ALBERT — All Library Books, journals and Electronic Records Telegrafenberg

Hits per page

hits 1 - 100 | 444 hits

Sorting

Articles (444)
Other Sources
Oxford University Press (444)
American Association for the Advancement of Science
American Meteorological Society
Kraatz, Berlin
2000-2004 (444)
Journal of Electron Microscopy. 2000; 49(1): 1-4. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023774. (1)
Journal of Electron Microscopy. 2000; 49(1): 101-121. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023775. (1)
Journal of Electron Microscopy. 2000; 49(1): 123-134. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023776. (1)
Journal of Electron Microscopy. 2000; 49(1): 135-141. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023777. (1)
Journal of Electron Microscopy. 2000; 49(1): 143-148. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023778. (1)
Journal of Electron Microscopy. 2000; 49(1): 149-155. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023779. (1)
Journal of Electron Microscopy. 2000; 49(1): 157-162. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023780. (1)
Journal of Electron Microscopy. 2000; 49(1): 163-172. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023781. (1)
Journal of Electron Microscopy. 2000; 49(1): 17-24. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023782. (1)
Journal of Electron Microscopy. 2000; 49(1): 173-177. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023783. (1)
Journal of Electron Microscopy. 2000; 49(1): 179-183. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023784. (1)
Journal of Electron Microscopy. 2000; 49(1): 185-193. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023785. (1)
Journal of Electron Microscopy. 2000; 49(1): 195-202. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023786. (1)
Journal of Electron Microscopy. 2000; 49(1): 203-208. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023787. (1)
Journal of Electron Microscopy. 2000; 49(1): 25-29. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023788. (1)
Journal of Electron Microscopy. 2000; 49(1): 31-39. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023789. (1)
Journal of Electron Microscopy. 2000; 49(1): 41-52. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023790. (1)
Journal of Electron Microscopy. 2000; 49(1): 5-16. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023791. (1)
Journal of Electron Microscopy. 2000; 49(1): 53-59. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023792. (1)
Journal of Electron Microscopy. 2000; 49(1): 61-65. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023793. (1)
10250
Physics (444)

Journal

Journal of Electron Microscopy. 2000; 49(1): 1-4. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023774. (1)
Journal of Electron Microscopy. 2000; 49(1): 101-121. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023775. (1)
Journal of Electron Microscopy. 2000; 49(1): 123-134. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023776. (1)
Journal of Electron Microscopy. 2000; 49(1): 135-141. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023777. (1)
Journal of Electron Microscopy. 2000; 49(1): 143-148. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023778. (1)

Journal of Electron Microscopy. 2000; 49(1): 149-155. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023779. (1)

Journal of Electron Microscopy. 2000; 49(1): 157-162. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023780. (1)

Journal of Electron Microscopy. 2000; 49(1): 163-172. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023781. (1)

Journal of Electron Microscopy. 2000; 49(1): 17-24. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023782. (1)

Journal of Electron Microscopy. 2000; 49(1): 173-177. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023783. (1)

Journal of Electron Microscopy. 2000; 49(1): 179-183. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023784. (1)

Journal of Electron Microscopy. 2000; 49(1): 185-193. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023785. (1)

Journal of Electron Microscopy. 2000; 49(1): 195-202. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023786. (1)

Journal of Electron Microscopy. 2000; 49(1): 203-208. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023787. (1)

Journal of Electron Microscopy. 2000; 49(1): 25-29. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023788. (1)

Journal of Electron Microscopy. 2000; 49(1): 31-39. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023789. (1)

Journal of Electron Microscopy. 2000; 49(1): 41-52. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023790. (1)

Journal of Electron Microscopy. 2000; 49(1): 5-16. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023791. (1)

Journal of Electron Microscopy. 2000; 49(1): 53-59. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023792. (1)

Journal of Electron Microscopy. 2000; 49(1): 61-65. Published 2000 Jan 01. doi: 10.1093/oxfordjournals.jmicro.a023793. (1)

10250

Unknown

A review of focused ion beam technology and its applications in transmission electron microscopy (2004)

Sugiyama, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 527-536. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh071.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Identification of crack path of inter- and transgranular fractures in sintered silicon nitride by in situ TEM (2004)

Ii, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 121-127. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.121.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction (2004)

