Biskupek, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 601-610. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh088.

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Simple plunge freezing applied to plant tissues for capturing the ultrastructure close to the living state (2004)

Nitta, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 677-680. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh092.

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A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs (2004)

Yabuuchi, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 471-477. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh062.

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Microstructural analysis of the deformation range under nano-indentation in -SiC (2004)

Kishimoto, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 515-517. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh073.

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Effects of heat and electron irradiation on the melting behavior of Al-Si alloy particles and motion of the Al nanosphere within (2004)

Howe, J. M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 107-114. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.107.

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HRTEM image contrast and atomistic microstructures of long-period ordered Al-rich TiAl alloys (2004)

Hata, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 1-9. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.1.

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Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites (2004)

Ozawa, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 519-521. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh081.

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Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient (2004)

Hata, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 537-540. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh049.

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Influence of the image quality deterioration of a tilted thick specimen on electron tomography (2004)

Zhang, H.-B.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 617-621. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh076.

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Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface (2004)

Sato, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 553-556. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh060.

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Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate (2004)

Kuwano, N.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 541-544. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh064.

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Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIs (2004)

Hirose, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 567-570. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh061.

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Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis (2004)

Tsuji, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 465-470. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh090.

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High energy-resolution electron energy-loss spectroscopy study of the electronic structures of Li- and Mg-doped -rhombohedral boron (2004)

Terauchi, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 589-592. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh093.

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Modification of physicochemical properties of actin filaments suppresses cell fragmentation in the execution phase of staurosporine-induced apoptotic processes (2004)

Majczak, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 635-647. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh086.

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Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system (2004)

Wang, Z.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 489-491. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh050.

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A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam (2004)

Kato, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 501-504. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh065.

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Changes in physicochemical properties of microtubules lead to the formation of a single spherical structure of mitochondrial assembly enveloping nuclear chromatins (2004)

Kedzior, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 659-670. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh087.

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Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 459-463. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh058.

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A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy (2004)

Fukuda, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 479-483. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh059.

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Superstructure in SmCo7 phase (2004)

Yu, H.-C.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 37-42. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.37.

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Application of real-time confocal laser scanning microscopy to observe living cells in tissue specimens (2004)

Saino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 49-56. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.49.

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Nano-optical probing of exciton wave-functions confined in a GaAs quantum dot (2004)

Saiki, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 193-201. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.193.

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Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED (2004)

Akaogi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 11-19. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.11.

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A method for multidirectional TEM observation of a specific site at atomic resolution (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 583-588. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh089.

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Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method (2004)

Kobayashi, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 485-487. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh072.

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Editorial (2004)

Saka, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 441-441. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh095.

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Voltage refinement by deficit HOLZ line geometry (2004)

Rossouw, C. J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 381-392. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh038.

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Bandgap mapping for III-V quantum well by electron spectroscopy imaging (2004)

Tsai, J.-S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 371-380. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh082.

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HVEM characterization of crack tip dislocations in silicon crystals (2004)

Tanaka, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 353-360. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh051.

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In situ ESEM observation of melting silver and Inconel on an Al2O3 powder bed (2004)

Fischer, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 393-396. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh070.

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Behaviors of surfactant atoms on Si(001) surface (2004)

Matsuhata, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 325-337. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh043.

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Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale (2004)

Howe, J. M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 339-351. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh044.

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Microstructures of galvannealing coats plated on an iron substrate deformed by indentation (2004)

Kobayashi, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 557-561. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh083.

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FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings (2004)

Hong, M.-H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 545-552. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh053.

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Silk structure in the hornet cocoon (2004)

Joseph, Z.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 293-304. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.293.

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Scattering-type near-field optical microscopy (2004)

Keilmann, F.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 187-192. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.187.

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Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering (2004)

Liu, Z.-Q.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 143-148. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.143.

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Chemical junction delineation of a specific site in Si devices (2004)

Eo, H.-J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 277-280. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.277.

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Novel local density of state mapping technique for low-dimensional systems (2004)

Fujita, D.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 177-185. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.177.

