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  • Articles  (670)
  • Articles: DFG German National Licenses  (670)
  • Analytical Chemistry and Spectroscopy  (670)
  • 1975-1979  (670)
  • Physics  (670)
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  • Articles  (670)
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  • Articles: DFG German National Licenses  (670)
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  • 1
    Electronic Resource
    Electronic Resource
    Measure of precision in the determination of concentration (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 195-197 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An equation has been derived for the computaion of the standard deviation of the results of X-ray micro analysis. The contributions of partial standard deviations of all magnitudes are included. The equation is gernerally applicable to multiple measurements and various methods of measurements.
    Additional Material: 1 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070405
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  • 2
    Electronic Resource
    Electronic Resource
    The calibration of an automatic X-ray spectrometer using calculated relative intensitiesPaper presented at 10 th Conference on X-ray Analytical Methods, Edinburgh. (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 190-194 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is demonstrated that an evalution procedure for conversion X-ray intensity to element concentration used on an existing spectrometer can be used in reverse to provide intensity data for calibrating another spectrometer. Extensive remeasurement o standards is therby eliminated. Intensities are calulated for postulated changes in compostion and these form the input data for the spectrometer computer regression program. Such data are free from measurement error. Calibration and α coefficents from claulated intensities are found to give analytical results of an accuracy comparable with those derived from experimentally produced calibration. The intensity calculations can be extended to include the determination of calibration and α coefficents without using the sepctrometyer regression programs. Considedrable expense and effort can be saved.
    Additional Material: 4 Tab.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070404
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  • 3
    Electronic Resource
    Electronic Resource
    Measurement of K-shell flourescence yield and Kα/Kβ intensity ratio for nickel (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 217-224 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: For application for the fundamental parameter approach to quantitative chemical analysis of mixtures by X-ray fluorescence, accrate knowledge is required of fluroescence yields and ralative intensities of X-ray lines of the various elements involved. The spread in published data suggests, however, that these parameters are not known with as much accuracy as could be used profitably. In this paper we describe a method by which K-shell flurescence yield and Kα/Kβ intensity ratio can both be measured in the same experiment to within approximately 0.5% for pure elements available as thin polcrystalline foil. Results are given for the particular case of nickel (Z=28) for which we find ωK = 0.452 ± 0.002 and Kα/Kβ=6.91 ± 0.335, but the method is readily applicable to anty element whose atomic number falls in the approximate range 20 ≲ Z ≲ 50 and which can be obtained in suitable physical form. A key factor in the experimental design is use of a non-dispersive (intrinsic germanium) X-ray analyzer; this makes it possible to employ a very simple transmission geometry which can be characterized quite precisely. Experimental conditions, and precautions needed to obtain accurate and consistant results, are described in some detail. Among other corrections applied, allowance is made for scattering of both exciting statistics and residual uncertaintes incalculating corrections for scattering. Among these residual uncertainties are errors in correcting scattering coefficients for anomalous dispersion. Such errors are significant only when evaluating fK, the K-shell excitation efficienvcy; the important product fK ωK can, however, be determined (fKωK = 0.398 ± 0.002) with greater reliability than ωK itself.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070409
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  • 4
    Electronic Resource
    Electronic Resource
    A focusing X-ray polarizer for energy-dispersive analysis (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. 241-248 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Properties of diffracting crystals a Bragg and of near 45° are studied for use as an X-ray polarizer. Such crystals have many advantages over the Barkla type polarizer when used in an energy-dispersive X-ray analyzer. The study shows that many matching λ-d combinations are available, but the present work was done with LiF (200). With this crystal, the second order diffraction of Cu Kβ radiation occurs at 43.67° and an improvement of peak to background ratio by a factor 45 was obtained. The study revealed that a substantial improvement of peak to minimum detection limit can be obtained with a larger deviation of the polarization angle, as long as this deviation is accompanied by a higher X-ray output.
    Additional Material: 12 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070411
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  • 5
    Electronic Resource
    Electronic Resource
    Forthcoming conferences & meetings (1978)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 7 (1978), S. vii 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300070413
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  • 6
    Electronic Resource
    Electronic Resource
    Erratum (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. v 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300080114
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  • 7
    Electronic Resource
    Electronic Resource
    Editorial (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. 1-1 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300080102
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  • 8
    Electronic Resource
    Electronic Resource
    A fast and simple procedure for the evaluation of net intensities from energy-dispersive X-ray spectra (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. 2-6 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A procedure has been developed for extracting net peak intensities from electron-beam-induced energy-dispersive X-ray spectra. The procedure has been implemented in a computer program which requires very modest storage capacity of a minicomputer, yet can be executed in a few seconds to yield net intensities. The program structure is simple. Provided the peak to background ratio is better than ∼5 to 1 the intensities are adequate for correction to quantitative analysis with accuracies comparable with more sophisticated and time-consuming methods. The procedure has been used extensively on a computer-controlled scanning electron microscope to give rapid information from complicated spectra.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300080103
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  • 9
    Electronic Resource
    Electronic Resource
    A non-linear least squares fitting routine for optimizing empirical XRF matrix correction models (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. 33-41 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An off-line non-linear least squares fitting procedure is described as part of a program package ‘RUNFIT’. This program supports most of the intensity/correction algorithms currently employed in X-ray fluorescence spectrometry. The program runs under the Data General DOS operating system and requires a minimum hardware configuration of 32K 16 bit words and two floppy disks. The minimization technique is based on the Marquardt scheme which has the main advantage that the step direction taken in the minimization process always lies in the direction of steepest descent. The RUNFIT program includes various statistical tests on the fitted data which enable the user to make accurate judgements as to the quality of the fitted data. Several examples are given of the use of this approach to typical analytical situations.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300080111
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  • 10
    Electronic Resource
    Electronic Resource
    Product news (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 8 (1979), S. vi 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300080115
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