Ishitani, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 443-449. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh078.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms (2004)

Miyashita, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 577-582. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh074.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method (2004)

Tanaka, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 505-509. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh052.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

The position and morphology of honeycombs in normal skeletal muscle fibres of the healthy frog (2004)

Voigt, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 671-675. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh094.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets (2004)

Park, Y.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 267-270. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.267.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Development of coincidence transmission electron microscope. III. Incorporation with -type imaging energy filter (2004)

Nishinaka, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 217-222. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.217.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Ontogenesis of peripheral electromagnetic receptors in hornets (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 281-291. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.281.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Post-thinning technique for a lifted-out membrane (2004)

Sadayama, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 493-496. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh085.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 563-566. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh063.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Cytochemical detection of endogenous peroxidase in the intralobular ducts of hamster major salivary glands (2004)

Utsumi, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 435-439. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh066.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Immunohistochemical detection of haem oxygenase in AA amyloidogenesis (2004)

Kuroiwa, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 417-422. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh055.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Influence of plasma and inflammatory proteins on the ultrastructure of exogenous surfactant (2004)

Schmiedl, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 407-416. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh056.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Appearance of electron-dense segments: indication of possible conformational changes of pre-mineralizing collagen fibrils in the osteoid of rat bones (2004)

Asawa, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 423-433. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh057.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy (2004)

Ishitani, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 245-255. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.245.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images (2004)

Nomaguchi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 403-406. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh068.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Observation of iron silicide formation by plan-view transmission electron microscopy (2004)

Igarashi, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 223-228. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.223.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Elasticity of flagellar hooks (2004)

Sen, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 305-309. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.305.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Electron microscopy observation of interface in diffusion-bonded copper joint (2004)

Wang, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 157-161. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.157.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Preface (2004)

Fujita, D.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 99-99. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.99.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM (2004)

Yamasaki, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 129-135. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.129.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Reducing focused ion beam damage to transmission electron microscopy samples (2004)

Kato, N. I.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 451-458. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh080.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Aluminium phosphide as a eutectic grain nucleus in hypoeutectic Al-Si alloys (2004)

Nogita, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 361-369. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh048.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis (2004)

Peng, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 257-266. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.257.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes (2004)

Hutchison, J. L.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 101-106. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.101.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Suzuki segregation in a binary Cu-Si alloy (2004)

Mendis, B. G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 311-323. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh045.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling (2004)

Sasaki, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 497-500. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh067.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Crystallographic orientation contrast associated with Ga+ ion channelling for Fe and Cu in focused ion beam method (2004)

Yahiro, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 571-576. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh075.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms (2004)

Biskupek, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 601-610. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh088.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Simple plunge freezing applied to plant tissues for capturing the ultrastructure close to the living state (2004)

Nitta, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 677-680. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh092.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs (2004)

Yabuuchi, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 471-477. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh062.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Microstructural analysis of the deformation range under nano-indentation in -SiC (2004)

Kishimoto, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 515-517. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh073.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Effects of heat and electron irradiation on the melting behavior of Al-Si alloy particles and motion of the Al nanosphere within (2004)

Howe, J. M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 107-114. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.107.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

HRTEM image contrast and atomistic microstructures of long-period ordered Al-rich TiAl alloys (2004)

Hata, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 1-9. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.1.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites (2004)

Ozawa, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 519-521. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh081.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient (2004)

Hata, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 537-540. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh049.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Influence of the image quality deterioration of a tilted thick specimen on electron tomography (2004)

Zhang, H.-B.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 617-621. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh076.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface (2004)

Sato, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 553-556. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh060.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate (2004)

Kuwano, N.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 541-544. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh064.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIs (2004)

Hirose, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 567-570. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh061.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis (2004)

Tsuji, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 465-470. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh090.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

High energy-resolution electron energy-loss spectroscopy study of the electronic structures of Li- and Mg-doped -rhombohedral boron (2004)

Terauchi, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 589-592. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh093.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Modification of physicochemical properties of actin filaments suppresses cell fragmentation in the execution phase of staurosporine-induced apoptotic processes (2004)

Majczak, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 635-647. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh086.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system (2004)

Wang, Z.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 489-491. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh050.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam (2004)

