Publication Date:
2020
Description:
〈p〉Publication date: March 2020〈/p〉
〈p〉〈b〉Source:〈/b〉 AEU - International Journal of Electronics and Communications, Volume 116〈/p〉
〈p〉Author(s): Tangudu Bharat Kumar, Apurbaranjan Panda, Gaurav Kumar Sharma, Arun Kishor Johar, Sougata Kumar Kar, Dharmendar Boolchandani〈/p〉
〈div xml:lang="en"〉
〈h5〉Abstract〈/h5〉
〈div〉〈p〉This work is a demonstration of circuit optimization using Taguchi Design of Experiments. Cross coupled channel length modulation OTA has been considered for optimization. This optimization technique uses the concept of Signal to Noise Ratio (SNR) and Analysis of Variance (ANOVA) to predict which independent variable controls the performance of the circuit. Bias current, channel width and channel length of input transistors have been chosen to optimize the circuit performance. The obtained parameters for optimum performance from this method are verified by simulating the circuit using UMC 0.18 〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si20.svg"〉〈mrow〉〈mi〉μ〈/mi〉〈mi〉m〈/mi〉〈/mrow〉〈/math〉 CMOS technology. The simulation results obtained are pretty close to the predicted solution from ANOVA. From simulation results, transconductance, power consumption, percentage total harmonic distortion, linearity range and DC gain of the proposed OTA are 24.63 〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si15.svg"〉〈mrow〉〈mi mathvariant="italic"〉nS〈/mi〉〈/mrow〉〈/math〉, 1.026 〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si27.svg"〉〈mrow〉〈mi〉μ〈/mi〉〈mi〉W〈/mi〉〈/mrow〉〈/math〉, 0.347〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si16.svg"〉〈mrow〉〈mo〉%〈/mo〉〈/mrow〉〈/math〉, 1.09 〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si21.svg"〉〈mrow〉〈mi〉V〈/mi〉〈/mrow〉〈/math〉, and 54.88 〈math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si17.svg"〉〈mrow〉〈mi mathvariant="italic"〉dB〈/mi〉〈/mrow〉〈/math〉 respectively. The proposed optimized circuit, therefore, can be utilized in biomedical applications.〈/p〉〈/div〉
〈/div〉
Print ISSN:
1434-8411
Electronic ISSN:
1618-0399
Topics:
Electrical Engineering, Measurement and Control Technology
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