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Use of Taxol and collagenase for better three-dimensional visualization of microtubules in the enterocyte and Brunner's gland cell, with special reference to their relation to the Golgi apparatus (2004)

Suzaki, E.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 79-86. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.79.

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Structural analyses by TEM of iridium deposited on TiO2 powder and rutile single crystal (2004)

Akita, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 29-35. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.29.

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Monte Carlo simulation of topographic contrast in scanning ion microscope (2004)

Ohya, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 229-235. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.229.

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Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope (2004)

Tsuruoka, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 169-175. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.169.

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Microstructure of metal-filled carbon nanotubes (2004)

Toh, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 149-155. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.149.

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Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope (2004)

Morita, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 163-168. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.163.

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Cathodoluminescence study of one-dimensional free-standing widegap-semiconductor nanostructures: GaN nanotubes, Si3N4 nanobelts and ZnS/Si nanowires (2004)

Sekiguchi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 203-208. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.203.

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High-resolution transmission electron microscopy study of Ca3Co4O9 (2004)

Seo, W.-S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 397-401. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh046.

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Morphology of the integumentary structures in the nymph of lace bug, Stephanitis typica (Hemiptera: Tingidae) (2004)

Rekha, R. Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 57-61. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.57.

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Electron holography on remanent magnetization distribution of melt-spun Nd-Fe-B magnets (2004)

Park, Y.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 43-47. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.43.

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HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloys (2004)

Konno, T. J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 611-616. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh069.

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Lattice parameter determination of a composition controlled Si1-x Gex layer on a Si (001) substrate using convergent-beam electron diffraction (2004)

Akaogi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 593-600. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh091.

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Hornet flight is generated by solar energy: UV irradiation counteracts anaesthetic effects (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 623-633. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh077.

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Yellow pigment granules in hornets: their origin and development (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 649-657. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh084.

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Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder (2004)

Ohsaki, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 523-525. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh054.

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3D analysis of cracking behaviour under indentation in ion-irradiated -SiC (2004)

Park, K. H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 511-513. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh079.

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Observation of polarization property in near-field optical imaging by a polarization-maintaining fiber probe (2004)

Mitsui, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 209-215. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.209.

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The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination (2004)

Chuvilin, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 237-244. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.237.

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Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method (2004)

Kawasaki, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 271-275. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.271.

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Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam (2004)

Wang, Z.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 115-119. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.115.

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Determination of absolute thickness and mean free path of thin foil specimen by -factor method (2004)

Ohshima, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 137-142. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.137.

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Three-dimensional expression of adhesion molecules on the superficial synovial intima of LPS-induced arthritis of the mouse knee analyzed by immuno-SEM (2004)

Liang, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 93-97. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.93.

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Functional analysis of mammalian genes using amphibian embryonic cells (2004)

Komazaki, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 87-92. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.87.

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Localized electron irradiation methods and their application to detection of flow-field of point defects (2004)

Arai, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 21-27. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.21.

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The digital pads of rhacophorid tree-frogs (2004)

Mizuhira, V.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 63-78. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.63.

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Remineralization effects of xylitol on demineralized enamel (2003)

Miake, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(5): 471-476. Published 2003 Nov 20. doi: 10.1093/jmicro/52.5.471.

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Porcine enamel matrix derivative enhances the formation of reparative dentine and dentine bridges during wound healing of amputated rat molars (2003)

Igarashi, R.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 227-236. Published 2003 May 28. doi: 10.1093/jmicro/52.2.227.

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The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation (2003)

Kimoto, K.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(3): 299-303. Published 2003 Jun 28. doi: 10.1093/jmicro/52.3.299.

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In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si (2003)

Arai, S.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(1): 79-84. Published 2003 Mar 24. doi: 10.1093/jmicro/52.1.79.

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Characterization of Co25Ag75 and (Co90Al10)28Ag72 granular films by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging (2003)

Oksuzoglu, R. M.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 91-100. Published 2003 May 28. doi: 10.1093/jmicro/52.2.91.

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Starvation induces the formation of giant mitochondria in gastric parietal cells of guinea pigs (2003)

Ogawa, K.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 217-225. Published 2003 May 28. doi: 10.1093/jmicro/52.2.217.

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