Kato, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 501-504. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh065.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Changes in physicochemical properties of microtubules lead to the formation of a single spherical structure of mitochondrial assembly enveloping nuclear chromatins (2004)

Kedzior, J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 659-670. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh087.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 459-463. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh058.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy (2004)

Fukuda, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 479-483. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh059.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Superstructure in SmCo7 phase (2004)

Yu, H.-C.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 37-42. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.37.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of real-time confocal laser scanning microscopy to observe living cells in tissue specimens (2004)

Saino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 49-56. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.49.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Nano-optical probing of exciton wave-functions confined in a GaAs quantum dot (2004)

Saiki, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 193-201. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.193.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED (2004)

Akaogi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 11-19. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.11.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

A method for multidirectional TEM observation of a specific site at atomic resolution (2004)

Kamino, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 583-588. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh089.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method (2004)

Kobayashi, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 485-487. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh072.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Editorial (2004)

Saka, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 441-441. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh095.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Voltage refinement by deficit HOLZ line geometry (2004)

Rossouw, C. J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 381-392. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh038.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Bandgap mapping for III-V quantum well by electron spectroscopy imaging (2004)

Tsai, J.-S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 371-380. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh082.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

HVEM characterization of crack tip dislocations in silicon crystals (2004)

Tanaka, M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 353-360. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh051.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

In situ ESEM observation of melting silver and Inconel on an Al2O3 powder bed (2004)

Fischer, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 393-396. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh070.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Behaviors of surfactant atoms on Si(001) surface (2004)

Matsuhata, H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 325-337. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh043.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Application of valence electron energy-loss spectroscopy and plasmon energy mapping for determining material properties at the nanoscale (2004)

Howe, J. M.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 339-351. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh044.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Microstructures of galvannealing coats plated on an iron substrate deformed by indentation (2004)

Kobayashi, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 557-561. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh083.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings (2004)

Hong, M.-H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 545-552. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh053.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Silk structure in the hornet cocoon (2004)

Joseph, Z.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 293-304. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.293.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Scattering-type near-field optical microscopy (2004)

Keilmann, F.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 187-192. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.187.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering (2004)

Liu, Z.-Q.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 143-148. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.143.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Chemical junction delineation of a specific site in Si devices (2004)

Eo, H.-J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 277-280. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.277.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Novel local density of state mapping technique for low-dimensional systems (2004)

Fujita, D.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 177-185. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.177.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Use of Taxol and collagenase for better three-dimensional visualization of microtubules in the enterocyte and Brunner's gland cell, with special reference to their relation to the Golgi apparatus (2004)

Suzaki, E.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 79-86. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.79.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Structural analyses by TEM of iridium deposited on TiO2 powder and rutile single crystal (2004)

Akita, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 29-35. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.29.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Monte Carlo simulation of topographic contrast in scanning ion microscope (2004)

Ohya, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 229-235. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.229.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope (2004)

Tsuruoka, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 169-175. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.169.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Microstructure of metal-filled carbon nanotubes (2004)

Toh, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 149-155. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.149.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope (2004)

Morita, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 163-168. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.163.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Cathodoluminescence study of one-dimensional free-standing widegap-semiconductor nanostructures: GaN nanotubes, Si3N4 nanobelts and ZnS/Si nanowires (2004)

Sekiguchi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 203-208. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.203.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

High-resolution transmission electron microscopy study of Ca3Co4O9 (2004)

Seo, W.-S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(4): 397-401. Published 2004 Aug 01. doi: 10.1093/jmicro/dfh046.

add to mindlist on the mindlist

Details

Publication Date: 2004-08-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Morphology of the integumentary structures in the nymph of lace bug, Stephanitis typica (Hemiptera: Tingidae) (2004)

Rekha, R. Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 57-61. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.57.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Electron holography on remanent magnetization distribution of melt-spun Nd-Fe-B magnets (2004)

Park, Y.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 43-47. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.43.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

HAADF-STEM study on the early stage of precipitation in aged Al-Ag alloys (2004)

Konno, T. J.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 611-616. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh069.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Lattice parameter determination of a composition controlled Si1-x Gex layer on a Si (001) substrate using convergent-beam electron diffraction (2004)

Akaogi, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 593-600. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh091.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Hornet flight is generated by solar energy: UV irradiation counteracts anaesthetic effects (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 623-633. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh077.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Yellow pigment granules in hornets: their origin and development (2004)

Ishay, J. S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(6): 649-657. Published 2004 Dec 01. doi: 10.1093/jmicro/dfh084.

add to mindlist on the mindlist

Details

Publication Date: 2004-12-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder (2004)

Ohsaki, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 523-525. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh054.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

3D analysis of cracking behaviour under indentation in ion-irradiated -SiC (2004)

Park, K. H.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(5): 511-513. Published 2004 Oct 01. doi: 10.1093/jmicro/dfh079.

add to mindlist on the mindlist

Details

Publication Date: 2004-10-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Observation of polarization property in near-field optical imaging by a polarization-maintaining fiber probe (2004)

Mitsui, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 209-215. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.209.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination (2004)

Chuvilin, A.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 237-244. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.237.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method (2004)

Kawasaki, T.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(3): 271-275. Published 2004 Jun 01. doi: 10.1093/jmicro/53.3.271.

add to mindlist on the mindlist

Details

Publication Date: 2004-06-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam (2004)

Wang, Z.-G.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 115-119. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.115.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Determination of absolute thickness and mean free path of thin foil specimen by -factor method (2004)

Ohshima, K.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(2): 137-142. Published 2004 Apr 01. doi: 10.1093/jmicro/53.2.137.

add to mindlist on the mindlist

Details

Publication Date: 2004-04-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Three-dimensional expression of adhesion molecules on the superficial synovial intima of LPS-induced arthritis of the mouse knee analyzed by immuno-SEM (2004)

Liang, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 93-97. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.93.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Functional analysis of mammalian genes using amphibian embryonic cells (2004)

Komazaki, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 87-92. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.87.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Localized electron irradiation methods and their application to detection of flow-field of point defects (2004)

Arai, S.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 21-27. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.21.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

The digital pads of rhacophorid tree-frogs (2004)

Mizuhira, V.

Oxford University Press

In: Journal of Electron Microscopy. 2004; 53(1): 63-78. Published 2004 Mar 01. doi: 10.1093/jmicro/53.1.63.

add to mindlist on the mindlist

Details

Publication Date: 2004-03-01

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Remineralization effects of xylitol on demineralized enamel (2003)

Miake, Y.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(5): 471-476. Published 2003 Nov 20. doi: 10.1093/jmicro/52.5.471.

add to mindlist on the mindlist

Details

Publication Date: 2003-11-20

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Porcine enamel matrix derivative enhances the formation of reparative dentine and dentine bridges during wound healing of amputated rat molars (2003)

Igarashi, R.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 227-236. Published 2003 May 28. doi: 10.1093/jmicro/52.2.227.

add to mindlist on the mindlist

Details

Publication Date: 2003-05-28

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation (2003)

Kimoto, K.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(3): 299-303. Published 2003 Jun 28. doi: 10.1093/jmicro/52.3.299.

add to mindlist on the mindlist

Details

Publication Date: 2003-06-28

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

In situ HREM observation of nucleation and growth of nanotwins beneath the solid-liquid interface in Si (2003)

Arai, S.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(1): 79-84. Published 2003 Mar 24. doi: 10.1093/jmicro/52.1.79.

add to mindlist on the mindlist

Details

Publication Date: 2003-03-24

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

Unknown

Characterization of Co25Ag75 and (Co90Al10)28Ag72 granular films by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging (2003)

Oksuzoglu, R. M.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 91-100. Published 2003 May 28. doi: 10.1093/jmicro/52.2.91.

add to mindlist on the mindlist

Details

Publication Date: 2003-05-28

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

100

Unknown

Starvation induces the formation of giant mitochondria in gastric parietal cells of guinea pigs (2003)

Ogawa, K.

Oxford University Press

In: Journal of Electron Microscopy. 2003; 52(〉2): 217-225. Published 2003 May 28. doi: 10.1093/jmicro/52.2.217.

add to mindlist on the mindlist

Details

Publication Date: 2003-05-28

Print ISSN: 0022-0744

Electronic ISSN: 1477-9986

Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics

Published by Oxford University Press on behalf of Japanese Society of Microscopy.

Permalink

	Location	Call Number	Expected	Availability

Others were also interested in ...

PAPER CURRENT

S·F·X

Fulltext

hits 1 - 100 | 444 hits